Software-focused solution for arbitrary all-data odd sector size support
An automated test equipment (ATE) system comprises a computer system comprising a system controller, wherein the system controller is communicatively coupled to a tester processor, wherein the system controller is operable to transmit instructions to the tester processor. The tester processor is operable to generate commands and data from the instructions for coordinating testing of a device under test (DUT), wherein the DUT supports an arbitrary sector size, and wherein software layers on the tester processor perform computations to be able control data flow between the tester processor and sectors of arbitrary size in the DUT.
1. An automated test equipment (ATE) system comprising:
a system controller communicatively coupled to a tester processor, wherein the system controller is operable to transmit instructions to the tester processor; and
the tester processor operable to generate commands and data from the instructions for coordinating testing of a device under test (DUT), wherein the DUT supports an arbitrary sector size, and wherein software layers on the tester processor perform computations to control data flow between the tester processor and sectors of arbitrary size in the DUT, wherein the software layers comprise one or more functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor, and wherein the software layers comprise at least a device driver layer and an application layer.
2. The ATE system of claim 1 , wherein the sectors of arbitrary size comprise all data sectors.
3. The ATE system of claim 1 , wherein the system controller is operable to execute a Linux operating system.
4. The ATE system of claim 1 , wherein the software layers comprise four functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor.
5. The ATE system of claim 1 , wherein the software layers comprise four functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor, wherein the software layers comprise the device driver layer, a Linux block layer, a Vast System software layer and the application layer.
6. The ATE system of claim 5 , wherein, in response to a command issued to the DUT by the tester processor, the Vast System Software layer is operable to determine a nearest sector size to the arbitrary sector size supported by the Linux block layer and request a computed number of blocks from the Linux block layer, and wherein the computed number of blocks includes a number of blocks requested by the tester processor in the command and additional blocks required to buffer additional bytes per arbitrary sector block.
7. The ATE system of claim 6 , wherein the Linux block layer is operable to determine if a length of information requested by the Vast System Software layer meets a limitation of processing data associated with the Linux block layer, and wherein the Linux block layer is further operable to pass down the command to the device driver layer.
8. The ATE system of claim 7 , wherein the device driver layer is operable determine number of sectors to be accessed from the DUT and further operable to transmit the command to the DUT.
9. The ATE system of claim 1 , further comprising:
a Field Programmable Gate Array (FPGA), wherein the tester processor is communicatively coupled to the FPGA, and wherein the FPGA comprises at least one hardware accelerator circuit operable to internally generate commands and data transparently from the tester processor for testing the DUT.
10. The ATE system of claim 9 , wherein the tester processor operates in standard mode to generate the commands and data to test the DUT.
11. The ATE system of claim 5 , wherein the Vast System Software layer, the device driver layer and the application layers comprise logic to detect and communicate with a DUT of arbitrary sector sizes.
12. A method of testing using an automated test equipment (ATE) comprising:
transmitting instructions from a system controller of a computer system to a tester processor, wherein the system controller is communicatively coupled to the tester processor; and
generating commands and data using the tester processor for coordinating testing of a device under test (DUT), wherein the DUT supports a plurality of arbitrary all-data sector sizes, and wherein software layers on the tester processor perform computations to control data flow between the tester processor and the plurality of arbitrary all-data sector sizes in the DUT, wherein the software layers comprise one or more functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor, and wherein the software layers comprise at least a device driver layer and an application layer.
13. The method of claim 12 , wherein the system controller is operable to execute a Linux operating system.
14. The method of claim 12 , wherein the software layers comprise four functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor.
15. The method of claim 12 , wherein the software layers comprise four functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor, wherein the software layers comprise the device driver layer, a Linux block layer, a Vast System software layer and the application layer.
16. An automated test equipment (ATE) apparatus comprising:
a computer system comprising a system controller, wherein the system controller is communicatively coupled to a tester processor and an FPGA wherein the system controller is operable to transmit instructions to the tester processor, and wherein the tester processor is operable to generate commands and data from the instructions for coordinating testing of a device under test (DUT), wherein the DUT supports a plurality of non-standard all-data sector sizes;
wherein the FPGA is communicatively coupled to the tester processor and comprises at least one hardware accelerator circuit operable to internally generate commands and data transparently from the tester processor for testing the DUT; and
wherein the tester processor is configured to operate in one of a plurality of functional modes, wherein each functional mode is configured to allocate functionality for generating commands and for generating data between the tester processor and the FPGA in a different manner, and wherein in standard mode, the tester processor is configured to generate all commands and data for coordinating testing of the DUT comprising the plurality of non-standard all-data sector sizes, wherein software layers on the tester processor perform computations to control data flow between the tester processor and the plurality of non-standard all-data sector sizes in the DUT, and wherein the software layers comprise functional layers operable to transport data between the DUT supporting the plurality of non-standard all-data sector sizes and the tester processor.
17. The ATE apparatus of claim 16 , wherein the tester processor is operable to execute a Linux operating system.
18. The ATE apparatus of claim 16 , wherein the software layers comprise four functional layers operable to transport data between the DUT supporting the plurality of non-standard all-data sector sizes and the tester processor.
19. The ATE apparatus of claim 18 , wherein the software layers comprise four functional layers operable to transport data between the DUT supporting the arbitrary sector size and the tester processor, wherein the software layers comprise a device driver layer, a Linux block layer, a Vast System software layer and the user application layer.