IP Library › Granted Patent US 11,430,791
Granted Patent B2
US 11,430,791 · App. 16/959,771 · Granted Aug 30, 2022

Semiconductor device and operation method thereof

Inventors: Hitoshi Kunitake (Kanagawa, JP); Ryunosuke Honda (Kanagawa, JP); Tomoaki Atsumi (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/108G11C11/405G11C11/4074H01L29/66083
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Quick Facts
Patent No.
US 11,430,791
App. No.
16/959,771
Granted
Aug 30, 2022
Kind
B2
Abstract

A semiconductor device capable of obtaining the threshold voltage of a transistor is provided. The semiconductor device includes a first transistor, a first capacitor, a first output terminal, a first switch, and a second switch. A gate and a source of the first transistor are electrically connected to each other. A first terminal of the first capacitor is electrically connected to the source. A second terminal and the first output terminal of the first capacitor are electrically connected to a back gate of the first transistor. The first switch controls input of a first voltage to the back gate. A second voltage is input to a drain of the first transistor. The second switch controls input of a third voltage to the source.

Claims (60)

1. A semiconductor device comprising a first transistor, a first capacitor, a first output terminal, a first switch, and a second switch,

wherein a gate and a source of the first transistor are electrically connected to each other,

wherein a first terminal of the first capacitor and the first output terminal are electrically connected to a back gate of the first transistor,

wherein a second terminal of the first capacitor is electrically connected to the source,

wherein the first switch controls input of a first voltage to the back gate,

wherein a second voltage is input to a drain of the first transistor, and

wherein the second switch controls input of a third voltage to the source.

2. The semiconductor device according to claim 1 ,

wherein the first switch and the second switch are each a transistor including a metal oxide in a channel formation region.

3. The semiconductor device according to claim 1 ,

wherein the first transistor is an n-channel transistor,

wherein the first to third voltages are constant voltages, and

wherein the second voltage and the third voltage are set so that the first transistor shows normally-on characteristics and a voltage between the drain and the source is higher than 0 V.

4. The semiconductor device according to claim 1 ,

wherein the first transistor is a p-channel transistor,

wherein the first to third voltages are constant voltages, and

wherein the second voltage and the third voltage are set so that the first transistor shows normally-on characteristics and a voltage between the drain and the source is lower than 0 V.

5. The semiconductor device according to claim 1 , further comprising a second transistor comprising a back gate,

wherein a voltage input to the back gate of the second transistor is changed in accordance with a fourth voltage output from the first output terminal.

6. The semiconductor device according to claim 1 , further comprising a third transistor,

wherein a voltage input to a gate of the third transistor is changed in accordance with a fourth voltage output from the first output terminal.

7. The semiconductor device according to claim 1 , further comprising a second capacitor, a current-voltage converter circuit, and an amplifier circuit,

wherein a first terminal of the second capacitor is electrically connected to the first output terminal,

wherein a second terminal of the second capacitor is electrically connected to an input terminal of the current-voltage converter circuit, and

wherein the amplifier circuit amplifies a fifth voltage output from the current-voltage converter circuit and outputs a sixth voltage.

8. The semiconductor device according to claim 7 ,

wherein the current-voltage converter circuit is a source follower circuit.

9. The semiconductor device according to claim 7 ,

wherein the sixth voltage decreases as temperature rises.

10. The semiconductor device according to claim 7 ,

wherein the amplifier circuit is an operational amplifier.

11. The semiconductor device according to claim 7 , further comprising a fourth transistor comprising a back gate,

wherein a voltage input to the back gate of the fourth transistor is changed in accordance with the sixth voltage.

12. The semiconductor device according to claim 7 , further comprising a fifth transistor,

wherein a voltage input to a gate of the fifth transistor is changed in accordance with the sixth voltage.

13. A method for operating the semiconductor device according to claim 1 , comprising:

turning on the first switch and the second switch;

turning on the first switch and turning off the second switch;

turning off the first switch and turning off the second switch; and

turning off the first switch and turning on the second switch.

14. A semiconductor device comprising a first transistor, a first capacitor, a first output terminal, a first switch, a second switch, a second capacitor, a current-voltage converter circuit, and an amplifier circuit,

wherein a gate and a source of the first transistor are electrically connected to each other,

wherein a first terminal of the first capacitor and the first output terminal are electrically connected to a back gate of the first transistor,

wherein a second terminal of the first capacitor is electrically connected to the source,

wherein the first switch controls input of a first voltage to the back gate,

wherein a second voltage is input to a drain of the first transistor,

wherein the second switch controls input of a third voltage to the source,

wherein the first switch and the second switch are each a transistor including a metal oxide in a channel formation region,

wherein a first terminal of the second capacitor is electrically connected to the first output terminal,

wherein a second terminal of the second capacitor is electrically connected to an input terminal of the current-voltage converter circuit, and

wherein the amplifier circuit amplifies a fifth voltage output from the current-voltage converter circuit and outputs a sixth voltage.

15. The semiconductor device according to claim 14 ,

wherein the current-voltage converter circuit is a source follower circuit.

16. The semiconductor device according to claim 14 ,

wherein the sixth voltage decreases as temperature rises.

17. A method for operating the semiconductor device according to claim 14 , comprising:

turning on the first switch and the second switch;

turning on the first switch and turning off the second switch;

turning off the first switch and turning off the second switch; and

turning off the first switch and turning on the second switch.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2020
From: KUNITAKE, HITOSHI; HONDA, RYUNOSUKE; ATSUMI, TOMOAKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 053108/0395 →
Priority Claims (1)
JP JP2018-007209 · Jan 19, 2018 · national
Continuity (1)
Related Publication 20200365591A1 · Nov 19, 2020