IP Library › Granted Patent US 11,443,917
Granted Patent B2
US 11,443,917 · App. 16/891,842 · Granted Sep 13, 2022

Image generation method, non-transitory computer-readable medium, and system

Inventors: Chikako Abe (Tokyo, JP); Hitoshi Sugahara (Tokyo, JP)
Assignee: Hitachi High-Tech Corporation
H01J37/28G06N20/00H01J37/244H01J37/261H01J2237/24495H01J2237/2801H01J2237/2803
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Quick Facts
Patent No.
US 11,443,917
App. No.
16/891,842
Granted
Sep 13, 2022
Kind
B2
Abstract

The present invention relates to an image generation method for an objective for generating an image corresponding to a multi-frame image from image signals obtained by scanning a small number of frames are proposed. To achieve the above objective, there is proposed a method of performing two-dimensionally scanning on an object on a sample with a beam a plurality of times, generating a first image by integrating image signals obtained by a plurality of times of scanning at a first timing among the image signals generated based on the plurality of times of the two-dimensional scanning (S 103 ), generating a second image based on the smaller number of times of scanning than the number of times of scanning at the first timing including scanning after the first timing (S 105 ), training a learning device by using teacher data with the second image as an input and the first image as an output (S 108 ), and inputting input image signals obtained by the smaller number of times of scanning than the number of times of scanning at the first timing to the trained learning device to output an estimated image.

Claims (28)

1. An image generation method for integrating image signals obtained by beam scanning to generate an integrated image, the method comprising:

performing two-dimensional scanning on an object on a sample with a beam a plurality of times by using a deflector provided in a charged particle beam apparatus;

detecting charged particles obtained by the plurality of times of two-dimensional scanning by using a detector provided in the charged particle beam apparatus;

generating a first image by integrating the image signals obtained by a plurality of times of scanning at a first timing among the image signals generated based on the detecting;

generating a second image based on the smaller number of times of scanning than the number of times of scanning at the first timing including at least one time of scanning after the first timing and the scanning after the plurality of times of scanning within the first timing;

training a learning device by using teacher data with the second image as an input and the first image as an output; and

inputting image signals obtained by the smaller number of times of scanning than the number of times of scanning at the first timing to the trained learning device to output an estimated image.

2. The image generation method according to claim 1 , further comprising:

generating the first image by excluding at least one of a first time of scanning and a last time of scanning out of the plurality of times of two-dimensional scanning.

3. A non-transitory computer-readable medium having stored therein program instructions executable on a computer system to perform a computer-executed method for generating an image based on an output of a charged particle beam apparatus: wherein

the computer-executed method including

a step of

performing two-dimensional scanning on an object on a sample with a beam a plurality of times by using a deflector provided in the image generation tool,

detecting charged particles obtained by the plurality of times of two-dimensional scanning by using a detector provided in the charged particle beam apparatus, and

receiving a first image generated by integrating the image signals obtained by a plurality of times of scanning at a first timing among the image signals generated based on the detecting;

a step of receiving a second image generated based on the smaller number of times of scanning than the number of times of scanning at the first timing including at least one time of scanning after the first timing and scanning after the plurality of times of scanning within the first timing;

a step of training a learning device by using teacher data with the second image as an input and the first image as an output; and

a step of inputting image signals obtained by the smaller number of times of scanning than the number of times of scanning at the first timing to the trained learning device to output an estimated image.

4. A system that generates an image of an object of a sample from data obtained by a charged particle beam apparatus, the system comprising:

a computer system and components executed by the computer system, wherein

the computer system includes a learning device that outputs an estimated image,

the learning device is trained in advance by using teacher data with a first image generated by integrating image signals obtained by a plurality of times of scanning at a first timing among the image signals obtained by performing two-dimensional scanning a plurality of times by the charged particle beam apparatus as an input, and a second image generated based on the smaller number of times of scanning than the number of times of scanning at the first timing including at least one time of scanning after the first timing and scanning after the plurality of times of scanning within the first timing as an input, and

the component inputs image signals obtained by the smaller number of times of scanning than the number of times of scanning at the first timing to the trained learning device to output an estimated image.

5. The system according to claim 4 , further comprising:

an input device that inputs conditions for training the learning device, wherein

the input device is configured to input at least one of scanning after the first timing and scanning after a plurality of times of scanning in the scanning at the first timing, as conditions for generating the second image.

6. The system according to claim 4 , wherein

the first image and the second image are generated from image signals obtained based on beam scanning performed on the same pattern.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 4, 2020
From: ABE, CHIKAKO; SUGAHARA, HITOSHI
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052832/0883 →
Priority Claims (1)
JP JP2019-145052 · Aug 7, 2019 · national
Continuity (1)
Related Publication 20210043418A1 · Feb 11, 2021