IP Library › Granted Patent US 11,444,432
Granted Patent B2
US 11,444,432 · App. 16/780,761 · Granted Sep 13, 2022

Laser driver pulse shaping control

Inventors: Jonathan Ephraim David Hurwitz (Edinburgh, GB); Davide Portaluppi (Sardinia, IT)
Assignee: Analog Devices International Unlimited Company
H01S5/0428G01S7/484G01S7/4865G01S17/894H01S5/0035H01S5/183
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Quick Facts
Patent No.
US 11,444,432
App. No.
16/780,761
Granted
Sep 13, 2022
Kind
B2
Abstract

Time-of-flight (ToF) systems which use pulsed laser diodes, are required to measure distances with high level of precision and control. The present disclosure provides a method and a corresponding system for controlling a temporal response of a laser diode, in particular pulsed laser diodes. In particular, the present disclosure provides a method and a related system for driving a laser diode so as to obtain predominantly a peak pulse response while minimising or completely avoiding the post-peak response in a temporal response of the laser diode.

Claims (58)

1. A method of determining a duration, T dr , for a laser drive signal, to minimise post-peak response in a temporal response of a laser diode driven by the laser drive signal, the method comprising:

iteratively:

applying a test drive signal having a test duration, T t , to the laser diode;

monitoring an output of a photodetector, wherein the output is indicative of an energy of a light pulse output by the laser diode in response to application of the test drive signal;

varying the test duration, T t , of the test drive signal with successive iterations; and

determining a temporal response output characteristic of the laser diode with successive iterations; and

then, in response to the temporal response output characteristic of the laser diode meeting at least one criterion for at least one of the successive iterations, setting the duration, T dr , based on the test duration T t .

2. A method according to claim 1 , wherein the test duration, T t , of the test drive signal is increased between successive iterations.

3. A method according to claim 1 , wherein the test duration, T t , of the test drive signal is decreased between successive iterations.

4. A method according to claim 1 , wherein determining the temporal response output characteristic of the laser diode with successive iterations comprises:

identifying, from the monitored output of the photodetector, a first post-peak minimum in the said temporal of the laser diode; and

setting the duration, T dr , to be the test duration, T t , corresponding to the identified first post-peak minimum.

5. A method according to claim 4 , wherein monitoring of the output of the photodetector comprises:

integrating the output of the photodetector to determine an accumulated value indicative of the cumulative light output of the laser diode in response to the application of the test drive signal.

6. A method according to claim 5 , wherein identifying the first post-peak minimum in the said temporal response of the laser diode comprises:

determining a rate of change of the accumulated value between successive iterations; and

comparing the determined rate of change with a previously determined rate of change in an iteration immediately preceding the current iteration.

7. A method according to claim 1 , wherein determining the duration, T dr , based on the monitoring of the output of the photodetector in successive iterations comprises:

determining a lasing delay, wherein the lasing delay is a minimum test duration, T tmin , required to detect a light pulse output by the laser diode; and

determining the said duration, T dr , based on the lasing delay and a predetermined duration T p of the light pulse output by the laser.

8. A method according to claim 7 , further comprising:

comparing the determined lasing delay against one or more previously determined lasing delays for the laser diode, to check the condition of the laser diode.

9. A method according to claim 1 , further comprising:

comparing the determined determining the duration, T dr against one or more previously determined durations, T dr for the laser diode, to check the condition of the laser diode.

10. A control unit for determining a duration, T dr , for a laser drive signal, to minimise post-peak power in a temporal response of a laser diode driven by the laser drive signal, and comprising an input for coupling to an output of a photodetector, and an output for coupling to an input of the laser diode, wherein the control unit is configured to:

iteratively:

apply a test drive signal having a test duration, T t , to the laser diode;

monitor an output of the photodetector, wherein the output is indicative of an energy of a light pulse output by the laser diode in response to application of the test drive signal;

vary the test duration, T t , of the test drive signal with successive iterations; and

determining a temporal response output characteristic of the laser diode with successive iterations; and

then, in response to the temporal response output characteristic of the laser diode meeting at least one criterion for at least one of the successive iterations. setting the duration, T dr , based on the test duration T t .

11. A control unit according to claim 10 , wherein the control unit is configured to increase the test duration, T t , of the test drive signal between successive iterations.

12. A control unit according to claim 10 , wherein the control unit is configured to decrease the test duration, T t , of the test drive signal between successive iterations.

13. A control unit according to claim 10 , wherein the control unit is configured to:

identify the temporal response output characteristic, from the monitored output of the photodetector, wherein the temporal response output characteristic is a first post-peak minimum in the said temporal response of the laser diode; and

set the duration, T dr , to be the test duration, T t , corresponding to the identified first post-peak minimum.

14. A control unit according to claim 13 , wherein the control unit comprises:

an integrator configured to receive the output of the photodetector and integrate the output of the photodetector to determine an accumulated value indicative of the cumulative light output of the laser diode in response to the application of the test drive signal.

15. A control unit according to claim 14 , wherein the control unit is configured to:

determine a rate of change of the accumulated value between successive iterations; and

compare the determined rate of change with a previously determined rate of change in a previous iteration immediately preceding the current iteration in order to identify the first post-peak minimum in the said temporal response of the laser diode.

16. A control unit according to claim 10 , wherein the control unit is configured to:

determine a lasing delay, wherein the lasing delay is a minimum test duration, T Tmin , required to detect a light pulse output by the laser diode; and

determine the said duration, T dr , based on the lasing delay and a predetermined duration T p of the light pulse output by the laser.

17. A control unit according to claim 10 , further configured to

compare the determined determining the duration, T dr against one or more previously determined durations, T dr for the laser diode, to check the condition of the laser diode.

18. A system for determining a duration, T dr , for a laser drive signal, to minimise post-peak response in a temporal response of a laser diode driven by the laser drive signal, the system comprising:

a laser diode;

a photodetector;

a control unit to the laser diode and the photodetector, wherein the control unit is configured to:

iteratively:

apply a test drive signal having a test duration, T t , to the laser diode;

monitor an output of a photodetector, wherein the output is indicative of an energy of a light pulse output by the laser diode in response to application of the test drive signal;

vary the test duration, T t , of the test drive signal with successive iterations; and

determining a temporal response output characteristic of the laser diode with successive iterations; and

then, in response to the temporal response output characteristic of the laser diode meeting at least one criterion for at least one of the successive iterations, setting the duration, T dr , based on the test duration T t .

19. A system according to claim 18 wherein the laser diode is a pulsed laser diode.

20. A system according to claim 18 wherein the laser diode is a vertical cavity surface emitting laser diode (VCSEL).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2020
From: HURWITZ, JONATHAN EPHRAIM DAVID; PORTALUPPI, DAVIDE
To: ANALOG DEVICES INTERNATIONAL UNLIMITED COMPANY
Reel/Frame 051876/0487 →
Continuity (1)
Related Publication 20210242660A1 · Aug 5, 2021
Cited By (3)
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