Base material evaluation method and curved glass evaluation device

1. A method for preparing a curved glass object or curved silicon object for measurement of a physical, chemical or optical property of a surface of the a curved glass object or curved silicon object, comprising:

placing the a curved glass object or curved silicon object on a pedestal;

deforming the curved glass object or curved silicon object on the pedestal from a curvature R 1 to a curvature R 2 , wherein R 2 is less than R 1 ; and

measuring the physical, chemical or optical property of the curved glass object or curved silicon object on the deformed surface thereof while the deformed curved glass object or deformed curved silicon object is on the pedestal;

wherein the curved glass object or curved silicon object has a first main surface, a second main surface, and an end surface,

the second main surface contacts the pedestal, and

the measurement of the physical, chemical or optical property is on the first main surface.

2. The method according to claim 1 , wherein deforming the curved glass object or curved silicon object comprises:

i) applying a pressure P 1 on a first main surface side of the a curved glass object or curved silicon object toward the pedestal to deform the curved glass object or curved silicon object to conform to the surface of the pedestal; or

ii) applying a negative pressure P 2 on a second main surface side of the curved glass object or curved silicon object with vacuum drawn through the pedestal to deform the curved glass object or curved silicon object to conform to the surface of the pedestal; or a combination of i) and ii).

3. The method according to claim 2 , wherein the following relationship is satisfied:

| r 3− r 2|= t

wherein r 3 is a curvature radius of the surface of the pedestal to which the deformed curved glass object or curved silicon object conforms, r 2 is a curvature radius of the deformed curved glass object or deformed curved silicon object having a curvature R 2 , and t is a thickness of the curved or bent glass or silicon.

4. The method according to claim 1 , wherein in deforming the curved glass object or curved silicon object, the curved glass object or curved silicon object is sandwiched by a jig disposed on a first main surface side of the curved glass object or curved silicon object and the pedestal and the jig is applied to deform the curved glass object or curved silicon object to conform to the surface of the pedestal.

5. The method according to claim 4 , wherein the jig comprises an opening portion which exposes the first main surface of the curved glass object or curved silicon object.

6. The method according to claim 4 , wherein the first jig and the pedestal are connected with each other by a connecting member.

7. The method according to claim 6 , wherein the following relationship is satisfied:

| r 3− r 2|= t

wherein r 3 is a curvature radius of the surface of the pedestal to which the deformed curved glass object or deformed curved silicon object conforms, r 2 is a curvature radius of the deformed curved glass object or deformed curved silicon object having a curvature R 2 , and t is a thickness of the curved glass object or curved silicon object.

8. The method according to claim 1 , wherein the property of the surface to be measured is wear resistance.

9. The method according to claim 1 , further comprising, placing a liquid droplet on the surface to be measured, and wherein the property of the surface to be measured is derived from an evaluation of the liquid interface of the droplet.

10. The method according to claim 1 , wherein the property of the surface to be measured is an optical characteristic.

11. The method of claim 1 wherein the curved glass object is measured and the glass is an organic or inorganic glass.

12. The method of claim 11 , wherein an organic glass is measured and the organic glass is polycarbonate or polymethylmethacrylate.