Aberration correction method and optical device
A microscope apparatus includes SLMs each having a modulation plane, an objective lens disposed on an optical path between the modulation plane and an object, and a computer for controlling the SLMs on the basis of a modulation pattern including a correction pattern for correcting aberration caused by a refractive index interface of the object. The computer determines a position of the correction pattern in the modulation pattern on the basis of inclination information of the refractive index interface with respect to a plane perpendicular to an optical axis of the objective lens.
1. An aberration correction method comprising:
a coupling step of optically coupling a modulation plane of a spatial light modulator and an object through an objective lens;
a control step of controlling the spatial light modulator on the basis of a modulation pattern including a correction pattern for correcting aberration caused by a refractive index interface of the object; and
a measurement step of measuring an inclination angle of the refractive index interface of the object, wherein
a position of the correction pattern in the modulation pattern is set on the basis of inclination information of the refractive index interface of the object with respect to a plane perpendicular to an optical axis of the objective lens such that a center of the correction pattern is deviated from a point where the optical axis of the objective lens intersects with the modulation plane by a distance determined on the basis of the inclination information, and
the inclination information is determined on the basis of the inclination angle measured by the measurement step.
2. The aberration correction method according to claim 1 , wherein the measurement step includes acquiring a plurality of images of the object having different depths from the refractive index interface of the object, and obtaining the inclination angle on the basis of the plurality of images.
3. The aberration correction method according to claim 1 , wherein a diameter of a region of the correction pattern on the modulation plane is larger than a pupil diameter of the objective lens.
4. The aberration correction method according to claim 1 , wherein the measurement step includes dividing the refractive index interface of the object into a plurality of regions, and measuring the inclination angles in the respective regions, and
the inclination information is determined on the basis of the inclination angles in the respective regions.
5. An aberration correction method comprising:
a coupling step of optically coupling a modulation plane of a spatial light modulator and an object through an objective lens;
a control step of controlling the spatial light modulator on the basis of a modulation pattern including a correction pattern for correcting aberration caused by a refractive index interface of the object; and
a measurement step of measuring an inclination angle of the refractive index interface of the object, wherein
the spatial light modulator and the objective lens are disposed on the basis of inclination information of the refractive index interface of the object with respect to a plane perpendicular to an optical axis of the objective lens such that the modulation plane is deviated relative to the optical axis of the objective lens in a direction intersecting with the optical axis by a distance determined on the basis of the inclination information, and
the inclination information is determined on the basis of the inclination angle measured by the measurement step.
6. The aberration correction method according to claim 5 , wherein the measurement step includes acquiring a plurality of images of the object having different depths from the refractive index interface of the object, and obtaining the inclination angle on the basis of the plurality of images.
7. The aberration correction method according to claim 2 , wherein a diameter of a region of the correction pattern on the modulation plane is larger than a pupil diameter of the objective lens.
8. The aberration correction method according to claim 5 , wherein the measurement step includes dividing the refractive index interface of the object into a plurality of regions, and measuring the inclination angles in the respective regions, and
the inclination information is determined on the basis of the inclination angles in the respective regions.
9. An optical apparatus comprising:
a spatial light modulator having a modulation plane;
an objective lens disposed on an optical path between the modulation plane and an object;
a controller configured to control the spatial light modulator on the basis of a modulation pattern including a correction pattern for correcting aberration caused by a refractive index interface of the object; and
a measurement unit configured to measure an inclination angle of the refractive index interface of the object, wherein
a position of the correction pattern in the modulation pattern is set on the basis of inclination information of the refractive index interface of the object with respect to a plane perpendicular to an optical axis of the objective lens such that a center of the correction pattern is deviated from a point where the optical axis of the objective lens intersects with the modulation plane by a distance determined on the basis of the inclination information, and
the inclination information is determined on the basis of the inclination angle measured by the measurement unit.
10. The optical apparatus according to claim 9 , wherein the measurement unit is configured to acquire a plurality of images of the object having different depths from the refractive index interface of the object, and obtain the inclination angle on the basis of the plurality of images.
11. The optical apparatus according to claim 9 , wherein a diameter of a region of the correction pattern on the modulation plane is larger than a pupil diameter of the objective lens.
12. The optical apparatus according to claim 9 , wherein the measurement unit is configured to divide the refractive index interface of the object into a plurality of regions, and measure the inclination angles in the respective regions, and
the inclination information is determined on the basis of the inclination angles in the respective regions.
13. An optical apparatus comprising:
a spatial light modulator having a modulation plane, and configured to modulate light on the basis of a modulation pattern including a correction pattern for correcting aberration caused by a refractive index interface of an object;
an objective lens disposed on an optical path between the modulation plane and the object;
a moving mechanism configured to move at least one of the objective lens and the spatial light modulator in a direction intersecting with an optical axis of the objective lens;
a controller configured to control the moving mechanism; and
a measurement unit configured to measure an inclination angle of the refractive index interface of the object, wherein
the controller is configured to control the moving mechanism on the basis of inclination information of the refractive index interface of the object with respect to a plane perpendicular to the optical axis of the objective lens such that the modulation plane is deviated relative to the optical axis of the objective lens in a direction intersecting with the optical axis by a distance determined on the basis of the inclination information, and
the inclination information is determined on the basis of the inclination angle measured by the measurement unit.
14. The optical apparatus according to claim 13 , wherein the measurement unit is configured to acquire a plurality of images of the object having different depths from the refractive index interface of the object, and obtain the inclination angle on the basis of the plurality of images.
15. The optical apparatus according to claim 13 , wherein a diameter of a region of the correction pattern on the modulation plane is larger than a pupil diameter of the objective lens.
16. The optical apparatus according to claim 13 , wherein the measurement unit is configured to divide the refractive index interface of the object into a plurality of regions, and measure the inclination angles in the respective regions, and the inclination information is determined on the basis of the inclination angles in the respective regions.