Method for determining IC voltage and method for finding relation between voltages and circuit parameters
Disclosed is an IC voltage determining method including: executing a static timing analysis according to a circuit design to obtain data of a critical path and then generating a netlist; executing a circuit parameter simulation and Monte Carlo simulation with the netlist according to a regular voltage and prescribed parameters to obtain a circuit parameter reference value and a variance of circuit parameter values; executing an adaptive voltage scaling analysis according to a voltage range to obtain a voltage-versus-parameter relation indicative of the number of times that each of circuit parameter deviations that are respectively associated with predetermined voltages within the predetermined voltage range is of the variance; and testing an IC according to the regular voltage to obtain a circuit parameter test value and determining the IC voltage according to the voltage-versus-parameter relation and a difference between the circuit parameter test value and the circuit parameter reference value.
1. A method, comprising:
executing a static timing analysis (STA) according to a circuit design to obtain data of a critical path of the circuit design, and then generating a netlist according to the data of the critical path;
executing a circuit parameter simulation and a Monte Carlo simulation with the netlist according to a regular voltage and prescribed parameters, and thereby obtaining a circuit parameter reference value and a variance of circuit parameter values;
executing an adaptive voltage scaling (AVS) analysis according to a predetermined voltage range, and thereby obtaining a voltage-versus-parameter relation, the voltage-versus-parameter relation indicative of a number of times that each of circuit parameter deviations that are respectively associated with predetermined voltages within the predetermined voltage range is of the variance; and
testing an integrated circuit (IC) according to the regular voltage to obtain a circuit parameter test value of the IC, and then determining an IC voltage supplied to the IC according to the voltage-versus-parameter relation and a value difference between the circuit parameter test value and the circuit parameter reference value.
2. The method of claim 1 , wherein the regular voltage is within the predetermined voltage range.
3. The method of claim 1 , wherein the circuit parameter simulation is a process corner simulation.
4. The method of claim 3 , wherein the circuit parameter simulation is a typical-typical corner (TT corner) simulation.
5. The method of claim 1 , wherein both the circuit parameter reference value and the circuit parameter test value are signal transmission delay values of the critical path.
6. The method of claim 1 , wherein a voltage difference between the regular voltage and the IC voltage is proportional to the value difference.
7. The method of claim 1 , wherein the prescribed parameters include a plurality of process parameters and at least one of following parameters: a slew parameter of the critical path; a load parameter of the critical path; and an IR drop parameter.
8. The method of claim 1 , wherein a circuit parameter actual value of the IC under the IC voltage, the circuit parameter test value, and the circuit parameter reference value belong to a same type of parameter values, and an actual parameter difference between the circuit parameter actual value and the circuit parameter reference value is less than the value difference between the circuit parameter test value and the circuit parameter reference value.
9. A method, comprising:
executing a static timing analysis (STA) according to a circuit design to obtain data of a critical path of the circuit design, and then generating a netlist according to the data of the critical path;
executing a circuit parameter simulation and a Monte Carlo simulation with the netlist according to a regular voltage and prescribed parameters, and thereby obtaining a circuit parameter reference value and a variance; and
executing an adaptive voltage scaling (AVS) analysis according to a predetermined voltage range, and thereby obtaining a voltage-versus-parameter relation, the voltage-versus-parameter relation indicative of a number of times that each of circuit parameter deviations that are respectively associated with predetermined voltages within the predetermined voltage range is of the variance.
10. The method of claim 9 , wherein the circuit parameter simulation is a process corner simulation.
11. The method of claim 1 , wherein the predetermined voltage range is from 80% of the regular voltage to 120% of the regular voltage; and the predetermined voltages within the predetermined voltage range are at regular intervals.
12. The method of claim 9 , wherein the predetermined voltage range is from 80% of the regular voltage to 120% of the regular voltage; and the predetermined voltages within the predetermined voltage range are at regular intervals.