Stacked semiconductor device and test method thereof
A stacked semiconductor device may include: a base die; and a plurality of core dies stacked over the base die and coupled to each other through a plurality of through-electrodes and a reference through-electrode, wherein the base die includes a first test circuit suitable for transferring a test oscillating signal to at least one target through-electrode among the through-electrodes, and outputting a test output signal by comparing a test base signal generated based on the test oscillating signal, with a test core signal transferred through the reference through-electrode, during a test operation; and wherein each of the core dies includes a second test circuit suitable for generating the test core signal corresponding to the test oscillating signal transferred through the target through-electrode, and transferring the test core signal to the reference through-electrode, during the test operation.
1. A stacked semiconductor device, comprising:
a base die; and
a plurality of core dies stacked over the base die and coupled to each other through a plurality of through-electrodes and a reference through-electrode,
wherein the base die includes a first test circuit suitable for transferring a test oscillating signal to at least one target through-electrode among the through-electrodes, and outputting a test output signal by comparing a test base signal generated based on the test oscillating signal, with a test core signal transferred through the reference through-electrode, during a test operation; and
wherein each of the core dies includes a second test circuit suitable for generating the test core signal corresponding to the test oscillating signal transferred through the target through-electrode, and transferring the test core signal to the reference through-electrode, during the test operation.
2. The stacked semiconductor device of claim 1 ,
wherein the base die includes a first area suitable for interfacing with a controller, a second area suitable for interfacing with the through-electrodes, and a third area suitable for interfacing with a test device, and
wherein the first test circuit is disposed in the second area.
3. The stacked semiconductor device of claim 2 , wherein the first test circuit outputs the test output signal to outside through a test output pad disposed in the third area.
4. The stacked semiconductor device of claim 2 , wherein the base die includes:
a first input/output (I/O) buffer circuit disposed in the first area, and suitable for receiving and outputting data transferred from/to the controller; and
a second I/O buffer circuit disposed in the second area, and suitable for receiving and outputting data transferred from/to the through-electrodes.
5. The stacked semiconductor device of claim 4 , wherein the first test circuit includes:
a pattern generator suitable for generating and providing the test oscillating signal to an output buffer of the second I/O buffer circuit, according to a test signal;
a first counter suitable for counting the test oscillating signal to generate a base counting signal according to the test signal;
a first serializer suitable for serializing the base counting signal to output the test base signal; and
a comparator suitable for comparing the test core signal with the test base signal to output the test output signal.
6. The stacked semiconductor device of claim 5 ,
wherein the test signal includes a multi-bit signal having frequency information, and
wherein the pattern generator generates the test oscillating signal which toggles at a set period, according to the frequency information included in the test signal.
7. The stacked semiconductor device of claim 5 , wherein the first test circuit further includes:
a first register suitable for storing the base counting signal outputted from the first counter to provide the stored base counting signal to the first serializer.
8. The stacked semiconductor device of claim 4 , wherein the first test circuit includes:
a pattern generator suitable for generating a first pre-oscillating signal according to a test signal;
a multiplexer suitable for outputting the oscillating signal to an output buffer of the second I/O buffer circuit by selecting one of the first pre-oscillating signal and a second pre-oscillating signal in response to a test selection signal;
a first counter suitable for counting the first pre-oscillating signal or the second pre-oscillating signal to generate a base counting signal according to the test signal;
a first serializer suitable for serializing the base counting signal to output the test base signal; and
a comparator suitable for comparing the core signal with the test base signal to output the test output signal.
9. The stacked semiconductor device of claim 8 , wherein the first test circuit further includes:
a first register suitable for storing the base counting signal outputted from the first counter to provide the stored base counting signal to the first serializer.
10. The stacked semiconductor device of claim 1 , wherein each of the core dies includes:
a core region including a plurality of memory cells; and
a peripheral region including a peripheral circuit for controlling components disposed in the core region, an interface circuit for interfacing with the through-electrodes, and the through-electrodes TSV.
11. The stacked semiconductor device of claim 10 , wherein each of the core dies includes:
a third I/O buffer circuit disposed in the peripheral region, and suitable for receiving and outputting data transferred from/to the through-electrodes.
12. The stacked semiconductor device of claim 11 , wherein the second test circuit includes:
a second counter suitable for counting the test oscillating signal transferred from an input buffer of the third I/O buffer circuit to generate a core counting signal, according to a test signal; and
a second serializer suitable for serializing the core counting signal to output the test core signal to the reference through-electrode.
13. The stacked semiconductor device of claim 12 , wherein the second test circuit further includes:
a second register suitable for storing the core counting signal outputted from the second counter to provide the stored core counting signal to the second serializer.
14. The stacked semiconductor device of claim 11 , wherein each of the core dies further includes:
a write driver suitable for writing data transferred from the third I/O buffer circuit into the memory cells during a write operation; and
an I/O sense amplifier suitable for sensing and amplifying data outputted from the memory cells to transfer the amplified data to the third I/O buffer circuit during a read operation.
15. A test method of a stacked semiconductor device including a base die and a plurality of core dies stacked over the base die and coupled to each other through a plurality of through-electrodes and a reference through-electrode, the test operation comprising:
transferring, at the base die, a test oscillating signal to a target through-electrode among the through-electrodes, and generating a test base signal based on the oscillating signal;
generating, at any of the core die, a test core signal based on the test oscillating signal transferred through the target through-electrode; and
outputting, at the base die, a test output signal by comparing the test core signal transferred through the reference through-electrode, with the test base signal.
16. The test method of claim 15 ,
wherein the base die includes a first area suitable for interfacing with a controller, a second area suitable for interfacing with the through-electrodes, and a third area suitable for interfacing with a test device, and
further comprising:
outputting, at the base die, the test output signal to the test device through a test output pad disposed in the third area.
17. The test method of claim 16 , wherein the oscillating signal is inputted from the test device through a test input pad disposed in the third area.
18. The test method of claim 15 , wherein the based die generates the test oscillating signal according to a test signal including a multi-bit signal having frequency information, the test oscillating signal toggling with a set period, according to the frequency information included in the test signal.
19. The test method of claim 15 , wherein the generating a base signal based on the oscillating signal includes:
counting the test oscillating signal to generate a base counting signal according to a test signal;
storing the base counting signal; and
serializing the stored base counting signal to output the test base signal.
20. The test method of claim 15 , wherein the generating a test core signal based on the test oscillating signal includes:
counting the test oscillating signal to generate a core counting signal, according to a test signal;
storing the core counting signal; and
serializing the core counting signal to output the test core signal to the reference through-electrode.