IP Library › Granted Patent US 11,460,689
Granted Patent B2
US 11,460,689 · App. 16/708,822 · Granted Oct 4, 2022

System and method for association assisted establishment of scattering configuration in scattering processing

Inventors: Lin Pang (San Diego, CA); Tomofumi Yamamuro (San Diego, CA)
Assignees: STANLEY ELECTRIC CO., LTD.; LINOPTX, LLC
G02B26/0833B60Q1/1407B60Q1/1423B60Q1/20F21S41/125F21S41/16F21S41/60F21V9/08F21V9/14F21V9/30F21V14/003G01N21/4795G01S7/497G01S17/04G01S17/10G01S17/89G01S17/931G02F1/0105G03B21/008H04N5/2256H04N5/272F21W2102/20F21Y2115/10F21Y2115/30G01J2003/285
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Quick Facts
Patent No.
US 11,460,689
App. No.
16/708,822
Granted
Oct 4, 2022
Kind
B2
Abstract

A system for association-based scattering processing includes a spatial light modulator configured to modulate one or more of phase and amplitude of light irradiated from a light source to a target object. Additionally, the system includes processing circuitry configured to evaluate a field distribution for one localized illumination, induce a set of field distributions for a plurality of localized illuminations based on the field distribution for the one localized illumination, and apply the set of field distributions to the spatial light modulator, scanning a plurality of localized illuminations on the target object.

Claims (58)

1. A system, comprising:

a spatial light modulator configured to modulate one or more of phase and amplitude of light irradiated from a light source to a target object; and

processing circuitry configured to

evaluate a field distribution for one localized illumination,

induce a set of field distributions for a plurality of localized illuminations based on the field distribution for the one localized illumination, and

apply the set of field distributions to the spatial light modulator, scanning a plurality of localized illuminations on the target object.

2. The system of claim 1 , wherein the processing circuitry is further configured to

induce the field distribution from low dimension to high dimension for the one localized illumination.

3. The system of claim 1 , wherein the processing circuitry is further configured to

detect an image for each of the plurality of the localized illuminations on the target object, wherein the images are processed to acquire a confocal image of the target object.

4. The system of claim 1 , wherein the processing circuitry for evaluating the field distribution for the one localized illumination is further configured to

determine whether a Hadamard matrix approach satisfies a predetermined threshold required for calculating the field distribution for the one localized illumination, and

calculate the field distribution for the one localized illumination in response to the Hadamard matrix approach satisfying the predetermined threshold.

5. The system of claim 1 , wherein periodical phase differences corresponding to the set of field distributions are abstracted from a plurality of phase patterns for generating the plurality of localized illuminations at the spatial light modulator.

6. The system of claim 1 , further comprising:

a memory configured to store information including a plurality of field distributions where each field distribution indicates a linear input/output response to each scattering medium of a plurality of scattering mediums, phase patterns at the spatial light modulator for generating all of the plurality of localized illuminations, phase difference at the spatial light modulator where the phase difference can be determined between a standard phase pattern for generating one of the plurality of localized illuminations, and other phase patterns for generating neighboring localized illuminations.

7. The system of claim 4 , wherein the processing circuitry for calculating the field distribution for one localized illumination is further configured to

generate a Hadamard matrix,

input columns from the Hadamard matrix on the spatial light modulator,

measure intensities on the detector corresponding to the input on the spatial light modulator, and

calculate the field distribution for the one localized illumination based on the measured intensities.

8. The system of claim 1 , wherein the processing circuitry is further configured to

calculate a phase or amplitude pattern based on the field distribution for the one localized illumination, and

induce a set of phase or amplitude patterns based on the calculated phase or amplitude pattern.

9. The system of claim 8 , wherein in response to inducing the phase and amplitude patterns based on the calculated phase pattern, the processing circuitry is further configured to

calculate one of the phase or amplitude patterns corresponding to a neighboring localized illumination which is adjacent to the one localized illumination.

10. The system of claim 1 , wherein one of the plurality of localized illuminations is located in a center of the plurality of localized illuminations arranged on the target object.

11. The system of claim 1 , wherein the spatial light modulator is a Digital Micromirror Device (DMD) including a plurality of micromirrors arranged in a matrix.

12. The system of claim 1 , further comprising:

an imaging device configured to generate image data by capturing an image of the target object through a scattering medium.

13. A method for generating a modulation signal for scattering processing, comprising:

evaluating a field distribution for one localized illumination;

inducing a set of field distributions for a plurality of localized illuminations based on the field distribution for the one localized illumination; and

applying the set of field distributions to the spatial light modulator, scanning a plurality of localized illuminations on the target object.

14. The method of claim 13 , further comprising:

inducing the field distribution from low dimension to high dimension for the one localized illumination.

15. The method of claim 13 , further comprising:

detect an image for each of the plurality of the localized illuminations on the target object, wherein the images are processed to acquire a confocal image of the target object.

16. The method of claim 13 , further comprising:

determining whether a Hadamard matrix approach satisfies a predetermined threshold required for calculating the field distribution for the one localized illumination; and

calculating the field distribution for the one localized illumination in response to the Hadamard matrix approach satisfying the predetermined threshold.

17. The method of claim 16 , wherein calculating the field distribution for the one localized illumination further comprises:

generating a Hadamard matrix;

inputting columns from the Hadamard matrix on the spatial light modulator;

measuring intensities on the detector corresponding to the input on the spatial light modulator; and

calculating the field distribution for the one localized illumination based on the measured intensities.

18. The method of claim 13 , wherein one of the plurality of localized illuminations is located in a center of the plurality of localized illuminations arranged on the target object.

19. The method of claim 13 , wherein periodical phase differences between phase patterns corresponding to the set of field distributions are abstracted from a plurality of phase patterns for generating the plurality of localized illuminations at the spatial light modulator.

20. A system, comprising:

a light source;

a spatial light modulator;

a detector; and

processing circuitry configured to

project, via the light source, illumination based on a predetermined illumination profile,

modulate, via the spatial light modulator, an optical field of the projected illumination based on the illumination profile,

detect, via the detector, backscattered illumination corresponding to a first portion of the projected illumination backscattered from a scattering medium,

detect, via the detector, reflected illumination corresponding to a second portion of the projected illumination reflected from a target object located in or through the scattering medium, and

induce the illumination profile based on one localized illumination, wherein other localized illuminations can be formed at different positions through the scattering medium based on an association relationship among the optical fields for the localized illuminations in or through the scattering medium.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 10, 2019
From: PANG, LIN; YAMAMURO, TOMOFUMI
To: STANLEY ELECTRIC CO., LTD.; LINOPTX, LLC
Reel/Frame 051232/0971 →
Continuity (3)
Provisional Application 62797363 · Jan 28, 2019
Provisional Application 62797366 · Jan 28, 2019
Related Publication 20200241385A1 · Jul 30, 2020