Memory device and memory system
A memory device includes a multiphase clock generator which generates a plurality of divided clock signals, a first error correction block which receives a first divided clock signal among the plurality of divided clock signals, a first data multiplexer which transmits first least significant bit data corresponding to the first divided clock signal, a second error correction block which receives the first divided clock signal, and a second data multiplexer which transmits first most significant bit data corresponding to the first divided clock signal. The first error correction block receives the first least significant bit data and corrects a toggle timing of the first least significant bit data. The second error correction block receives the first most significant bit data and corrects a toggle time of the first most significant bit data.
1. A memory device, comprising:
a multiphase clock generator, which generates a plurality of divided clock signals;
a first error correction block, which receives a first divided clock signal among the plurality of divided clock signals;
a first data multiplexer, which transmits first least significant bit data corresponding to the first divided clock signal;
a second error correction block, which receives the first divided clock signal; and
a second data multiplexer, which transmits first most significant bit data corresponding to the first divided clock signal,
wherein
the first error correction block receives the first least significant bit data and corrects a toggle timing of the first least significant bit data, and
the second error correction block receives the first most significant bit data and corrects a toggle time of the first most significant bit data.
2. The memory device of claim 1 , wherein at least one of the first error correction block and the second error correction block includes a quadrature error correction (QEC) circuit.
3. The memory device of claim 1 , wherein at least one of the first error correction block and the second error correction block includes a duty cycle correction (DCC) circuit.
4. The memory device of claim 1 , further comprising:
a pre-error correction block connected to the multiphase clock generator, which receives the plurality of divided clock signals from the multiphase clock generator.
5. The memory device of claim 4 , wherein the pre-error correction block corrects a duty error of at least some of the plurality of divided clock signals.
6. The memory device of claim 1 , further comprising:
a third error correction block, which receives the first divided clock signal; and
a third data multiplexer, which transmits first central significant bit data corresponding to the first divided clock signal.
7. The memory device of claim 6 , wherein the third error correction block receives the first central significant bit data and corrects a toggle time of the first central significant bit data.
8. A memory device, comprising:
is a memory interface;
a control logic circuit, which receives a command from the memory interface; and
a memory cell array controlled by the control logic circuit, which stores data,
wherein
the memory interface generates a plurality of divided clock signals via a multiphase clock generator, receives a first divided clock signal among the plurality of divided clock signals via a first error correction block and transmits first least significant bit data corresponding to the first divided clock signal via a first data multiplexer, receives the first divided clock signal via a second error correction block and transmits first most significant bit data corresponding to the first divided clock signal via a second data multiplexer,
the first error correction block receives the first least significant bit data and corrects a toggle time of the first least significant bit data, and
the second error correction block receives the first most significant bit data and corrects a toggle time of the first most significant bit data.
9. The memory device of claim 8 , wherein at least one of the first error correction block and the second error correction block includes a quadrature error correction (QEC) circuit.
10. The memory device of claim 8 , wherein at least one of the first error correction block and the second error correction block includes a duty cycle correction (DCC) circuit.
11. The memory device of claim 8 , further comprising:
a pre-error correction block connected to the multiphase clock generator, which receives the plurality of divided clock signals from the multiphase clock generator.
12. The memory device of claim 11 , wherein the pre-error correction block corrects a duty error of at least some of the plurality of divided clock signals.
13. The memory device of claim 8 , further comprising:
a third error correction block, which receives the first divided clock signal; and
a third data multiplexer which transmits first central significant bit data corresponding to the first divided clock signal.
14. The memory device of claim 13 , wherein the third error correction block receives the first central significant bit data and corrects a toggle time of the first central significant bit data.
15. A memory system, comprising:
a memory controller including a controller interface circuit; and
a memory device, comprising:
a memory interface, which receives a signal from the memory controller;
a control logic circuit, which receives a command from the memory interface; and
a memory cell array, which stores data and is connected to the control logic circuit,
wherein the memory interface comprises:
a multiphase clock generator, which generates a plurality of divided clock signals;
a first error correction block, which receives a first divided clock signal among the plurality of divided clock signals;
is a first data multiplexer, which transmits first least significant bit data corresponding to the first divided clock signal;
a second error correction block, which receives the first divided clock signal; and
a second data multiplexer, which transmits first most significant bit data corresponding to the first divided clock signal,
wherein the first error correction block receives the first least significant bit data and corrects a toggle time of the first least significant bit data, and
the second error correction block receives the first most significant bit data and corrects a toggle time of the first most significant bit data.
16. The memory system of claim 15 , wherein at least one of the first error correction block and the second error correction block includes a quadrature error correction (QEC) circuit.
17. The memory device of claim 15 , wherein at least one of the first error correction block and the second error correction block includes a duty cycle correction (DCC) circuit.
18. The memory system of claim 15 , further comprising:
a pre-error correction block connected to the multiphase clock generator, which receives the plurality of divided clock signals from the multiphase clock generator.
19. The memory system of claim 18 , wherein the pre-error correction block corrects a duty error of at least some of the plurality of divided clock signals.
20. The memory system of claim 15 , further comprising:
a third error correction block, which receives the first divided clock signal; and
a third data multiplexer, which transmits first central significant bit data corresponding to the first divided clock signal,
wherein the third error correction block receives the first central significant bit data and corrects a toggle time of the first central significant bit data.