IP Library Granted Patent US 11,462,449
Granted Patent B2
US 11,462,449 · App. 17/417,854 · Granted Oct 4, 2022

Semiconductor device

Inventors: Hiroshi Sato (Ibaraki, JP); Yoshinori Murakami (Kanagawa, JP); Hidekazu Tanisawa (Ibaraki, JP); Shinji Sato (Ibaraki, JP); Fumiki Kato (Ibaraki, JP); Kazuhiro Mitamura (Ibaraki, JP); Yui Takahashi (Tokyo, JP)
Assignee: NISSAN MOTOR CO., LTD.
H01L23/29H01L23/31H01L33/486H01L33/502H01L33/62H01L2924/181
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Quick Facts
Patent No.
US 11,462,449
App. No.
17/417,854
Granted
Oct 4, 2022
Kind
B2
Abstract

A semiconductor device includes a semiconductor chip provided inside with a p-n junction, an opaque sealing resin covering a surface of the semiconductor chip, and a functional region arranged between the semiconductor chip and the sealing resin and configured to prevent light, which is generated when a forward current flows through the p-n junction and has a particular wavelength causing deterioration of the sealing resin, from reaching the sealing resin.

Claims (31)

1. A semiconductor device comprising:

a semiconductor chip provided inside with a p-n junction;

an opaque sealing resin covering a surface of the semiconductor chip; and

a functional region arranged between the semiconductor chip and the sealing resin and configured to prevent a light from reaching the sealing resin, the light being generated when a forward current flows through the p-n junction and having a particular wavelength causing deterioration of the sealing resin,

wherein the functional region includes a functional insulating film having an insulating property and arranged between the semiconductor chip and the sealing resin, and

the functional insulating film includes a fluorescent substance that converts the light having the particular wavelength into a light having a long wavelength.

2. The semiconductor device according to claim 1 , further comprising:

a substrate on which the semiconductor chip is mounted; and

a bonding member including metal and electrically bonding a wiring pattern arranged on a top surface of the substrate with an electrode provided on a main surface of the semiconductor chip opposed to the top surface of the substrate,

wherein the bonding member continuously extends along a side surface of the semiconductor chip.

3. A semiconductor device comprising:

a semiconductor chip provided inside with a p-n junction;

an opaque sealing resin covering a surface of the semiconductor chip; and

a functional region arranged between the semiconductor chip and the sealing resin and configured to prevent a light from reaching the sealing resin, the light being generated when a forward current flows through the p-n junction and having a particular wavelength causing deterioration of the sealing resin,

wherein the functional region includes a functional insulating film having an insulating property and arranged between the semiconductor chip and the sealing resin, and

the functional insulating film includes a fluorescent microparticle including a fluorescent substance that converts the light having the particular wavelength into a light having a long wavelength and covers a surface of a particulate base body having a higher refractive index than the functional insulating film.

4. The semiconductor device according to claim 3 , wherein the particulate base body has a smaller coefficient of thermal expansion than a base body of the functional insulating film.

5. The semiconductor device according to claim 3 , further comprising:

a substrate on which the semiconductor chip is mounted; and

a bonding member including metal and electrically bonding a wiring pattern arranged on a top surface of the substrate with an electrode provided on a main surface of the semiconductor chip opposed to the top surface of the substrate,

wherein the bonding member continuously extends along a side surface of the semiconductor chip.

6. A semiconductor device comprising:

a semiconductor chip provided inside with a p-n junction;

an opaque sealing resin covering a surface of the semiconductor chip; and

a functional region arranged between the semiconductor chip and the sealing resin and configured to prevent a light from reaching the sealing resin, the light being generated when a forward current flows through the p-n junction and having a particular wavelength causing deterioration of the sealing resin,

wherein the functional region includes a functional insulating film having an insulating property and arranged between the semiconductor chip and the sealing resin, and

the functional insulating film includes a microcrystal particle including a semiconductor having a band gap equal to or narrower than a semiconductor included in the semiconductor chip.

7. The semiconductor device according to claim 6 , further comprising:

a substrate on which the semiconductor chip is mounted; and

a bonding member including metal and electrically bonding a wiring pattern arranged on a top surface of the substrate with an electrode provided on a main surface of the semiconductor chip opposed to the top surface of the substrate,

wherein the bonding member continuously extends along a side surface of the semiconductor chip.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2022
From: SATO, HIROSHI; MURAKAMI, YOSHINORI; TANISAWA, HIDEKAZU; SATO, SHINJI; KATO, FUMIKI; MITAMURA, KAZUHIRO; TAKAHASHI, YUI
To: NISSAN MOTOR CO., LTD.
Reel/Frame 060603/0872 →
Continuity (1)
Related Publication 20220044980A1 · Feb 10, 2022