IP Library › Granted Patent US 11,485,669
Granted Patent B2
US 11,485,669 · App. 16/030,179 · Granted Nov 1, 2022

Quartz glass component of high thermal stability, semifinished product therefor, and method for producing the same

Inventors: Christian Schenk (Ingelheim, DE); Nadine Tscholitsch (Hanau, DE); Thomas Baier (Hanau, DE)
Assignee: Heraeus Quarzglas GmbH & Co. KG
C03B20/00C03B19/066C03B32/02C03C17/00C03C17/007C03C17/008C03B2201/50C03C2217/425C03C2217/45C03C2217/478
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Quick Facts
Patent No.
US 11,485,669
App. No.
16/030,179
Granted
Nov 1, 2022
Kind
B2
Abstract

In a known method for producing a quartz glass component, a crystal formation layer containing a crystallization promoter is produced on a coating surface of a base body of quartz glass. Starting therefrom, to provide a method for producing a quartz glass component of improved thermal strength and long-term stability which displays a comparatively small deformation particularly also in the case of rapid heating-up processes, it is suggested according to one aspect that a porous crystal formation layer containing amorphous SiO 2 particles is produced with a mean thickness in the range of 0.1 to 5 mm, and that a substance which contains cesium and/or rubidium is used as the crystallization promoter.

Claims (16)

1. A method for producing a quartz glass component, with a crystal formation layer containing a crystallization promoter being produced on a coating surface of a base body of quartz glass, comprising:

producing a porous cristobalite crystal formation layer containing amorphous SiO 2 particles with a mean thickness in the range of 0.1 to 5 mm;

wherein the crystallization promoter is a substance that contains cesium and/or rubidium; and

wherein the amount of the crystallization promoter substance in the porous crystal formation layer is at least 0.025 mole % and not more than 0.5 mole %.

2. The method of claim 1 , wherein the crystallization promoter substance has a melting temperature below 1150° C.

3. The method of claim 1 , wherein the crystallization promoter substance has a melting temperature below 1100° C.

4. The method of claim 1 , wherein the porous cristobalite crystal formation layer is produced with a mean thickness in the range of 0.5 to 3 mm.

5. The method of claim 1 , wherein amorphous SiO 2 particles produced by comminuting quartz glass make up the greatest volume proportion of the crystal formation layer.

6. The method of claim 1 , wherein the production of the porous cristobalite crystal formation layer comprises:

applying a dispersion which contains the amorphous SiO 2 particles in a liquid, as a slurry layer to the coating surface; and

drying the slurry layer while forming a green layer.

7. The method of claim 6 , wherein the crystallization promoter or a precursor substance thereof is contained in the dispersion in dissolved form.

8. The method of claim 6 , wherein the green layer has a green density of at least 1.7 g/cm 3 .

9. The method of claim 6 , wherein the green layer is thermally densified at a temperature in the range of 670° C. to 1000° C.

10. The method of claim 1 , wherein the porous cristobalite crystal formation layer is heated to a temperature of less than 1250° C. and that the formation of cristobalite sets in during heating of the layer.

11. The method of claim 1 , wherein the porous cristobalite crystal formation layer is heated to a temperature of less than 1150° C. and that the formation of cristobalite sets in during heating of the layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2018
From: SCHENK, CHRISTIAN; TSCHOLITSCH, NADINE; BAIER, THOMAS
To: HERAEUS QUARZGLAS GMBH & CO. KG
Reel/Frame 046584/0147 →
Priority Claims (1)
EP 17180502 · Jul 10, 2017 · regional
Continuity (1)
Related Publication 20190010073A1 · Jan 10, 2019
Cited By (1)
US 12,679,756