Test system
A test system is provided. The system includes a first test apparatus and a second test apparatus. A device power supply of the first test apparatus (ATE) is electrically connected with a device under test (DUT) through a driving branch (F) and a detecting branch (S), the driving branch (F) being configured to provide an original driving current to the DUT b the device power supply during testing, and the detecting branch (S) being configured to detect an effective driving current reaching the DUT. The second test apparatus includes a first voltage drop branch, the first voltage drop branch is connected to the detecting branch (S), and a voltage drop detected by the driving branch (F) is used to determine an effectiveness of an electrical connection formed between the driving branch and the device under test, and an electrical connection formed between the detecting branch (S) and the DUT.
1. A test system, comprising: a first test apparatus and a second test apparatus, wherein a device power supply of the first test apparatus is electrically connected with a device under test through a driving branch and a detecting branch, the driving branch being configured to provide an original driving current to the device under test by means of the device power supply during testing, and the detecting branch being configured to detect an effective driving current reaching the device under test; and the second test apparatus comprising a first voltage drop branch, the first voltage drop branch being connected to the detecting branch, and a voltage drop detected by the driving branch is used to determine an effectiveness of an electrical connection formed between the driving branch and the device under test, and an electrical connection formed between the detecting branch and the device under test.
2. The system according to claim 1 , wherein the device under test comprises a second voltage drop branch and the original driving current is negative, when the voltage drop detected by the driving branch is a voltage drop of the first voltage drop branch, it is determined that an effective electrical connection is formed between the detecting branch and the device under test.
3. The system according to claim 2 , wherein the first voltage drop branch comprises a first switching device and a second switching device, an anode of the first switching device is grounded, a cathode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
4. The system according to claim 1 , wherein the device under test comprises a second voltage drop branch and the original driving current is negative, when the voltage drop detected by the driving branch is a voltage drop of the second voltage drop branch in the device under test, it is determined that no effective electrical connection is formed between the detecting branch and the device under test.
5. The system according to claim 4 , wherein the first voltage drop branch comprises a first switching device and a second switching device, an anode of the first switching device is grounded, a cathode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
6. The system according to claims 5 , wherein the first voltage drop branch comprises a first switching device and a second switching device, a cathode of the first switching device is grounded, an anode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
7. The system according to claim 1 , wherein the device under test comprises a second voltage drop branch and the original driving current is negative, when the voltage drop detected by the driving branch is a clamping voltage of the first test apparatus, it is determined that no effective electrical connection is formed between the driving branch and the device under test.
8. The system according to claim 7 , wherein the first voltage drop branch comprises a first switching device and a second switching device, an anode of the first switching device is grounded, a cathode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
9. The system according to claims 8 , wherein the first voltage drop branch comprises a first switching device and a second switching device, a cathode of the first switching device is grounded, an anode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
10. The system according to claim 1 , wherein the device under test does not comprise a second voltage drop branch and the original driving current is negative, when the voltage drop detected by the driving branch is a clamping voltage of the first test apparatus, it is determined that no effective electrical connection is formed between the driving branch and the device under test, or no effective electrical connection is formed between the detecting branch and the device under test.
11. The system according to claim 10 , wherein the first voltage drop branch comprises a first switching device and a second switching device, an anode of the first switching device is grounded, a cathode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
12. The system according to claims 11 , wherein the first voltage drop branch comprises a first switching device and a second switching device, a cathode of the first switching device is grounded, an anode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
13. The system according to claim 1 , wherein the device under test comprises a second voltage drop branch and the original driving current is positive, when the voltage drop detected by the driving branch is a voltage drop of the first voltage drop branch, it is determined that an effective electrical connection is formed between the detecting branch and the device under test.
14. The system according to claims 13 , wherein the first voltage drop branch comprises a first switching device and a second switching device, a cathode of the first switching device is grounded, an anode of the first switching device is connected to one end of the second switching device, and an other end of the second switching device is connected to the detecting branch.
15. The system according to claim 1 , wherein the device under test comprises a second voltage drop branch and the original driving current is positive, when the voltage drop detected by the driving branch is a voltage drop of the second voltage drop branch in the device under test, it is determined that no effective electrical connection is formed between the detecting branch and the device under test.
16. The system according to claim 1 , wherein the device under test comprises a second voltage drop branch and the original driving current is positive, when the voltage drop detected by the driving branch is a clamping voltage of the first test apparatus, it is determined that no effective electrical connection is formed between the driving branch and the device under test.
17. The system according to claim 1 , wherein the device under test does not comprise a second voltage drop branch and the original driving current is positive, when the voltage drop detected by the driving branch is a clamping voltage of the first test apparatus, it is determined that no effective electrical connection is formed between the driving branch and the device under test, or no effective electrical connection is formed between the detecting branch and the device under test.
18. The system according to claim 1 , wherein the second test apparatus is provided on a loadBoard for building a function/performance test of a chip.