IP Library Granted Patent US 11,495,767
Granted Patent B2
US 11,495,767 · App. 17/130,403 · Granted Nov 8, 2022

Photoelectronic device, flat panel display using the same, and fabrication method of photoelectronic device

Inventors: Hideo Hosono (Tokyo, JP); Junghwan Kim (Tokyo, JP); Hideya Kumomi (Tokyo, JP)
Assignee: TOKYO INSTITUTE OF TECHNOLOGY
H01L51/5215H01L27/3244H01L51/442H01L51/5072H01L51/5092H01L51/5234H01L51/56H01L51/426H01L51/502H01L2251/305
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,495,767
App. No.
17/130,403
Granted
Nov 8, 2022
Kind
B2
Abstract

A photoelectronic device includes an active layer containing inorganic particles, and an oxide semiconductor layer containing zinc (Zn), silicon (Si), and oxygen (O), where the oxide semiconductor layer and the active layer are stacked layers. The photoelectronic device further includes a multilayer transparent electrode over or under the active layer, wherein the oxide semiconductor layer serves as a part of the multilayer transparent electrode.

Claims (46)

1. A photoelectronic device comprising:

an active layer containing inorganic particles;

and

an oxide semiconductor layer containing zinc (Zn), Silicon (Si) and oxygen (O), where the oxide semiconductor layer and the active layer are stacked layers,

wherein the photoelectronic device further comprises a multilayer transparent electrode provided over or under the active layer, wherein the oxide semiconductor layer serves as a part of the multilayer transparent electrode.

2. A photoelectronic device comprising:

an active layer containing inorganic particles;

and

an oxide semiconductor layer containing zinc (Zn), silicon (Si) and oxygen (O), where the oxide semiconductor layer and the active layer are stacked layers,

wherein an ohmic electrical contact is presented between the active layer and the oxide semiconductor layer, and

wherein a layer-averaged composition ratio Zn/(Si+Zn) of the oxide semiconductor layer is 0.7<Zn/(Si+Zn)<0.85.

3. The photoelectronic device as claimed in claim 1 , wherein a layer-averaged composition ratio Zn/(Si+Zn) of the oxide semiconductor layer is 0.7<Zn/(Si+Zn)<0.85.

4. The photoelectronic device as claimed in claim 2 , further comprising:

a transparent electrode provided over or under the active layer,

wherein the oxide semiconductor layer is an electron conducting layer provided between the active layer and the transparent electrode.

5. The photoelectronic device as claimed in claim 2 , further comprising:

a multilayer transparent electrode provided over or under the active layer,

wherein the oxide semiconductor layer is a part of the multilayer transparent electrode.

6. The photoelectronic device as claimed in claim 5 , wherein the multilayer transparent electrode has a second oxide semiconductor layer, a metal thin film, and a first oxide semiconductor layer stacked in this order, and

wherein the oxide semiconductor layer is the first oxide semiconductor layer and is in ohmic contact with the active layer.

7. The photoelectronic device as claimed in claim 1 , wherein the multilayer transparent electrode includes a second oxide semiconductor layer, a metal thin film, and a first oxide semiconductor layer stacked in this order, and

wherein the oxide semiconductor layer is the first oxide semiconductor layer and is in ohmic contact with the active layer.

8. The photoelectronic device as claimed in claim 1 , wherein the inorganic particles are quantum dots having a quantum confinement effect, or halogen compound particles.

9. The photoelectronic device as claimed in claim 2 , wherein the inorganic particles are quantum dots having a quantum confinement effect, or halogen compound particles.

10. The photoelectronic device as claimed in claim 1 , wherein the oxide semiconductor layer is a composite material layer in which ZnO crystal particles are dispersed in a Zn—Si—O matrix, or is an amorphous layer of Zn—Si—O.

11. The photoelectronic device as claimed in claim 2 , wherein the oxide semiconductor layer is a composite material layer in which ZnO crystal particles are dispersed in a Zn—Si—O matrix, or is an amorphous layer of Zn—Si—O.

12. The photoelectronic device as claimed in claim 1 , wherein the active layer is a light emitting layer, and the oxide semiconductor layer serves as one or both of an election injection layer and an electron transport layer.

13. The photoelectronic device as claimed in claim 2 , wherein the active layer is a light emitting layer, and the oxide semiconductor layer serves as one or both of an electron injection layer and an electron transport layer.

14. The photoelectronic device as claimed in claim 1 , wherein the active layer is a light receiving layer, and the oxide semiconductor layer serves as one or both of an electron extraction layer and an electron transport layer.

15. The photoelectronic device as claimed in claim 2 , wherein the active layer is a light receiving layer, and the oxide semiconductor layer serves as one or both of an electron extraction layer and an electron transport layer.

16. A flat panel display comprising:

a device array in which plurality of the photoelectronic devices as claimed in claim 12 are arranged in an array, and

a driver circuit configured to drive the device array.

17. A flat panel display comprising:

a device array in which plurality of the photoelectronic devices as claimed in claim 13 are arranged in an array, and

a driver circuit configured to drive the device array.

18. A fabrication method of a photoelectronic device, comprising:

forming an active layer by applying a solution in which a halogen compound or a quantum dot having a quantum confinement effect is dispersed onto an underlayer;

forming an oxide semiconductor layer containing zinc (Zn), silicon (Si) and oxygen (O) to provide stacked layers of the oxide semiconductor layer and the active layer; and

providing a multilayer transparent electrode over or under the active layer,

wherein the oxide semiconductor layer is formed as a part of the multilayer structure of the transparent electrode.

19. A fabrication method of a photoelectronic device, comprising:

forming an active layer by applying a solution in which a halogen compound or a quantum dot having a quantum confinement effect is dispersed onto an underlayer; and

forming an oxide semiconductor layer containing zinc (Zn), silicon (Si) and oxygen (O) to provide stacked layers of the active layer and the oxide semiconductor layer;

wherein the active layer and the oxide semiconductor layer are stacked such that an ohmic electric contact is presented therebetween, and

wherein a layer-averaged composition ratio Zn/(Si+Zn) of the oxide semiconductor layer is set within a range 0.7<Zn/(Si+Zn)<0.85.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2020
From: HOSONO, HIDEO; KIM, JUNGHWAN; KUMOMI, HIDEYA
To: TOKYO INSTITUTE OF TECHNOLOGY
Reel/Frame 054723/0030 →
Priority Claims (1)
JP JP2018-126332 · Jul 2, 2018 · national
Continuity (2)
Continuation PCTJP2019023604 · Jun 14, 2019
Related Publication 20210151710A1 · May 20, 2021
Cited By (1)
US 12,628,469