IP Library › Granted Patent US 11,500,004
Granted Patent B2
US 11,500,004 · App. 17/322,067 · Granted Nov 15, 2022

Test apparatus and test method

Inventors: Tomohiko Maruo (Kanagawa, JP); Hiroyuki Baba (Kanagawa, JP)
Assignee: ANRITSU CORPORATION
G01R29/105G01R29/0821H01Q15/16
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Quick Facts
Patent No.
US 11,500,004
App. No.
17/322,067
Granted
Nov 15, 2022
Kind
B2
Abstract

A test apparatus includes a test antenna that is provided in an OTA chamber 50 and transmits or receives a radio signal to or from an antenna 110 of a DUT 100 , and a measurement device that measures transmission characteristics or reception characteristics of the DUT 100 disposed in a quiet zone QZ, by using the test antenna. The test antenna includes a reflector reflection type test antenna 6 a that transmits or receives a radio signal to or from the antenna 110 of the DUT via a reflector 7 , and mirror reflection type test antennae 6 b, 6 c, 6 d, 6 e , and 6 f that transmits or receives a radio signal to or from the antenna 110 of the DUT via mirrors 9 b to 9 f.

Claims (86)

1. A test apparatus that measures transmission characteristics or reception characteristics of a device under test including an antenna under test, the apparatus comprising:

an anechoic box that has an internal space that is not influenced by a surrounding radio wave environment;

a test antenna that is provided in the internal space, and transmits or receives a radio signal to or from the antenna under test;

a reflector that is provided in the internal space and reflects the radio signal;

one or a plurality of mirrors that are provided in the internal space and reflect the radio signal; and

a measurement device that measures the transmission characteristics or the reception characteristics of the device under test disposed in a quiet zone in the internal space, by using the test antenna,

wherein the test antenna includes

a reflector reflection type test antenna that transmits or receives the radio signal to or from the antenna under test via the reflector, and

mirror reflection type test antennae that transmit or receive the radio signal to or from the antenna under test via at least one of the one or the plurality of mirrors.

2. The test apparatus according to claim 1 ,

wherein the plurality of the mirrors are provided, and

the plurality of mirrors that reflect the radio signal from the mirror reflection type test antenna are arranged to form different arrival angles with respect to a radio-wave arrival direction from the reflector reflection type test antenna at an arrangement position of the device under test.

3. The test apparatus according to claim 2 ,

wherein the plurality of the mirrors are provided, and

the plurality of mirrors are arranged so that each mirror surface of the plurality of mirrors intersects with a plane passing through the arrangement position of the device under test.

4. The test apparatus according to claim 3 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

5. The test apparatus according to claim 2 ,

wherein the one or the plurality of mirrors includes a first mirror, a second mirror, a third mirror, a fourth mirror, and a fifth mirror,

the mirror reflection type test antenna includes

a first test antenna that transmits and receives the radio signal via the first mirror,

a second test antenna that transmits and receives the radio signal via the second mirror,

a third test antenna that transmits and receives the radio signal via the third mirror,

a fourth test antenna that transmits and receives the radio signal via the fourth mirror, and

a fifth test antenna that transmits and receives the radio signal via the fifth mirror.

6. The test apparatus according to claim 2 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

7. The test apparatus according to claim 1 ,

wherein the plurality of the mirrors are provided, and

the plurality of mirrors are arranged so that each mirror surface of the plurality of mirrors intersects with a plane passing through an arrangement position of the device under test.

8. The test apparatus according to claim 1 ,

wherein the one or the plurality of mirrors include a first mirror, a second mirror, a third mirror, a fourth mirror, and a fifth mirror,

the mirror reflection type test antenna includes

a first test antenna that transmits and receives the radio signal via the first mirror,

a second test antenna that transmits and receives the radio signal via the second mirror,

a third test antenna that transmits and receives the radio signal via the third mirror,

a fourth test antenna that transmits and receives the radio signal via the fourth mirror, and

a fifth test antenna that transmits and receives the radio signal via the fifth mirror.

9. The test apparatus according to claim 1 ,

wherein the plurality of the mirrors are provided, and

the test apparatus further comprises a direction change unit that changes a radio-wave transmission direction of the mirror reflection type test antenna to be directed to one of the plurality of mirrors.

10. The test apparatus according to claim 7 ,

wherein the one or the plurality of mirrors include a first mirror, a second mirror, a third mirror, a fourth mirror, and a fifth mirror, and

the mirror reflection type test antenna includes a test antenna that transmits and receives the radio signal via one selected from the plurality of mirrors by the direction change unit.

11. The test apparatus according to claim 10 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

12. The test apparatus according to claim 9 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

13. The test apparatus according to claim 1 ,

wherein a distance from the mirror reflection type test antenna to the antenna under test via the corresponding mirror is more than 2D 2 /λ, where D indicates an antenna size of the antenna under test, and λ indicates a wavelength of a radio wave transmitted from the mirror reflection type test antenna.

14. The test apparatus according to claim 13 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

15. The test apparatus according to claim 14 ,

wherein the reflector reflection type test antenna

is disposed at a focal position of the reflector, and

converts a radio wave of a spherical wave emitted from the reflector reflection type test antenna to a radio wave of a plane wave and transmits the radio wave of the plane wave to the device under test, and

causes the radio wave of the plane wave, which is emitted from the device under test and then is incident to the reflector to focus on the test antenna.

16. The test apparatus according to claim 1 , further comprising:

direct type test antennae that directly transmit or receive the radio signal to or from the antenna under test.

17. The test apparatus according to claim 10 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

18. The test apparatus according to claim 1 ,

wherein the reflector has a reflecting surface bent in a curved surface, and

the mirror has a flat mirror surface.

19. The test apparatus according to claim 1 ,

wherein the reflector reflection type test antenna

is disposed at a focal position of the reflector, and

converts a radio wave of a spherical wave emitted from the reflector reflection type test antenna to a radio wave of a plane wave and transmits the radio wave of the plane wave to the device under test, and

causes the radio wave of the plane wave, which is emitted from the device under test and then is incident to the reflector to focus on the test antenna.

20. A test method using a test apparatus that measures transmission characteristics or reception characteristics of a device under test including an antenna under test, the test apparatus including

an anechoic box that has an internal space that is not influenced by a surrounding radio wave environment,

a test antenna that is provided in the internal space, and transmits or receives a radio signal to or from the antenna under test,

a reflector that is provided in the internal space and reflects the radio signal,

one or a plurality of mirrors that are provided in the internal space and reflect the radio signal, and

a measurement device that measures the transmission characteristics or the reception characteristics of the device under test disposed in a quiet zone in the internal space, by using the test antenna,

in which the test antenna includes a reflector reflection type test antenna that transmits or receives the radio signal to or from the antenna under test via the reflector, and mirror reflection type test antennae that transmit or receive the radio signal to or from the antenna under test via at least one of the one or the plurality of mirrors,

the method comprising:

a step of selecting a test antenna to be used among the test antennae;

a step of sequentially changing a posture of the device under test disposed in the quiet zone; and

a step of measuring the transmission characteristics or the reception characteristics of the device under test by using the selected test antenna, each time the posture of the device under test is changed.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2021
From: MARUO, TOMOHIKO; BABA, HIROYUKI
To: ANRITSU CORPORATION
Reel/Frame 056261/0899 →
Priority Claims (1)
JP JP2020-089365 · May 22, 2020 · national
Continuity (1)
Related Publication 20210364565A1 · Nov 25, 2021