IP Library › Granted Patent US 11,501,825
Granted Patent B2
US 11,501,825 · App. 17/349,106 · Granted Nov 15, 2022

Semiconductor memory device

Inventor: Mario Sako (Yokohama Kanagawa, JP)
G11C11/4091G11C5/06G11C11/4074G11C11/4076G11C11/4094G11C11/4096
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Quick Facts
Patent No.
US 11,501,825
App. No.
17/349,106
Granted
Nov 15, 2022
Kind
B2
Abstract

According to one embodiment, a semiconductor memory device includes a memory cell, a bit line, and a sense amplifier. The sense amplifier includes: a first node configured to be electrically coupled to the bit line; a first transistor in which a gate is coupled to the first node, and which is configured to be coupled to a second node; a second transistor configured to couple the second node and a third node; and a third transistor in which a gate is coupled to the third node, and which is configured to be coupled to the first node. The sense amplifier applies a second voltage obtained by amplifying a first voltage of the first node to the third node, and applies a third voltage obtained by amplifying the second voltage to the first node.

Claims (42)

1. A semiconductor memory device comprising:

a memory cell configured to store data;

a bit line electrically coupled to the memory cell; and

a sense amplifier electrically coupled to the bit line and including a first circuit and a latch circuit,

wherein

the first circuit includes:

a first node which is configured to be electrically coupled to the bit line;

a first transistor in which a gate is coupled to the first node, and which is configured to be coupled to a second node coupled to the latch circuit;

a second transistor configured to couple the second node and a third node; and

a third transistor in which a gate is coupled to the third node, and which is configured to be coupled to the first node, and

the sense amplifier senses a first voltage of the first node at a time when charge is transferred to the bit line in a read operation, applies a second voltage obtained by amplifying the first voltage to the third node, and applies third voltage obtained by amplifying the second voltage to the first node.

2. The device according to claim 1 , wherein the sense amplifier applies a fourth voltage obtained by amplifying the third voltage to the second node.

3. The device according to claim 1 , wherein the sense amplifier applies a fourth voltage obtained by amplifying the third voltage to the third node, and applies a fifth voltage obtained by amplifying the fourth voltage to the first node.

4. The device according to claim 1 , wherein while applying a fourth voltage obtained by amplifying the third voltage to the third node, the sense amplifier applies a fifth voltage obtained by amplifying the fourth voltage to the first node.

5. The device according to claim 3 , wherein the sense amplifier applies a sixth voltage obtained by amplifying the fifth voltage to the second node.

6. The device according to claim 1 , wherein

the first circuit further includes a fourth transistor configured to couple the first transistor and the second node, and

the second and fourth transistors are turned on when the second voltage is applied to the third node.

7. The device according to claim 1 , wherein

the first circuit further includes a fifth transistor configured to couple the third transistor and the first node, and

the fifth transistor is turned on when the third voltage is applied to the first node.

8. A semiconductor memory device comprising:

a memory cell configured to store data;

a bit line electrically coupled to the memory cell;

a sense amplifier electrically coupled to the bit line and including a first circuit and a latch circuit,

wherein

the first circuit includes:

a first node which is configured to be electrically coupled to the bit line;

a first transistor in which a gate is coupled to the first node, and which is configured to be coupled to a second node coupled to the latch circuit;

a second transistor configured to couple the second node and the first transistor; and

a third transistor in which a gate is coupled to the second node, and which is configured to be coupled to the first node, and

the sense amplifier senses a first voltage of the first node at a time when charge is transferred to the bit line in a read operation, applies a second voltage obtained by amplifying the first voltage to the second node, and applies a third voltage obtained by amplifying the second voltage to the first node.

9. The device according to claim 8 , wherein the sense amplifier applies a fourth voltage obtained by amplifying the third voltage to the second node.

10. The device according to claim 8 , wherein the sense amplifier applies a fourth voltage obtained by amplifying the third voltage to the second node, and applies a fifth voltage obtained by amplifying the fourth voltage to the first node.

11. The device according to claim 8 , wherein while applying a fourth voltage obtained by amplifying the third voltage to the second node, the sense amplifier applies a fifth voltage obtained by amplifying the fourth voltage to the first node.

12. The device according to claim 10 , wherein the sense amplifier applies a sixth voltage obtained by amplifying the fifth voltage to the second node.

13. The device according to claim 8 , wherein

the first circuit further includes a fourth transistor configured to couple the first transistor and the second transistor, and

the second and fourth transistors are turned on when the second voltage is applied to the second node.

14. The device according to claim 8 , wherein

the first circuit further includes a fifth transistor configured to couple the third transistor and the first node, and

the fifth transistor is turned on when the third voltage is applied to the first node.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2021
From: SAKO, MARIO
To: KIOXIA CORPORATION
Reel/Frame 057661/0502 →
Priority Claims (1)
JP JP2021-013139 · Jan 29, 2021 · national
Continuity (1)
Related Publication 20220246197A1 · Aug 4, 2022
Cited By (2)
US 12,361,984 US 12,573,460