EUV photo masks and manufacturing method thereof
A reflective mask includes a substrate, a reflective multilayer disposed over the substrate, a capping layer disposed over the reflective multilayer, an intermediate layer disposed over the capping layer, an absorber layer disposed over the intermediate layer, and a cover layer disposed over the absorber layer. The intermediate layer includes a material having a lower hydrogen diffusivity than a material of the capping layer.
1. A reflective mask, comprising:
a substrate;
a reflective multilayer disposed on the substrate;
a capping layer disposed over the reflective multilayer;
an intermediate layer disposed over the capping layer;
an absorber layer disposed over the intermediate layer; and
a cover layer disposed over the absorber layer,
wherein the intermediate layer includes a material having a lower hydrogen diffusivity than a material of the capping layer.
2. The reflective mask of claim 1 , wherein the intermediate layer includes tantalum oxide.
3. The reflective mask of claim 1 , wherein a thickness of the intermediate layer is in a range from 0.5 nm to 3 nm.
4. The reflective mask of claim 1 , wherein the cover layer is made of a same material as the intermediate layer.
5. The reflective mask of claim 4 , wherein the intermediate layer and the cover layer includes tantalum oxide.
6. The reflective mask of claim 1 , further comprising an opening pattern formed in the cover layer and the absorber layer,
wherein the intermediate layer is exposed at a bottom of the opening pattern.
7. The reflective mask of claim 1 , wherein:
the reflective multilayer include Si layers and Mo layers alternately stacked, and a Si layer of the reflective multilayer is in contact with the capping layer.
8. The reflective mask of claim 1 , wherein:
the reflective multilayer include Si layers and Mo layers alternately stacked, and
a Mo layer of the reflective multilayer is in contact with the capping layer.
9. A method of manufacturing a reflective mask, the method comprising:
forming a photo resist layer over a mask blank, the mask blank including a substrate, a reflective multilayer on the substrate, a capping layer on the reflective multilayer, an intermediate layer on the capping layer, an absorber layer on the intermediate layer, a cover layer on the absorber layer and a hard mask layer on the cover layer;
patterning the photo resist layer;
patterning the hard mask layer by using the patterned photo resist layer;
patterning the cover layer and the absorber layer by using the patterned hard mask layer to form an opening; and
removing the hard mask layer,
wherein a part of the intermediate layer is exposed in the opening after the hard mask layer is removed.
10. The method of claim 9 , wherein the cover layer is made of a same material as the intermediate layer.
11. The method of claim 10 , wherein the intermediate layer and the cover layer includes tantalum oxide.
12. The method of claim 11 , wherein the hard mask layer includes CrO or CrON.
13. The method of claim 12 , wherein the absorber layer is made of TaBN.
14. The method of claim 13 , wherein the capping layer is made of Ru.
15. The method of claim 9 , wherein a thickness of the intermediate layer is in a range from 0.5 nm to 3 nm.
16. A method of manufacturing a reflective mask, the method comprising:
forming a photo resist layer over a mask blank, the mask blank including a substrate, a reflective multilayer disposed over the substrate, a capping layer disposed over the reflective multilayer, an intermediate layer disposed over the capping layer, an absorber layer disposed over the intermediate layer, a cover layer disposed over the absorber layer and a hard mask layer disposed over the cover layer;
patterning the photo resist layer;
patterning the hard mask layer by using the patterned photo resist layer as a mask;
patterning the cover layer and the absorber layer by using the patterned hard mask layer as a mask to form an opening; and
removing the hard mask layer, wherein:
the reflective multilayer includes Si layers and Mo layers alternately stacked, and
an uppermost Si layer of the reflective multilayer is separated from the capping layer.
17. The method of claim 16 , wherein a part of the intermediate layer is exposed in the opening after the hard mask layer is removed.
18. The method of claim 16 , wherein at least one of the intermediate layer and the cover layer includes tantalum oxide.
19. The method of claim 16 , wherein a silicon compound layer is inserted between the reflective multilayer and the capping layer.
20. The method of claim 19 , wherein the silicon compound layer includes one or more of SiON or SiN.