Solid-state imaging element, method of driving solid-state imaging element, and electronic apparatus
Provided is a solid-state imaging element configured to automatically extend dynamic range for each unit pixel. A solid-state imaging element includes, for a unit pixel, a first photoelectric conversion element, a first accumulation portion that accumulates electric charge obtained by photoelectric conversion by the first photoelectric conversion element, and a first film that is electrically connected to the first accumulation portion and has an optical characteristic changing according to applied voltage. Furthermore, the unit pixel of the solid-state imaging element can further include a first transfer transistor that transfers electric charge obtained by photoelectric conversion by the photoelectric conversion element to the first accumulation portion, an amplification transistor that is electrically connected to the first accumulation portion, and a selection transistor that is electrically connected to the amplification transistor.
1. A solid-state imaging element, comprising:
a plurality of pixels, wherein a unit pixel of the plurality of pixels includes:
a first photoelectric conversion element;
a first accumulation portion configured to accumulate an electric charge obtained based on photoelectric conversion by the first photoelectric conversion element;
a first reset transistor configured to reset the electric charge accumulated in the first accumulation portion;
a first film that is electrically connected to the first accumulation portion, wherein the first film has an optical characteristic that changes based on application of voltage; and
a selection transistor configured to electrically connect to the first film and an operational amplifier, wherein the first accumulation portion, the first reset transistor, and the operational amplifier are connected in parallel.
2. The solid-state imaging element according to claim 1 , wherein the unit pixel further includes:
a first transfer transistor configured to transfer the electric charge, obtained based on photoelectric conversion by the first photoelectric conversion element, to the first accumulation portion;
an amplification transistor configured to electrically connect to the first accumulation portion; and
the selection transistor configured to electrically connect to the amplification transistor.
3. The solid-state imaging element according to claim 1 , wherein the unit pixel further includes
a second accumulation portion configured to accumulate electric charge obtained based on photoelectric conversion by a second photoelectric conversion element; and
a capacitance connection transistor configured to electrically connect the first accumulation portion and the second accumulation portion.
4. The solid-state imaging element according to claim 3 , wherein the unit pixel further includes an overflow gate configured to electrically connect the first photoelectric conversion element and the second accumulation portion.
5. The solid-state imaging element according to claim 1 , wherein the first photoelectric conversion element and the first accumulation portion are directly connected.
6. The solid-state imaging element according to claim 1 , wherein the first film is on an optical path of light incident on the first photoelectric conversion element and has a light transmittance that changes based on an amount of electric charge accumulated in the first accumulation portion.
7. The solid-state imaging element according to claim 1 , further comprising:
a second photoelectric conversion element; and
a second accumulation portion configured to accumulate an electric charge obtained based on photoelectric conversion by the second photoelectric conversion element, wherein the first film is on a first optical path of first light incident on the second photoelectric conversion element.
8. The solid-state imaging element according to claim 7 , wherein the unit pixel further includes a second transfer transistor configured to transfer electric charge obtained based on photoelectric conversion by the second photoelectric conversion element to the second accumulation portion.
9. The solid-state imaging element according to claim 7 , wherein the unit pixel further includes a second reset transistor configured to reset the electric charge accumulated in the second accumulation portion.
10. The solid-state imaging element according to claim 7 , further comprising:
a second film on a second optical path of second light incident on the second photoelectric conversion element, and
the second film has an optical characteristic different from the optical characteristic of the first film.
11. The solid-state imaging element according to claim 1 , wherein the first accumulation portion is further configured to accumulate overflow charge overflowing from the first photoelectric conversion element.
12. The solid-state imaging element according to claim 1 , wherein the first accumulation portion is further configured to discharge the accumulated electric charge when the first photoelectric conversion element is reset.
13. The solid-state imaging element according to claim 7 , wherein the first film is on the first optical path through which the first light is incident on the second photoelectric conversion element and has a light transmittance that changes based on an amount of the electric charge accumulated in the first accumulation portion.
14. The solid-state imaging element according to claim 7 , wherein a sensitivity of the first photoelectric conversion element is different from a sensitivity of the second photoelectric conversion element.
15. The solid-state imaging element according to claim 7 , further comprising:
a first color filter on a second optical path of second light incident on the first photoelectric conversion element; and
a second color filter on the first optical path of the first light incident on the second photoelectric conversion element, wherein the first color filter is different from the second color filter.
16. The solid-state imaging element according to claim 1 , wherein no color filter is on an optical path of light incident on the first photoelectric conversion element.
17. A solid-state imaging element, comprising:
a plurality of pixels, wherein a unit pixel of the plurality of pixels includes:
in order of incidence of light:
a first electrode;
an electrochromic film configured to change an optical characteristic based on application of a voltage;
a second electrode, wherein
a first voltage is applied between the first electrode and the second electrode by an external power supply, and
the first voltage is applied to the electrochromic film from the second electrode to change a light transmittance of the electrochromic film;
a first photoelectric conversion element;
a first accumulation portion configured to accumulate electric charge obtained based on photoelectric conversion by the first photoelectric conversion element;
a second photoelectric conversion element; and
a second accumulation portion configured to accumulate electric charge obtained based on photoelectric conversion by the second photoelectric conversion element, wherein
the electrochromic film is on an optical path of light incident on the second photoelectric conversion element, and
the first accumulation portion is connected to the second electrode.
18. The solid-state imaging element according to claim 17 , wherein a sensitivity of the first photoelectric conversion element is different from a sensitivity of the second photoelectric conversion element.
19. The solid-state imaging element according to claim 17 , wherein
a second voltage is applied to the second electrode, and
the second voltage is changed to switch modes.
20. The solid-state imaging element according to claim 17 , wherein
a second voltage is applied between the first electrode and the second electrode by a booster circuit, and
the second voltage is applied to the electrochromic film from the second electrode to change a light transmittance of the electrochromic film.
21. A method of driving a solid-state imaging element, comprising:
accumulating an electric charge based on photoelectric conversion by a first photoelectric conversion element, in an accumulation portion, wherein
a first film is electrically connected to the accumulation portion,
a selection transistor is electrically connected to the first film and an operational amplifier, and
the first film has an optical characteristic that changes based on application of voltage;
controlling the accumulation portion to hold the accumulated electric charge during an exposure period; and
resetting, by a reset transistor, the electric charge accumulated in the accumulation portion, wherein the accumulation portion, the reset transistor, and the operational amplifier are connected in parallel.
22. An electronic apparatus, comprising:
a solid-state imaging element, wherein
the solid-state imaging element includes a plurality of pixels, and
a unit pixel of the plurality of pixels includes:
a photoelectric conversion element;
an accumulation portion configured to accumulate an electric charge obtained based on photoelectric conversion of the photoelectric conversion element;
a reset transistor configured to reset the electric charge accumulated in the accumulation portion;
a film that is electrically connected to the accumulation portion, wherein the film has an optical characteristic that changes based on application of voltage; and
a selection transistor configured to electrically connect to the film and an operational amplifier, wherein the accumulation portion, the reset transistor, and the operational amplifier are connected in parallel.