Measuring device and method

1. A measuring device comprising:

a disc-shaped base substrate;

a plurality of sensor electrodes disposed at the base substrate;

a. temperature sensor disposed at the base substrate;

a high frequency oscillator configured to apply a high frequency signal to the sensor electrodes;

a plurality of C/V conversion circuits configured to generate a plurality of voltage signals respectively corresponding to a plurality of electrostatic capacitances of the sensor electrodes;

an A/D converter configured to convert the voltage signals outputted from the C/V conversion circuits to a plurality of digital values;

a processor;

a storage which stores a program that is read out and executed by the processor to calculate a plurality of measurement values indicating the electrostatic capacitances of the sensor electrodes, based on the digital values outputted from the A/D converter; and

a plurality of phase control circuits connected between the sensor electrodes and the high-frequency oscillator,

wherein each of the C/V conversion circuits includes an amplification circuit having an operational amplifier,

the high-frequency oscillator is connected to a non-inverting input terminal of the operational amplifier to input the high-frequency signal to the non-inverting input terminal, and is connected to an inverting input terminal of the operational amplifier through a corresponding phase control circuit among the plurality of phase control circuits, and

the storage stores a plurality of parameters for setting admittances of the phase control circuits in association with a plurality of temperatures in order to adjust reference points of the voltage signals outputted from the C/V conversion circuits at the respective temperatures, and adjusts the admittances of the phase control circuits using a parameter associated with a temperature detected by the temperature sensor among the plurality of parameters.

2. The measuring device of claim 1 , wherein the reference point adjustment is zero point adjustment.

3. The measuring device of claim 1 , wherein the storage stores a plurality of constant groups, each including a plurality of constants associated with a plurality of temperatures, in order to suppress temperature dependence of the measurement values calculated from the digital values using a plurality of functions, and calculates the measurement values based on the functions using constants obtained from the constant groups depending on the temperature detected by the temperature sensor.

4. The measuring device of claim 2 , wherein the storage stores a plurality of constant groups, each including a plurality of constants associated with a plurality of temperatures, in order to suppress temperature dependence of the measurement values calculated from the digital values using a plurality of functions, and calculates the measurement values based on the functions using constants obtained from the constant groups depending on the temperature detected by the temperature sensor.

5. A method for measuring electrostatic capacitances between a measuring device and a target object,

wherein the measuring device includes:

a disc-shaped base substrate;

a plurality of sensor electrodes disposed at the base substrate;

a temperature sensor disposed at the base substrate;

a high frequency oscillator configured to apply a high frequency signal to the sensor electrodes;

a plurality of C/V conversion circuits configured to generate a plurality of voltage signals respectively corresponding to a plurality of electrostatic capacitances of the sensor electrodes;

an A/D converter configured to convert the voltage signals outputted from the C/V conversion circuits to a plurality of digital values;

a processor;

a storage which stores a program that is read out and executed by the processor to calculate a plurality of measurement values indicating the electrostatic capacitances of the sensor electrodes, based on the digital values outputted from the A/D converter; and

a plurality of phase control circuits connected between the sensor electrodes and the high-frequency oscillator,

wherein each of the C/V conversion circuits includes an amplification circuit having an operational amplifier, and

the high-frequency oscillator is connected to a non-inverting input terminal of the operational amplifier to input the high-frequency signal to the non-inverting input terminal, and is connected to an inverting input terminal of the operational amplifier through a corresponding phase control circuit among the plurality of phase control circuits,

the method comprising:

adjusting admittances of the phase control circuits using a parameter associated with a temperature detected by the temperature sensor, among a plurality of parameters that are pre-stored in association with a plurality of temperatures to set the admittances of the phase control circuits;

generating, by the C/V conversion circuits, the voltage signals in a state where the admittances are adjusted;

converting, by the A/D converter, the voltage signals outputted from the C/V conversion circuits into the digital values; and

calculating the measurement values based on the digital values.

6. The method of claim 5 , wherein the sensors are disposed at an edge of the base substrate, and

the target object is a focus ring surrounding the base substrate.

7. The method of claim 5 , wherein the sensors are disposed on a bottom surface of the base substrate, and

the target object is an electrostatic chuck on which the base substrate is mounted.

8. The method of claim 5 , wherein the adjusting, the generating, and the converting are performed under a dehumidified vacuum environment.

9. The method of claim 6 , wherein the adjusting, the generating, and the converting are performed under a dehumidified vacuum environment.

10. The method of claim 7 , wherein the adjusting, the generating, and the converting are performed under a dehumidified vacuum environment.

11. The method of claim 8 , further comprising, before the adjusting, storing the measuring device under a dehumidified environment.

12. The method of claim 9 , further comprising, before the adjusting, storing the measuring device under a dehumidified environment.

13. The method of claim 10 , further comprising, before the adjusting, storing the measuring device under a dehumidified environment.

14. The method of claim 11 , wherein after the storing, the adjusting is performed in a state where the measuring device that has been stored in the dehumidified environment is transferred to a dehumidified vacuum environment.

15. The method of claim 12 , wherein after the storing, the adjusting is performed in a state where the measuring device that has been stored in the dehumidified environment is transferred to a dehumidified vacuum environment.

16. The method of claim 13 , wherein after the storing, the adjusting is performed in a state where the measuring device that has been stored in the dehumidified environment is transferred to a dehumidified vacuum environment.

17. The method of claim 11 , wherein in the storing, the measuring device is stored in the dehumidified environment until shortly before the adjusting is started.

18. The method of claim 12 , wherein in the storing, the measuring device is stored in the dehumidified environment until shortly before the adjusting is started.

19. The method of claim 13 , wherein in the storing, the measuring device is stored in the dehumidified environment until shortly before the adjusting is started.