Digital ring oscillator for monitoring aging of silicon devices
Methods and devices for determining integrated circuit (IC) device degradation over time are provided. Transistors are the basic building blocks of IC devices. The degradation of the transistors in IC devices over time leads slowly to decreased switching speeds. To monitor the condition of an IC device as it ages, oscillator circuitry operating at switching frequencies of various circuits in the IC device may be included and monitored for changes in switching frequency over time. A degraded condition of the IC device may be determined when the change in switching frequency exceeds a threshold value.
1. An integrated circuit (IC) device, comprising:
ring oscillator circuitry comprising:
a ring oscillator having an odd number of series-connected inverting stages fabricated as part of the IC device, the ring oscillator configured to generate an oscillation frequency equal to a switching frequency of the IC device;
control circuitry configured to receive an instruction for causing the ring oscillator to generate the oscillation frequency whenever a processor of the IC device is running; and
sensor circuitry configured to measure the oscillation frequency,
wherein a decrease in the measured oscillation frequency as the IC device ages indicates degradation of components in the IC device,
wherein the ring oscillator circuitry comprises a set of ring oscillators including the ring oscillator,
wherein the ring oscillators in the set of ring oscillators are fabricated to operate at different threshold voltages corresponding to threshold voltages of different portions of circuitry in the IC device, and
wherein the measured oscillation frequency is output to external circuitry configured to determine changes in the oscillation frequency over time.
2. The IC device of claim 1 , wherein the set of ring oscillators includes a ring oscillator having an odd-numbered combination of NAND gates, NOR gates, and inverter gates.
3. A non-transitory computer readable medium having stored therein instructions that, when executed by an integrated circuit (IC) device, cause the IC device to execute operations including:
generating, by an oscillator circuit, an oscillation frequency equal to a switching frequency of the IC device whenever a processor of the IC device is running;
measuring, by sensor circuitry, the oscillation frequency;
comparing the measured oscillation frequency to a threshold value; and
in response to determining that a decrease in the measured oscillation frequency exceeds the threshold value, determining that the IC device has reduced functionality,
wherein the decrease in the measured oscillation frequency as the IC device ages indicates degradation of components in the IC device.
4. The non-transitory computer readable medium of claim 3 , wherein the switching frequency of the IC device is equal to a switching frequency of a processor of the IC device.
5. The non-transitory computer readable medium of claim 3 , wherein the switching frequency of the IC device is a sub-multiple of a clock frequency of the IC device.
6. The non-transitory computer readable medium of claim 3 , wherein the switching frequency of the IC device is a switching frequency of a specified circuit in the IC device.
7. The non-transitory computer readable medium of claim 3 , wherein the oscillator circuit comprises multiple oscillator circuits, individual ones of the multiple oscillator circuits corresponding to specified portions of circuitry of the IC device, and
the instructions further comprise instructions for causing the individual ones of the multiple oscillator circuits to be activated when the corresponding portions of the circuitry of the IC device are activated,
wherein each of individual ones of the multiple oscillator circuits operates at a same switching frequency as the corresponding portions of the circuitry of the IC device.
8. The non-transitory computer readable medium of claim 3 , further comprising instructions for causing the oscillator circuit to generate the oscillation frequency when a specified circuit of the IC device is activated.
9. The non-transitory computer readable medium of claim 3 , further comprising instructions for outputting the measured oscillation frequency to external circuitry, wherein the external circuitry is configured to determine changes in the oscillation frequency over time.
10. A method, comprising:
operating digital ring oscillator (DRO) circuitry to oscillate at a frequency related to an switching frequency of an integrated circuit (IC) device;
measuring the oscillation frequency;
outputting the measured oscillation frequency;
receiving, at a measurement device configured to communicate with the IC device, the measured oscillation frequency; and
determining, by the measurement device, a difference in the measured oscillation frequency received at a first time and a second time, wherein a decrease in the measured oscillation frequency as the IC device ages indicates degradation of components in the IC device.
11. The method of claim 10 , further comprising:
comparing, by the measurement device, the measured oscillation frequency to a threshold value,
wherein a decrease in the measured oscillation frequency over time exceeding the threshold value indicates that the IC device has reduced functionality.
12. The method of claim 10 , wherein operating the DRO circuitry comprises operating a set of DROs.
13. The method of claim 12 , wherein the set of DROs includes a ring oscillator having an odd-numbered combination of NAND gates, NOR gates, and inverter gates.
14. The method of claim 10 , further comprising:
receiving, by control circuitry of the IC device, an instruction for causing the DRO circuitry to generate the oscillation frequency.
15. The method of claim 10 , further comprising:
generating, by the DRO, the oscillation frequency when a processor of the IC device is running.
16. The method of claim 10 , wherein the oscillation frequency is equal to the switching frequency of the integrated circuit device.