IP Library › Granted Patent US 11,536,607
Granted Patent B2
US 11,536,607 · App. 16/914,256 · Granted Dec 27, 2022

Image sensor and method of operating

Inventors: Radwanul Hasan Siddique (Pasadena, CA); Daniel Assumpcao (Issaquah, WA); Hyuck Choo (Yongin-Si, KR); Hyochul Kim (Yongin-si, KR)
Assignee: Samsung Electronics Co., Ltd.
G01J3/2823G01J3/0208G01J3/0229G01J3/18G01J3/4412
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Quick Facts
Patent No.
US 11,536,607
App. No.
16/914,256
Granted
Dec 27, 2022
Kind
B2
Abstract

Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm 2 , allowing it to fit on mobile devices.

Claims (65)

1. An image sensor, comprising:

an aperture;

a dispersion array;

a lens;

an image sensor; and

a processor,

wherein, the dispersion array further comprises a dispersion structure including a scattering layer and a dispersion layer, wherein the scattering layer includes a row of nanostructures for scattering light of a first wavelength range, and the dispersion layer is configured to disperse light of a second wavelength range,

wherein at least two dispersion structures comprise a defect layer, and wherein the defect layers of the at least two dispersion structures have differing thicknesses from each other.

2. The image sensor of claim 1 , wherein the at least two dispersion structures disperse different wavelength ranges from each other.

3. The image sensor of claim 1 , wherein the at least two dispersion structures scatter light in one direction but allow light to substantially pass through without scattering in a second direction.

4. An image sensor, comprising:

an aperture;

a dispersion array;

a lens;

an image sensor; and

a processor,

wherein the dispersion array further comprises one or more dispersion structures, the dispersion structure capable of scattering light of a first wavelength range and dispersing light of a second wavelength range,

wherein at least two dispersion structures comprise a defect layer, and wherein the defect layers of the at least two dispersion structures have differing thicknesses from each other, and

wherein the at least two dispersion structures comprise rows of nanostructures that are positioned at different angles from each other.

5. An image sensor, comprising:

an aperture;

a dispersion array;

a lens;

an image sensor; and

a processor,

wherein the dispersion array further comprises one or more dispersion structures, the dispersion structure capable of scattering light of a first wavelength range and dispersing light of a second wavelength range,

wherein at least two dispersion structures comprise a defect layer, and wherein

the defect layers of the at least two dispersion structures have differing thicknesses from each other, and

wherein the at least two dispersion structures comprise rows of nanostructures positioned at same angles to each other.

6. The image sensor of claim 1 , wherein the image sensor reads spectral data from wavelengths dispersed by the dispersion array.

7. The image sensor of claim 6 , wherein the processor is configured to reconstruct spectrum from the spectral data.

8. The image sensor of claim 1 , wherein the image sensor is subdivided to read image data from a first set of pixels and spectral data from a second set of pixels.

9. An image sensor, comprising:

an aperture;

a dispersion array;

a lens;

an image sensor; and

a processor,

wherein the image sensor is subdivided to read image data from a first set of pixels and spectral data from a second set of pixels,

wherein the first set of pixels comprises a circle, and the second set of pixels comprises an annulus coaxial with the circle of the first set of pixels.

10. The image sensor of claim 8 , wherein the processor is configured to reconstruct an image from the image data or reconstruct spectrum from the spectral data.

11. An image sensor, comprising:

an aperture;

a dispersion array;

a lens;

an image sensor; and

a processor,

wherein the dispersion array further comprises a dispersion structure including a scattering layer and a dispersion layer, wherein the scattering layer includes a first row of nanostructures and a second row of nanostructures, wherein at least a portion of the first row of nanostructures is distributed according to a first pattern, and at least a portion of the second row of nanostructures is distributed according to a second pattern different from the first pattern, wherein the first pattern and the second pattern are for providing a constant scattering and dispersion angle range for an incident light input over a range of incident light input angle ranges.

12. The image sensor of claim 1 , wherein an incident light input angle range is between 0 and +/−15 degrees.

13. The image sensor of claim 1 , wherein the scattering and dispersion angle range is between 0 and +/−15 degrees for a first wavelength range and 0 and +/−30 degrees for a second wavelength range.

14. The image sensor of claim 1 , wherein the lens is a metalens.

15. The image sensor of claim 1 , wherein the aperture, dispersion array, and lens are integrated together.

16. A method to obtain spectral data from a sensor, the method comprising:

receiving incident light;

scattering incident light of a first wavelength range through a scattering layer of a dispersion structure of a dispersion array, the scattering layer having a row of nanostructures that are positioned at different angles from each other that are configured to create scattered light of the first wavelength range;

dispersing a subset of the scattered light of a second wavelength range through a dispersion layer of the dispersion structure, the dispersion layer configured to create dispersed light;

receiving the dispersed light on an image sensor; and

reconstructing spectral data from the dispersed light.

17. The method of claim 16 , wherein the incident light comprises light from the visible and near infra-red (NIR) spectrum.

18. The method of claim 16 , further comprising:

receiving the scattered light on an image sensor; and

reconstructing an image from the scattered light.

19. The method of claim 17 , wherein the spectral data is reconstructed from dispersed light from the NIR spectrum.

20. The method of claim 16 , wherein a subset of the scattered light is dispersed by a Distributed Bragg filter.

21. The method of claim 16 , wherein image and spectral data are reconstructed concurrently.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2020
From: SIDDIQUE, RADWANUL HASAN; ASSUMPCAO, DANIEL; CHOO, HYUCK; KIM, HYOCHUL
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 054489/0233 →
Continuity (2)
Provisional Application 62962926 · Jan 17, 2020
Related Publication 20210223104A1 · Jul 22, 2021