IP Library Granted Patent US 11,543,421
Granted Patent B2
US 11,543,421 · App. 16/647,117 · Granted Jan 3, 2023

Specimen processing system

Inventors: Shunsuke Baba (Tokyo, JP); Kuniaki Onizawa (Tokyo, JP)
Assignee: HITACHI HIGH-TECH CORPORATION
G01N35/00613G01J5/00G01M99/005G01N21/59G01N33/49G01N33/493G01N35/00722G01J5/48G01J2005/0077
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Quick Facts
Patent No.
US 11,543,421
App. No.
16/647,117
Granted
Jan 3, 2023
Kind
B2
Abstract

A specimen processing system 100 which performs preprocessing and analysis of a specimen includes sensors 5 a, 5 b , . . . each detecting a driving state of a driving device installed in the system, an abnormality detecting part 3 a determining from signal waveforms detected by the sensors 5 a, 5 b , . . . whether an abnormality occurs in the driving device, and a recording device sequentially recording the signal waveforms detected by the sensors 5 a, 5 b , . . . and storing a sensor signal waveform before or after the occurrence of an operation abnormality into an unerasable area when the abnormality is determined to have occurred in the abnormality detection part 3 a . Consequently, there is provided a specimen processing system capable of realizing restoration from the time of the occurrence of an abnormality faster than in the past.

Claims (23)

1. A specimen processing system, including a specimen processing device, which is configured to perform preprocessing and analysis of a specimen, comprising:

sensors each configured to detect a driving state of a driving device installed in the system; and

an abnormality detecting part configured to determine from signal waveforms detected by the sensors whether an abnormality occurs in the driving device,

wherein the specimen processing system includes a recording device which is configured to sequentially record the signal waveforms detected by the sensors, and configured to store a sensor signal waveform before or after the occurrence of an operation abnormality when the abnormality is determined to have occurred in the abnormality detecting part,

wherein the sensors include a specimen position acquiring device which is configured to acquire specimen information in the specimen processing system,

wherein the recording device is configured to sequentially record the specimen information acquired in the specimen position acquiring device, and configured to store specimen information before or after the occurrence of an operation abnormality when the abnormality is determined to have occurred in the abnormality detecting part, and

wherein the recording device is configured to store the specimen information into an unerasable area, and the specimen position acquiring device is configured to detect, together with the sensors, a driving state of the specimen processing device.

2. The specimen processing system according to claim 1 ,

wherein the sensor includes an imaging device which is configured to image a prescribed location in the specimen processing system, and

wherein the recording device is configured to sequentially record images captured by the imaging device, and is configured to store an image before or after the occurrence of an operation abnormality into an unerasable area when the abnormality is determined to have occurred in the abnormality detecting part.

3. The specimen processing system according to claim 2 , wherein the imaging device is a camera which is configured to image the manner of transfer of a specimen container storing a specimen therein, and the driving state of the driving device.

4. The specimen processing system according to claim 1 , further including a communication part which is configured to output sensor signal waveform information before or after the occurrence of the operation abnormality to the side of a maintenance person who maintains the specimen processing system when the abnormality is determined to have occurred in the abnormality detecting part.

5. The specimen processing system according to claim 1 ,

wherein the specimen processing system has a plurality of processing units, and

wherein the plural processing units are respectively provided with the recording device independently of each other.

6. The specimen processing system according to claim 1 ,

wherein the specimen processing system has a plurality of processing units, and

wherein the recording device is configured to integrate and sequentially record sensor signal waveforms of the plural processing units.

7. The specimen processing system according to claim 1 , wherein the recording device is comprised of a first recording unit which is configured to sequentially record signal waveforms, and a second recording unit provided separately from the first recording unit, the second recording unit is configured to store a sensor signal waveform before or after the occurrence of an operation abnormality.

8. The specimen processing system according to claim 1 , wherein when a recording capacity of the recording device is full, the recording device is configured to erase a sensor signal waveform other than the sensor signal waveform before or after the occurrence of the operation abnormality, which is stored when the abnormality is determined to have occurred.

9. The specimen processing system according to claim 1 , further including an AD converter which is configured to convert the signal waveform from analog to digital,

wherein the recording device is configured to record and stores a signal waveform after being converted to digital by the AD converter.

10. The specimen processing system according to claim 1 , wherein the specimen position acquiring device is at least any one or more of a thermography camera which is configured to image a specimen container storing a specimen, and an RFID reader which is configured to acquire information of an RFID tag attached to the specimen container.

Assignments (2)
CHANGE OF NAME Recorded Sep 13, 2022
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 061424/0579 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 13, 2020
From: BABA, SHUNSUKE; ONIZAWA, KUNIAKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 052106/0137 →
Priority Claims (1)
JP JP2018-004998 · Jan 16, 2018 · national
Continuity (1)
Related Publication 20210018524A1 · Jan 21, 2021