Charged particle beam device
The invention provides a charged particle beam device that can accurately move a convergence point of a charged particle beam to a surface of a sample and facilitates a user to grasp a positional relation between the surface of the sample and the convergence point of the charged particle beam. The charged particle beam device according to the invention includes: an electron optics system configured to irradiate a sample table with a charged particle beam; a movable stage on which the sample table is to be placed; a sample chamber that accommodates the movable stage; a detector configured to detect a signal from a sample placed on the sample table; a camera configured to capture an image of the sample table and the sample; an extraction means configured to extract outer shape information relating to outer shapes of the sample table and the sample from the image captured by the camera; a control unit configured to control the movable stage based on the outer shape information; and a display unit configured to display an image relating to the outer shape information together with the image captured by the camera.
1. A charged particle beam device comprising:
an electron optics system configured to irradiate a sample table with a charged particle beam;
a movable stage on which the sample table is to be placed;
a sample chamber that accommodates the movable stage;
a detector configured to detect a signal from a sample placed on the sample table;
a camera configured to capture an image of the sample table and the sample;
an extraction means configured to extract outer shape information relating to outer shapes of the sample table and the sample from the image captured by the camera;
a processor programmed to control the movable stage based on the outer shape information; and
a display unit configured to display an image relating to the outer shape information together with the image captured by the camera.
2. The charged particle beam device according to claim 1 , wherein
the display unit is configured to display an image relating to a position of a convergence point of the charged particle beam in a superimposed manner together with the image relating to the outer shape information and the image captured by the camera.
3. The charged particle beam device according to claim 2 , wherein
the processor is programmed to control the movable stage based on the image relating to the position of the convergence point and the image relating to the outer shape information.
4. The charged particle beam device according to claim 1 , wherein
the processor is programmed to highlight the image relating to the outer shape information in the image captured by the camera.
5. The charged particle beam device according to claim 1 , wherein
the sample table is attachable to and detachable from the movable stage.
6. The charged particle beam device according to claim 1 , further comprising:
a database that stores an image of an inside of the sample chamber, wherein
the extraction means is configured to extract the outer shape information by comparing the image captured by the camera with the image in the database.
7. The charged particle beam device according to claim 6 , wherein
the database stores an image of the sample chamber in a state where the sample and the sample table are not inserted into the sample chamber.
8. The charged particle beam device according to claim 6 , wherein
the database stores a plurality of images of the inside of the sample chamber, and
the plurality of images of the inside of the sample chamber are different from each other in a position of the movable stage.
9. The charged particle beam device according to claim 6 , wherein
the database stores a plurality of images of the inside of the sample chamber, and
the plurality of images of the inside of the sample chamber are different from each other in whether the detector is inserted into the sample chamber.
10. The charged particle beam device according to claim 1 , wherein
the display unit is configured to display information indicating a case in which a height of a detection region of the sample changes.
11. The charged particle beam device according to claim 1 , wherein
the movable stage has an inclination angle that can be adjusted, and
the processor is programmed to execute control for correcting a deviation of a detection position caused by adjustment of the inclination angle.
12. The charged particle beam device according to claim 1 , wherein
the movable stage is configured to rotate around a vertical direction thereof.
13. The charged particle beam device according to claim 1 , wherein
the processor is programmed to control the movable stage based on movable range definition data that defines a movable range of the movable stage.
14. The charged particle beam device according to claim 1 , wherein
the camera is configured to capture an image of the sample chamber from a direction substantially horizontal to a surface of the movable stage and from a direction substantially perpendicular to the surface of the movable stage.