Additive manufacturing system with x-ray backscatter imaging system and method of inspecting a structure during additive manufacturing of the structure

1. An additive manufacturing system comprising:

additive manufacturing equipment comprising a casing and an additive manufacturing head configured to form a plurality of layers of a structure within the casing;

an x-ray backscatter imaging system configured to send an x-ray beam into the structure formed within the additive manufacturing equipment and detect scattered x-rays for imaging and analysis of the structure during fabrication; and

a processor configured to remove prior layer artifacts from scan data.

2. The additive manufacturing system of claim 1 , wherein the casing of the additive manufacturing equipment includes a portion formed of an x-ray transmissive material, and wherein the x-ray backscatter imaging system is positioned outside of the casing.

3. The additive manufacturing system of claim 2 , wherein the x-ray backscatter imaging system comprises a movement system mounted on the casing of the additive manufacturing equipment and configured to move the x-ray backscatter imaging system relative to the casing.

4. The additive manufacturing system of claim 3 , wherein the movement system comprises X-translators and Y-translators.

5. The additive manufacturing system of claim 3 , wherein the x-ray backscatter imaging system is mounted on the casing of the additive manufacturing equipment such that the x-ray beam sent by the x-ray backscatter imaging system encounters the most recently formed layer of the structure first.

6. The additive manufacturing system of claim 1 , wherein the x-ray backscatter imaging system comprises an x-ray source, a rotating collimator, and a number of x-ray detectors.

7. An additive manufacturing system comprising:

additive manufacturing equipment comprising a casing and an additive manufacturing head configured to form a plurality of layers of a structure within the casing;

an x-ray backscatter imaging system configured to send an x-ray beam into the structure formed within the additive manufacturing equipment and detect scattered x-rays for imaging and analysis of the structure during fabrication; and

a processor configured to isolate data for a number of nearest most layers by removing prior layer artifacts from scan data.

8. The additive manufacturing system of claim 1 , wherein a scanner of the x-ray backscatter imaging system is contained within the casing of the additive manufacturing equipment.

9. The additive manufacturing system of claim 8 , wherein the scanner of the x-ray backscatter imaging system is associated with a same movement system as the additive manufacturing head.

10. An additive manufacturing system comprising:

additive manufacturing equipment; and

an x-ray backscatter imaging system configured to inspect a structure formed within the additive manufacturing equipment, the x-ray backscatter imaging system comprising an x-ray source, a rotating collimator, and a number of x-ray detectors; and

a processor configured to isolate data for a number of nearest most layers by removing prior layer artifacts from scan data generated by the x-ray backscatter imaging system.

11. The additive manufacturing system of claim 10 further comprising:

an automated aperture alignment system for aligning apertures in the x-ray backscatter imaging system.

12. The additive manufacturing system of claim 10 wherein the x-ray backscatter imaging system further comprises an integrated high voltage power supply.

13. The additive manufacturing system of claim 10 wherein the x-ray backscatter imaging system comprises rotating anodes.

14. The additive manufacturing system of claim 10 , wherein a casing of the additive manufacturing equipment includes a portion formed of an x-ray transmissive material, and wherein the x-ray backscatter imaging system is positioned outside of the casing.

15. A method of inspecting a structure during additive manufacturing of the structure, the method comprising:

forming a layer of a plurality of layers of the structure using an additive manufacturing head of additive manufacturing equipment;

sending an x-ray beam into the layer using a scanner of an x-ray backscatter imaging system while the layer is in the additive manufacturing equipment and prior to depositing any subsequent layers;

detecting backscatter from the x-ray beam encountering the structure to form scan data; and

removing prior layer artifacts from the scan data to form data for a number of nearest layers including the layer.

16. The method of claim 15 further comprising:

identifying edges of the layer; and

comparing the edges of the layer to a designed edge of the structure.

17. The method of claim 15 further comprising:

determining whether out of tolerance inconsistences are present in the layer.

18. The method of claim 17 , wherein inconsistencies include at least one of voids, out of tolerance edges, or geometric warping.

19. The method of claim 17 further comprising:

updating at least one of a program run by the additive manufacturing equipment to form the structure or settings of the additive manufacturing equipment in response to identifying out of tolerance inconsistencies; and

creating a second structure having a same design as the structure using the additive manufacturing equipment after updating at least one of the program run by the additive manufacturing equipment to form the structure or the settings of the additive manufacturing equipment.

20. The method of claim 15 , wherein sending the x-ray beam into the layer comprises sending the x-ray beam into an upper surface of the layer.