IP Library › Granted Patent US 11,582,378
Granted Patent B2
US 11,582,378 · App. 17/341,243 · Granted Feb 14, 2023

Methods and apparatus for absolute and relative depth measurements using camera focus distance

Inventors: Ozkan Celik (Cedar Park, TX); Patricia A. Schulze (Giddings, TX); Gregory J. Freeman (Austin, TX); Paul Z. Wirth (Kalispell, MT); Tommaso Vercesi (Aschaffenburg, DE)
Assignee: Applied Materials, Inc.
H04N5/23212G01B11/002G06T5/50G06T7/55G06T7/571G06T2207/20024H04N2013/0081
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Quick Facts
Patent No.
US 11,582,378
App. No.
17/341,243
Granted
Feb 14, 2023
Kind
B2
Abstract

A depth measuring apparatus includes a camera assembly configured to capture a plurality of images of a target at a plurality of distances from the target. The depth measuring apparatus further includes a controller configured to, for each of a plurality of regions within the plurality of images: determine corresponding gradient values within the plurality of images; determine a corresponding maximum gradient value from the corresponding gradient values; and determine, based on the corresponding maximum gradient value, a depth measurement for a region of the plurality of regions.

Claims (42)

1. A depth measuring apparatus comprising:

a camera assembly configured to capture a plurality of images of a target at a plurality of distances from the target; and

a controller configured to, for each of a plurality of regions within the plurality of images:

determine corresponding gradient values within the plurality of images;

determine a corresponding maximum gradient value from the corresponding gradient values; and

determine, based on the corresponding maximum gradient value, a depth measurement for a region of the plurality of regions.

2. The depth measuring apparatus of claim 1 , wherein the plurality of images of the target are to be captured by the camera assembly at the plurality of distances from the target by moving at least one of the camera assembly or the target.

3. The depth measuring apparatus of claim 1 , wherein the controller is to determine the corresponding gradient values by applying an image gradient filter to the plurality of images.

4. The depth measuring apparatus of claim 3 , wherein the image gradient filter comprises one or more of an edge detection filter, a Sobel filter, a Prewitt filter, or a Laplace filter.

5. The depth measuring apparatus of claim 1 , wherein the controller is further to determine the depth measurement based on a reference depth, wherein the region is measured relative to the reference depth.

6. The depth measuring apparatus of claim 1 , wherein the camera assembly and the target are:

vertically aligned;

horizontally aligned; or

aligned along an angle.

7. The depth measuring apparatus of claim 1 , wherein the controller is to determine a plurality of depth measurements comprising the depth measurement, wherein the plurality of depth measurements are associated with a plurality of adjacent depth levels and a plurality of non-adjacent depth levels.

8. A depth measuring apparatus comprising:

a camera assembly configured to capture a plurality of images of a target at a plurality of distances from the target; and

a controller configured to process the plurality of images using an image gradient filter to determine a depth measurement for a region within the plurality of images relative to a reference depth.

9. The depth measuring apparatus of claim 8 , wherein the plurality of images of the target are to be captured by the camera assembly at the plurality of distances from the target by moving at least one of the camera assembly or the target.

10. The depth measuring apparatus of claim 8 , wherein the controller is to:

determine corresponding gradient values within the plurality of images; and

determine a corresponding maximum gradient value from the corresponding gradient values, wherein the depth measurement is further based on the corresponding maximum gradient value.

11. The depth measuring apparatus of claim 8 , wherein the image gradient filter comprises one or more of an edge detection filter, a Sobel filter, a Prewitt filter, or a Laplace filter.

12. The depth measuring apparatus of claim 8 , wherein the controller is further to determine the depth measurement based on the reference depth.

13. The depth measuring apparatus of claim 8 , wherein the camera assembly and the target are:

vertically aligned;

horizontally aligned; or

aligned along an angle.

14. The depth measuring apparatus of claim 8 , wherein the controller is to determine a plurality of depth measurements comprising the depth measurement, wherein the plurality of depth measurements are associated with a plurality of adjacent depth levels and a plurality of non-adjacent depth levels.

15. A method comprising:

receiving a plurality of images of a target, the plurality of images being captured by a camera assembly at a plurality of distances from the target;

determining corresponding gradient values within the plurality of images;

determining a corresponding maximum gradient value from the corresponding gradient values; and

determining, based on the corresponding maximum gradient value, a depth measurement for a region within the plurality of images.

16. The method of claim 15 , wherein the plurality of images of the target are to be captured by the camera assembly at the plurality of distances from the target by moving at least one of the camera assembly or the target.

17. The method of claim 15 , wherein the determining of the corresponding gradient values comprises applying an image gradient filter to the plurality of images.

18. The method of claim 15 , wherein the determining of the depth measurement is further based on a reference depth, wherein the region is measured relative to the reference depth.

19. The method of claim 15 , wherein the camera assembly and the target are:

vertically aligned;

horizontally aligned; or

aligned along an angle.

20. The method of claim 15 further comprising determining a plurality of depth measurements comprising the depth measurement, wherein the plurality of depth measurements are associated with a plurality of adjacent depth levels and a plurality of non-adjacent depth levels.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2021
From: CELIK, OZKAN; SCHULZE, PATRICIA A.; FREEMAN, GREGORY J.; WIRTH, PAUL Z.; VERCESI, TOMMASO
To: APPLIED MATERIALS, INC.
Reel/Frame 057362/0585 →
Continuity (3)
Continuation 16669197 · Oct 30, 2019
Continuation 16000884 · Jun 5, 2018
Related Publication 20210295547A1 · Sep 23, 2021
Cited By (1)
US 12,455,160