Method, device and system for reducing off-axial aberration in electron microscopy

1. A method for electron microscopy comprising:

providing an electron microscope comprising a sample component, a beam generator, an adjusting component and at least one diffraction correcting component;

securing a sample by using the sample component;

generating an electron beam by using the beam generator;

generating an image beam by directing the beam to the sample component;

adjusting at least one of the beam and the image beam in such a way that off-axial aberrations inflicted on at least one of the beam and the image beam are minimized, the adjusting performed by using the adjusting component to obtain at least one modified image beam, wherein the adjusting comprises applying both shifting and tilting to at least one of the beam and the image beam and wherein the amount of tilting of at least one of the beam and the image beam depends on the amount of shifting of at least one of the beam and the image beam respectively and wherein the amount of tilting is computed based on at least one of coma and astigmatism introduced as a consequence of the shift; and

correcting a diffraction pattern in the modified image beam by using the at least one diffraction correcting component.

2. The method of claim 1 , wherein the adjusting comprises at least shifting of up to 3 μm, or up to 5 μm, or up to 10 μm of at least one of the beam and image beam.

3. The method of claim 1 , wherein the adjusting comprises shifting and tilting the beam and the image beam and wherein

the shift of the image beam is substantially equal and opposite to the shift of the beam and

the tilt of the image beam is substantially equal and opposite to the tilt of the beam.

4. The method of claim 1 , wherein the at least one diffraction correcting component comprises a lens and a double deflector unit and wherein

the additional lens is configured to generate a magnified diffraction pattern, and

the double deflector unit is configured to de-tilt at least one of the image beam and the modified image beam.

5. The method of claim 1 , wherein correcting the diffraction pattern in the modified image beam comprises tilting the modified image beam to center the diffraction pattern.

6. A method for electron microscopy comprising:

providing an electron microscope comprising:

a sample component;

a beam generator;

an adjusting component comprising electrostatic quadrupoles, wherein the electrostatic quadrupoles reduce astigmatism created by shifting at least one of the beam and image beam; and

at least one diffraction correcting component comprising scan coils;

securing a sample by using the sample component;

generating an electron beam by using the beam generator;

generating an image beam by directing the beam to the sample component;

adjusting at least one of the beam and the image beam by using the adjusting component to obtain at least one modified image beam,

wherein the adjusting is performed in such a way, that off-axial aberrations inflicted on at least one of the beam and the image beam are minimized and wherein the adjusting comprises using the scan coils to tilt the beam before directing it to the sample component and de-tilting the image beam below the sample component; and

correcting a diffraction pattern in the modified image beam by using the at least one diffraction correcting component.

7. An electron microscope comprising:

a sample component configured to receive a sample;

a beam generator configured to generate an electron beam;

wherein the beam is configured to generate an image beam upon being directed to the sample component;

an adjusting component configured to adjust at least one of the beam and the image beam to obtain at least one modified image beam, the adjusting component comprising at least a pair of beam deflectors and a pair of image deflectors, each pair configured to at least one of shift and tilt the beam and the image beam respectively;

wherein the adjusting component is further configured to minimize off-axial aberration inflicted on at least one of the beam and the image beam; and

a diffraction correcting component configured to correct a diffraction pattern in the modified image beam resulting from at least one of beam and image shifts.

8. The electron microscope of claim 7 , wherein the adjusting component is configured to shift and tilt the beam and the image beam and wherein

the shift of the image beam is substantially equal and opposite to the shift of the beam and

the tilt of the image beam is substantially equal and opposite to the tilt of the beam.

9. The electron microscope of claim 7 , wherein the diffraction correcting component comprises an additional lens and a double deflector unit.

10. The electron microscope of claim 7 , configured to operate without an inbuilt image corrector introducing a shift-dependent tilt to reduce off-axial coma.

11. The method of claim 6 , wherein the adjusting comprises at least shifting of up to 3 μm, or up to 5 μm, or up to 10 μm of at least one of the beam and image beam.

12. The method of claim 6 , wherein the adjusting comprises shifting and tilting the beam and the image beam and wherein

the shift of the image beam is substantially equal and opposite to the shift of the beam and

the tilt of the image beam is substantially equal and opposite to the tilt of the beam.

13. The method of claim 6 , wherein correcting the diffraction pattern in the modified image beam comprises tilting the modified image beam to center the diffraction pattern.