Inspection apparatus, inspection method and storage medium that detects defects in images
An inspection apparatus including an image generation device which generates a second image corresponding to a first image, and a defect detection device which detects a defect in the second image. Each of the first and second image includes partial regions each including pixels. The defect detection device is configured to estimate a first value indicating a position difference between the first and second image for each of the partial regions, based on a luminance difference between the first and second image, estimate a second value indicating a reliability of the first value for each of the partial regions, and estimate a position difference between the first and second image for each of the pixels, based on the first and second value estimated for each of the partial regions.
1. An inspection apparatus comprising:
an image generation device which generates a second image corresponding to a first image; and
a defect detection device which detects a defect in the second image with respect to the first image, wherein
each of the first image and the second image includes a plurality of partial regions each including a plurality of pixels, and
the defect detection device is configured to:
estimate a first value indicating a position difference between the first image and the second image for each of the partial regions, based on a luminance difference between the first image and the second image;
estimate a second value indicating a reliability of the first value for each of the partial regions; and
estimate a position difference between the first image and the second image for each of the pixels, based on the first value and the second value estimated for each of the partial regions,
wherein
the partial regions include a first partial region including a circuit pattern and a second partial region not including a circuit pattern, and
the second value of the first partial region is greater than the second value of the second partial region.
2. The apparatus of claim 1 , wherein
the second value of the first partial region is a constant.
3. The apparatus of claim 2 , wherein
the second value of the second partial region is a constant.
4. The apparatus of claim 2 , wherein
the second value of the second partial region is estimated based on the second value of the first partial region and a distance from the first partial region.
5. The apparatus of claim 1 , wherein
the defect detection device estimates, for each of the partial regions, a position difference that minimizes a value of a sum of squared differences (SSD) between the first image and the second image.
6. The apparatus of claim 5 , wherein
the defect detection device estimates, for each of the partial regions, the second value based on an amount of change of the value of SSD in a range including the first value.
7. The apparatus of claim 5 , wherein
the defect detection device estimates, for each of the partial regions, the second value based on a sum of amounts of change of luminances of adjacent pixels.
8. The apparatus of claim 1 , wherein
a first pixel of the first image and a second pixel of the second image corresponding to the first pixel are associated by a position-related function of degree 2 or higher.
9. The apparatus of claim 1 , wherein
the image generation device includes an optical scanner or a scanning electron microscope.
10. An inspection method executed by an inspection apparatus including: an image generation device which generates a second image corresponding to a first image; and a defect detection device which detects a defect in the second image with respect to the first image, each of the first image and the second image including a plurality of partial regions each including a plurality of pixels, the method comprising:
estimating a first value indicating a position difference between the first image and the second image for each of the partial regions, based on a luminance difference between the first image and the second image;
estimating a second value indicating a reliability of the first value for each of the partial regions; and
estimating a position difference between the first image and the second image for each of the pixels, based on the first value and the second value estimated for each of the partial regions,
wherein
the partial regions include a first partial region including a circuit pattern and a second partial region not including a circuit pattern, and
the second value of the first partial region is greater than the second value of the second partial region.
11. The method of claim 10 , wherein
the second value of the first partial region is a constant.
12. The method of claim 11 , wherein
the second value of the second partial region is a constant.
13. The method of claim 11 , wherein
the second value of the second partial region is estimated based on the second value of the first partial region and a distance from the first partial region.
14. A non-transitory computer-readable medium storing thereon a program used in an inspection apparatus including: an image generation device which generates a second image corresponding to a first image; and a defect detection device which detects a defect in the second image with respect to the first image, each of the first image and the second image including a plurality of partial regions each including a plurality of pixels,
the program causing a processor of the defect detection device to:
estimate a first value indicating a position difference between the first image and the second image for each of the partial regions, based on a luminance difference between the first image and the second image;
estimate a second value indicating a reliability of the first value for each of the partial regions; and
estimate a position difference between the first image and the second image for each of the pixels, based on the first value and the second value estimated for each of the partial regions,
wherein
the partial regions include a first partial region including a circuit pattern and a second partial region not including a circuit pattern, and
the second value of the first partial region is greater than the second value of the second partial region.
15. The storage medium of claim 14 , wherein
the second value of the first partial region is a constant.
16. The storage medium of claim 15 , wherein
the second value of the second partial region is a constant.
17. The storage medium of claim 15 , wherein
the second value of the second partial region is estimated based on the second value of the first partial region and a distance from the first partial region.