Sample introduction system for mass spectrometry
View Patent ↗A surface interaction sample introduction (SISI) system for mass spectrometers is disclosed that improves sensitivity and reduces chemical background. SISI comprises of a settling chamber with an inlet orifice that ions created by an ionization source enter the MS impinging surface that is located in front of the inlet orifice, thereby the high-speed gas jet entering the settling chamber from the inlet orifice impinges on the impinging surface resealing ions and molecules into the settling chamber. The impinging surface can be one of the settling chamber surfaces or an extra surface placed inside the settling chamber. The impinging surface can be orthogonal or angled with respect to the gas jet. The impinging surface is heated to apply thermal energy to the jet to promote the liberation of ionized particles from attached impurities. The released ions and molecules leave the settling chamber from an outlet port towards a mass spectrometer inlet.
1. An interface between an ion source and a mass spectrometer for sample introduction to the mass spectrometer, comprising:
a settling chamber having an inlet orifice through which a sampling material is injected into the settling chamber, forming a jet flow inside the settling chamber, and having an outlet orifice on an outlet surface of the settling chamber to allow for a settled flow to flow from the settling chamber towards the mass spectrometer;
an impinging surface configured so that the jet flow impinges on the impinging surface, and the settled flow comprising of molecules and ions is formed inside the settling chamber, wherein the impinging surface is a tube with a predefined diameter that is located in between the inlet orifice and the outlet orifice, wherein the impinging surface disturbs and heats the jet flow and heated gases and ions flow around the impinging surface and towards the outlet orifice;
a heater to heat the impinging surface to heat the jet flow to prevent declustering and improve desolvation by heat dissipation,
whereby the settled flow improves signal stability, reproducibility and sensitivity of the mass spectrometer.
2. The apparatus of claim 1 , wherein the impinging surface is perpendicular or at an inclined angle with respect to the jet flow.
3. The apparatus of claim 1 , wherein the settling chamber has 10 to 50 mm sides, and wherein the outlet orifice has a diameter in the range of 0.2-2.0 mm.
4. The apparatus of claim 1 , wherein the inlet orifice and the outlet orifice are configured to control the pressure inside the settling chamber using a vacuum pump of the mass spectrometer.
5. The apparatus of claim 1 , further having a secondary vacuum pump that is directly connected to the settling chamber to reduce the pressure inside the settling chamber.
6. The apparatus of claim 1 , wherein the pressure inside the settling chamber is in the range of 1-20 Torr.