IP Library Granted Patent US 11,597,052
Granted Patent B2
US 11,597,052 · App. 16/448,980 · Granted Mar 7, 2023

Temperature control of chemical mechanical polishing

Inventors: Hari Soundararajan (Sunnyvale, CA); Shou-Sung Chang (Mountain View, CA); Haosheng Wu (San Jose, CA); Jianshe Tang (San Jose, CA); Jeonghoon Oh (Saratoga, CA); Rajeev Bajaj (Fremont, CA); Andrew Siordia (Sunnyvale, CA)
Assignee: Applied Materials, Inc.
B24B37/015B24B37/20B24B37/27B24B57/02G05D23/2401
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Quick Facts
Patent No.
US 11,597,052
App. No.
16/448,980
Granted
Mar 7, 2023
Kind
B2
Abstract

A chemical mechanical polishing apparatus includes a platen to hold a polishing pad, a carrier to hold a substrate against a polishing surface of the polishing pad during a polishing process, a dispenser to supply a polishing liquid to the polishing surface, and a temperature control system including a body configured to contact the polishing surface or the polishing liquid on the polishing surface. The body supports a thermal control module positioned over the polishing pad.

Claims (25)

1. A chemical mechanical polishing apparatus comprising:

a platen to hold a polishing pad;

a carrier to hold a substrate against a polishing surface of the polishing pad during a polishing process;

a dispenser to supply a polishing liquid to the polishing surface;

a temperature control system including a body configured to contact the polishing surface or the polishing liquid on the polishing surface, the body supporting a thermal control module positioned over the polishing pad, wherein the thermal control module comprises a stack including a thermoelectric heat pump and a heat exchanger; and

an actuator to adjust a vertical position of the body relative to the polishing pad.

2. The apparatus of claim 1 , wherein the body comprises a linear arm of substantially uniform width.

3. The apparatus of claim 1 , wherein the body comprises a wedge-shaped arm.

4. The apparatus of claim 1 , wherein at least a portion of the body that contacts the polishing pad or polishing liquid comprises a ceramic.

5. The apparatus of claim 4 , wherein the body is ceramic.

6. The apparatus of claim 4 , wherein the portion of the body comprises a coating of ceramic on another material.

7. The apparatus of claim 1 , wherein at least a portion of the body that contacts the polishing pad or polishing liquid comprises silicon carbide, silicon nitride aluminum nitride, diamond or diamond-like carbon.

8. The apparatus of claim 1 , wherein the heat exchanger is above the thermoelectric heat pump.

9. The apparatus of claim 8 , comprising a controller configured to control a current to the thermoelectric heat pump to cause the heat pump to drive heat to or from the polishing pad, and to control a temperature or flow rate of fluid passing through the heat exchanger to cause the heat exchanger to raise or lower a temperature of a top surface of the thermoelectric heat pump.

10. The apparatus of claim 9 , further comprising a polishing liquid supply port to distribute polishing liquid onto the polishing pad, and wherein the body is positioned to provide a barrier to flow of the polishing liquid.

11. The apparatus of claim 1 , wherein a portion of the body is positioned between the thermal control module and the polishing pad or the polishing liquid.

12. A chemical mechanical polishing apparatus comprising:

a platen to hold a polishing pad;

a carrier to hold a substrate against a polishing surface of the polishing pad during a polishing process;

a temperature control system including a plurality of thermal control modules positioned above the polishing pad, each thermal control module including a stack including a thermoelectric heat pump and a heat exchanger having a passage to receive a fluid and exchange heat between the polishing pad and the fluid, the temperature control system further including a plurality of fluid circulators to supply fluid at two different temperatures, and a plurality of valves to selectively fluidically couple each of the plurality of fluid circulators to each of the heat exchangers.

13. The apparatus of claim 12 , wherein the heat exchanger is above the thermoelectric heat pump.

14. The apparatus of claim 12 , comprising a controller configured to control a current to the thermoelectric heat pump to cause the heat pump to drive heat to or from the polishing pad, and to control a temperature or flow rate of fluid passing through the heat exchanger to cause the heat exchanger to raise or lower a temperature of a top surface of the thermoelectric heat pump.

15. The apparatus of claim 12 , wherein the temperature control system includes a body configured to contact the polishing surface or [[the]] a polishing liquid on the polishing surface, wherein the body supports the thermal control modules over the polishing pad.

16. The apparatus of claim 15 , further comprising an actuator to adjust a vertical position of the body relative to the polishing pad.

17. The apparatus of claim 15 , further comprising a polishing liquid supply port to distribute polishing liquid onto the polishing pad, and wherein the body is positioned to provide a barrier to flow of the polishing liquid.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2019
From: SOUNDARARAJAN, HARI; CHANG, SHOU-SUNG; WU, HAOSHENG; TANG, JIANSHE; OH, JEONGHOON; BAJAJ, RAJEEV; SIORDIA, ANDREW
To: APPLIED MATERIALS, INC.
Reel/Frame 051188/0311 →
Continuity (3)
Provisional Application 62690876 · Jun 27, 2018
Provisional Application 62778201 · Dec 11, 2018
Related Publication 20200001427A1 · Jan 2, 2020
Cited By (2)
US 12,290,896 US 12,318,882