IP Library Granted Patent US 11,604,122
Granted Patent B2
US 11,604,122 · App. 17/634,539 · Granted Mar 14, 2023

Curtain flow design for optical chambers

Inventors: Hee-Siew Han (Minneapolis, MN); Jeremy Jens Kolb (Saint Paul, MN)
Assignee: TSI Incorporated
G01N1/40F15D1/025G01N15/06G01N2015/0046G01N2015/0693
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,604,122
App. No.
17/634,539
Granted
Mar 14, 2023
Kind
B2
Abstract

Various embodiments include systems and apparatuses for reducing contamination levels within optical chambers of particle-detection instruments. In one embodiment, an apparatus to reduce contamination within an optical chamber of a particle-detection instrument is described. The apparatus includes a plenum chamber to at least partially surround an aerosol-focusing nozzle of the particle-detection instrument and accept a filtered gas flow. A curtain-flow concentrating nozzle is coupled to the plenum chamber to produce a curtain flow into the optical chamber to substantially surround an aerosol flow. Other methods and systems are disclosed.

Claims (28)

1. An apparatus to reduce contamination within an optical chamber of a particle-detection instrument, the apparatus comprising:

a plenum chamber to at least partially surround an aerosol-focusing nozzle of the particle-detection instrument, the plenum chamber to accept a filtered gas flow; and

a curtain-flow concentrating nozzle coupled to an output of the plenum chamber to produce a curtain flow into the optical chamber to substantially surround an aerosol flow, the filtered gas flow being configured to be introduced tangentially into the plenum chamber to produce a swirling movement of the filtered gas flow in the plenum chamber.

2. The apparatus of claim 1 , further comprising an open area coupled to an output of the curtain-flow concentrating nozzle and at least partially surrounding the aerosol-focusing nozzle.

3. The apparatus of claim 2 , wherein a combination of the plenum chamber, the curtain-flow concentrating nozzle, and the open area are arranged to provide a clean sheath of airflow around the aerosol flow.

4. The apparatus of claim 2 , wherein a combination of the plenum chamber and the curtain-flow concentrating nozzle is to substantially equalize flow pressure such that the curtain flow is distributed substantially evenly around an upper portion of the aerosol-focusing nozzle before passing from an outlet of the curtain-flow concentrating nozzle into the open area surrounding the upper portion, through the outlet.

5. The apparatus of claim 1 , wherein the plenum chamber and the curtain-flow concentrating nozzle are at least partially annular around an upper portion of the aerosol-focusing nozzle.

6. The apparatus of claim 1 , wherein the plenum chamber and the curtain-flow concentrating nozzle have a toroidal shape.

7. The apparatus of claim 1 , wherein the curtain flow is to be supplied from the curtain-flow concentrating nozzle by a continuous single slit on an outlet of the curtain-flow concentrating nozzle.

8. The apparatus of claim 1 , wherein the curtain flow is to be supplied from the curtain-flow concentrating nozzle by a series of slits on an outlet of the curtain-flow concentrating nozzle.

9. The apparatus of claim 8 , wherein the series of slits is selected from at least one shape including circular slits and elongated slits.

10. The apparatus of claim 1 , wherein the contamination includes at least one type of contamination including particle contamination and working-fluid vapor contamination.

11. An apparatus to reduce contamination within a p article-detection instrument, the apparatus comprising a curtain-flow concentrating nozzle coupled to accept a filtered gas flow and produce a curtain flow into an optical chamber of the particle-detection instrument, the curtain flow to substantially surround a particle-laden aerosol flow within the particle-detection instrument, the curtain flow being configured to be introduced tangentially with reference to the particle-laden aerosol flow to produce a swirling movement of the curtain flow.

12. The apparatus of claim 11 , further comprising a plenum chamber coupled between the filtered gas flow and the curtain-flow concentrating nozzle.

13. The apparatus of claim 12 , wherein the plenum chamber to at least partially surround the aerosol-focusing nozzle of the particle-detection instrument.

14. The apparatus of claim 12 , wherein the tangentially-introduced curtain flow is also introduced at an angle with reference to a circumferential direction of the plenum chamber, to produce the swirling movement of the curtain flow in the plenum chamber.

15. The apparatus of claim 11 , wherein the contamination includes at least one type of contaminant selected from contaminant types including particle contamination and working fluid vapor contamination.

16. The apparatus of claim 11 , wherein the curtain flow is to be supplied from the curtain-flow concentrating nozzle by a continuous single slit on an outlet of the curtain-flow concentrating nozzle.

17. The apparatus of claim 11 , wherein the curtain flow is to be supplied from the curtain-flow concentrating nozzle by a series of slits on an outlet of the curtain-flow concentrating nozzle.

18. The apparatus of claim 17 , wherein the series of slits is selected from at least one shape including square slits, rectangular slits, and elliptical slits.

19. The apparatus of claim 11 , wherein curtain flow is further configured to at least substantially surround working-fluid vapors within the particle-detection instrument.

20. An apparatus to reduce contamination in a particle-detection instrument, the apparatus comprising:

a plenum chamber surrounding an aerosol-focusing nozzle of the particle-detection instrument, the plenum chamber to accept a filtered gas flow;

a curtain-flow concentrating nozzle coupled to an outlet of the plenum chamber to produce a curtain flow into the optical chamber to substantially surround an aerosol flow, the filtered gas flow being configured to be introduced tangentially into the plenum chamber to produce a swirling movement of the filtered gas flow in the plenum chamber; and

an open area coupled to an output of the curtain-flow concentrating nozzle and at least partially surrounding the aerosol-focusing nozzle to reduce at least one of particle contaminants and working-fluid vapors.

21. The apparatus of claim 20 , wherein the plenum chamber and the curtain-flow concentrating nozzle have a toroidal shape.

22. The apparatus of claim 20 , wherein the curtain flow is to be supplied from the curtain-flow concentrating nozzle by a continuous single slit on an outlet of the curtain-flow concentrating nozzle.

23. The apparatus of claim 20 , wherein the curtain flow is to be supplied from the curtain-flow concentrating nozzle by a series of slits on an outlet of the curtain-flow concentrating nozzle.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 17, 2022
From: HAN, HEE-SIEW; KOLB, JEREMY JENS
To: TSI INCORPORATED
Reel/Frame 059037/0165 →
Continuity (2)
Provisional Application 62885952 · Aug 13, 2019
Related Publication 20220268674A1 · Aug 25, 2022
Cited By (2)
US 12,385,734 US 12,571,713