IP Library › Granted Patent US 11,608,435
Granted Patent B2
US 11,608,435 · App. 16/610,992 · Granted Mar 21, 2023

Epoxy resin composition, electronic component mounting structure, and method for producing the same

Inventors: Yasuhito Fujii (Tatsuno, JP); Katsushi Kan (Tatsuno, JP); Yosuke Oi (Tatsuno, JP)
Assignee: NAGASE CHEMTEX CORPORATION
C08L63/04B29C43/003C08K3/36C08K7/26C08L63/00C09J163/00H01L21/56H01L21/563H01L23/295B29K2063/00C08G59/4238C08K5/18C08K2201/003C08L2201/08C08L2203/206
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Quick Facts
Patent No.
US 11,608,435
App. No.
16/610,992
Granted
Mar 21, 2023
Kind
B2
Abstract

To provide an epoxy resin composition capable of forming a polished surface with high flatness when polished after curing, and a method for producing an electronic component mounting structure having a polished surface with high flatness, the polished surface obtained by polishing the surface of an encapsulation body. Disclosed are an epoxy resin composition, an electronic component mounting structure including the epoxy resin composition, and a method for producing the electronic component mounting structure, wherein: the epoxy resin composition includes a fused silica possibly containing hollow particles, and a curing agent; on a polished surface obtained by polishing a cured product of the epoxy resin composition, the number of pores having a diameter of more than 5 μm observed within a 25-mm 2 area is one or less, the pores derived from cross sections of the hollow particles; and the polished surface is coated with a coating material.

Claims (33)

1. An epoxy resin composition, comprising

an epoxy resin, a spherical fused silica possibly containing hollow particles, and a curing agent, wherein

the curing agent includes an acid anhydride,

the epoxy resin composition is in a form of a liquid or sheet,

the content of the fused silica in the epoxy resin composition is 70 to 90 mass %,

the fused silica has a maximum particle diameter of 25 μm or less, and an average diameter of more than 1 μm and less than 3 μm, and

on a polished surface obtained by polishing a cured product of the epoxy resin composition, the number of pores having a diameter of more than 5 μm observed within a 25-mm 2 area is one or less, the pores derived from cross sections of the hollow particles.

2. The epoxy resin composition of claim 1 , wherein the number of pores having a diameter of more than 2 μm observed within the 25-mm 2 area is one or less, the pores derived from cross section of the hollow particles.

3. The epoxy resin composition of claim 1 , wherein the fused silica has a maximum particle diameter of 20 μm or less.

4. The epoxy resin composition of claim 1 , wherein a redistribution layer is formed on the polished surface.

5. The epoxy resin composition of claim 1 , wherein the cured product is a cured product formed by thermally curing the epoxy resin composition at 150° C. for one hour.

6. The epoxy resin composition of claim 1 , the epoxy resin composition being a material for compression molding for fan-out panel level packaging or fan-out wafer level packaging.

7. An electronic component mounting structure comprising

an electronic component, and

a cured product of an epoxy resin composition, the cured product encapsulating the electronic component, wherein:

the epoxy resin composition contains an epoxy resin, a spherical fused silica possibly containing hollow particles, and a curing agent;

the curing agent includes an acid anhydride,

a content of the fused silica in the epoxy resin composition is 70 to 90 mass %,

the fused silica has a maximum particle diameter of 25 μm or less, and an average diameter of more than 1 μm and less than 3 μm,

the cured product has a polished surface; and

on the polished surface, the number of pores having a diameter of more than 5 μm observed within a 25-mm 2 area is one or less, the pores derived from cross sections of the hollow particles.

8. The electronic component mounting structure of claim 7 , wherein a redistribution layer is formed on the polished surface.

9. A method of producing an electronic component mounting structure, the method comprising steps of:

preparing an electronic component, and an epoxy resin composition;

encapsulating the electronic component with the epoxy resin composition, and curing the epoxy resin composition by compression molding, to form an encapsulation body including the electronic component and a cured product of the epoxy resin composition;

polishing part of the cured product, to form a polished surface; and

forming a redistribution layer on the polished surface,

wherein the epoxy resin composition comprises

an epoxy resin, a spherical fused silica possibly containing hollow particles, and a curing agent, wherein

the epoxy resin composition is in a form of a liquid or sheet,

a content of the fused silica in the epoxy resin composition is 70 to 90 mass %,

the fused silica has a maximum particle diameter of 25 μm or less, and an average diameter or more than 1 μm and less than 3 μm, and

on a polished surface obtained by polishing a cured product of the epoxy resin composition, the number of pores having a diameter of more than 5 μm observed within a 25-mm 2 area is one or less, the pores derived from cross sections of the hollow particles.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2019
From: FUJII, YASUHITO; KAN, KATSUSHI; OI, YOSUKE
To: NAGASE CHEMTEX CORPORATION
Reel/Frame 050919/0586 →
Priority Claims (1)
JP JP2017-114687 · Jun 9, 2017 · national
Continuity (1)
Related Publication 20200172724A1 · Jun 4, 2020