Methods for forming a topographically selective silicon oxide film by a cyclical plasma-enhanced deposition process

1. A method for forming a topographically selective silicon oxide film by a cyclical plasma-enhanced deposition process, the method comprising:

providing a non-planar substrate including one or more horizontal surfaces and one or more vertical surfaces into a reaction chamber;

contacting the non-planar substrate with a first reactive species generated from a first gas comprising at least a vapor phase reactant, the vapor phase reactant comprising a silicon component, a carbon component, and a hydrogen component;

contacting the non-planar substrate with a second reactive species generated from a second gas comprising at least an oxygen precursor and a noble gas; and

forming a silicon oxide film either selectively over the horizontal surfaces of the non-planar substrate,

wherein the first reactive species is generated by exciting the vapor phase reactant with a plasma,

wherein the deposition process comprises one or more repetitions of a unit deposition cycle,

wherein the vapor phase reactant is introduced into the reaction chamber by two or more discrete pulses in each deposition cycle, and

wherein the plasma is generated using a parallel plate electrode configuration and a plurality of ions are accelerated anisotropically downward toward the substrate in a substantially vertical direction.

2. The method of claim 1 , wherein the vapor phase reactant comprises at least one of an alkylsilane, an arylsilane, or an aralkylsilane.

3. The method of claim 1 , wherein the vapor phase reactant further comprises at least one of a nitrogen component, or an oxygen component.

4. The method of claim 3 , wherein the vapor phase reactant comprises at least one of an alkylalkoxysilane, or an alkylamino silane.

5. The method claim 1 , further comprising contacting the non-planar substrate with an etchant to selectively remove the silicon oxide film on the horizontal surfaces of the non-planar substrate relative to the silicon oxide film on the vertical surfaces of the non-planar substrate.

6. The method of claim 5 , wherein the topographically selectivity is greater than 50% for the thickness of the silicon oxide film formed over vertical surfaces of the non-planar substrate compared with the thickness of the silicon oxide film formed over the horizontal surfaces of the non-planar substrate.

7. The method of claim 1 , wherein the cyclical plasma-enhanced deposition process comprises a cyclical plasma-enhanced chemical vapor deposition process.

8. The method of claim 7 , wherein a unit deposition cycle comprises:

simultaneously contacting the non-planar substrate with the first reactive species and the second reactive species; and

purging excess first reactive species and excess second reactive species and any reaction by-products.

9. The method of claim 8 , wherein the first reactive species and the second reactive species contact the non-planar substrate for a time period of less than 1 second.

10. The method of claim 8 , wherein the silicon oxide film is formed topographically selective on upper horizontal surfaces of the non-planar substrate.

11. The method of claim 7 , wherein a unit deposition cycle comprises:

simultaneously contacting the non-planar substrate with the first reactive species and the second reactive species;

purging excess first reactive species and excess second reactive species and any reaction by-products,

contacting the non-planar substrate with a third reactive species generated from a noble gas; and

purging excess third reactive species and any reaction by-products.

12. The method of claim 11 , wherein the topographical selectivity is greater than 50% for deposition over the horizontal surfaces of the non-planar substrate compared with deposition over the vertical surfaces of the non-planar substrate.

13. The method of claim 7 , wherein a unit deposition cycle comprises:

contacting the non-planar substrate with the first reactive species;

contacting the non-planar substrate with a fourth reactive species generated from a gas comprising a noble gas;

purging any reactive species and reaction by-products;

contacting the non-planar substrate with the second reactive species; and

purging any reactive species and reaction by-products.

14. The method of claim 13 , wherein the non-planar substrate is contacted with the first reactive species and the fourth reactive species simultaneously.

15. The method of claim 13 , wherein the topographical selectivity is greater than 50% for deposition over the horizontal surfaces of the non-planar substrate compared with deposition over the vertical surfaces of the non-planar substrate.

16. A method for forming a topographically selective silicon oxide film by a cyclical plasma-enhanced chemical vapor deposition process, the method comprising:

providing a non-planar substrate including one or more horizontal surfaces and one or more vertical surfaces into a reaction chamber;

contacting the non-planar substrate with a first reactive species generated from a first gas comprising at least a vapor phase reactant, the vapor phase reactant comprising a silicon component, a carbon component, and a hydrogen component;

contacting the non-planar substrate with a second reactive species generated from a second gas comprising at least an oxygen precursor and a noble gas; and

forming a silicon oxide film either selectively over the horizontal surfaces of the non-planar substrate,

wherein the first reactive species is generated by exciting the vapor phase reactant with a plasma,

wherein the deposition process comprises one or more repetitions of a unit deposition cycle,

wherein the oxygen precursor and the noble gas flow into the reaction chamber continuously during the unit deposition cycle, and

wherein the plasma is generated using a parallel plate electrode configuration and a plurality of ions are accelerated anisotropically downward toward the substrate in a substantially vertical direction.

17. The method of claim 16 , wherein the plasma is generated continuously during the unit deposition cycle.

18. The method of claim 16 , wherein the vapor phase reactant is provided in a discrete pulse during the unit deposition cycle.

19. A method for forming a topographically selective silicon oxide film by a cyclical plasma-enhanced deposition process, the method comprising:

providing a non-planar substrate including one or more horizontal surfaces and one or more vertical surfaces into a reaction chamber;

contacting the non-planar substrate with a first reactive species generated from a first gas comprising at least a vapor phase reactant, the vapor phase reactant comprising a silicon component, a carbon component, and a hydrogen component;

contacting the non-planar substrate with a second reactive species generated from a second gas comprising at least an oxygen precursor and a noble gas; and

forming a silicon oxide film either selectively over the horizontal surfaces of the non-planar substrate,

wherein the first reactive species is generated by exciting the vapor phase reactant with a plasma,

wherein the deposition process comprises one or more repetitions of a unit deposition cycle,

wherein the vapor phase reactant is introduced into the reaction chamber by two or more discrete pulses in each deposition cycle,

wherein the cyclical plasma-enhanced deposition process comprises a cyclical plasma-enhanced chemical vapor deposition process,

wherein a unit deposition cycle comprises:

contacting the non-planar substrate with the first reactive species;

contacting the non-planar substrate with a fourth reactive species generated from a gas comprising a noble gas;

purging any reactive species and reaction by-products;

contacting the non-planar substrate with the second reactive species; and

purging any reactive species and reaction by-products, and

wherein the non-planar substrate is contacted with the first reactive species and the fourth reactive species simultaneously.