IP Library › Granted Patent US 11,619,519
Granted Patent B2
US 11,619,519 · App. 17/170,174 · Granted Apr 4, 2023

Predictive sensor tracking optimization in multi-sensor sensing applications

Inventors: Luke Lapointe (Austin, TX); Siddharth Maru (Austin, TX); Tejasvi Das (Austin, TX)
Assignee: Cirrus Logic, Inc.
G01D5/20G01K11/00G01K13/00G06F3/0202G06N5/04G06N20/00
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Quick Facts
Patent No.
US 11,619,519
App. No.
17/170,174
Granted
Apr 4, 2023
Kind
B2
Abstract

A system may include a plurality of sensors, a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors, and a predictive optimization subsystem configured to detect an event associated with a first sensor of the plurality of sensors and responsive to the event, execute a predictive action with respect to one or more of the other sensors of the plurality of sensors.

Claims (87)

1. A system comprising:

a plurality of sensors;

a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors; and

a predictive optimization subsystem configured to:

detect an event associated with a first sensor of the plurality of sensors; and

responsive to the event, execute a predictive action with respect to one or more of the other sensors of the plurality of sensors;

wherein:

the event comprises one of electrical interference and mechanical damage occurring at the first sensor; and

the predictive action comprises one or more of:

changing a driving amplitude associated with the one or more of the other sensors;

changing a corner frequency of a filter associated with the one or more of the other sensors;

comprises changing one or more of a quality factor and an impedance associated with the one or more of the other sensors;

changing a sensor scan rate associated with the one or more of the other sensors;

changing a sensor conversion time associated with the one or more of the other sensors;

temporarily disabling scanning of the one or more of the other sensors; and/or

performing gain normalization of the one or more of the other sensors.

2. The system of claim 1 , wherein:

the plurality of sensors includes resistive-inductive-capacitive sensors;

the one or more physical quantities comprise phase information associated with the resistive-inductive-capacitive sensor; and

the measurement circuit is further configured to, based on the phase information, determine a displacement of a mechanical member relative to at least one of the resistive-inductive-capacitive sensors, wherein the displacement of the mechanical member causes a change in an impedance of one or more of the resistive-inductive-capacitive sensors.

3. A system, comprising:

a plurality of sensors;

a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors; and

a predictive optimization subsystem configured to:

detect an event associated with a first sensor of the plurality of sensors; and

responsive to the event, execute a predictive action with respect to one or more of the other sensors of the plurality of sensors;

wherein:

the event comprises an indication of human interaction with a human-machine interface associated with the first sensor; and

the predictive action comprises increasing a sensor scan rate associated with the one or more of the other sensors.

4. The system of claim 3 , wherein:

the plurality of sensors includes resistive-inductive-capacitive sensors;

the one or more physical quantities comprise phase information associated with the resistive-inductive-capacitive sensor; and

the measurement circuit is further configured to, based on the phase information, determine a displacement of a mechanical member relative to at least one of the resistive-inductive-capacitive sensors, wherein the displacement of the mechanical member causes a change in an impedance of one or more of the resistive-inductive-capacitive sensors.

5. A system of claim 1 , comprising:

a plurality of sensors;

a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors; and

a predictive optimization subsystem configured to:

detect an event associated with a first sensor of the plurality of sensors; and

responsive to the event, execute a predictive action with respect to one or more of the other sensors of the plurality of sensors;

wherein:

the event comprises an indication of a temperature drift associated with the first sensor; and

the predictive action comprises one or more of:

updating a baseline tracking rate associated with the one or more of the other sensors; and/or

increasing a sensor scan rate associated with the one or more of the other sensors.

6. The system of claim 5 , wherein:

the plurality of sensors includes resistive-inductive-capacitive sensors;

the one or more physical quantities comprise phase information associated with the resistive-inductive-capacitive sensor; and

the measurement circuit is further configured to, based on the phase information, determine a displacement of a mechanical member relative to at least one of the resistive-inductive-capacitive sensors, wherein the displacement of the mechanical member causes a change in an impedance of one or more of the resistive-inductive-capacitive sensors.

7. A method, comprising, in a system having a plurality of sensors and a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors:

detecting an event associated with a first sensor of the plurality of sensors; and

responsive to the event, executing a predictive action with respect to one or more of the other sensors of the plurality of sensors;

wherein:

the event comprises one of electrical interference and mechanical damage occurring at the first sensor; and

the predictive action comprises one or more of:

changing a driving amplitude associated with the one or more of the other sensors;

changing a corner frequency of a filter associated with the one or more of the other sensors;

comprises changing one or more of a quality factor and an impedance associated with the one or more of the other sensors;

changing a sensor scan rate associated with the one or more of the other sensors;

changing a sensor conversion time associated with the one or more of the other sensors;

temporarily disabling scanning of the one or more of the other sensors; and/or

performing gain normalization of the one or more of the other sensors.

8. The method of claim 7 , wherein:

the plurality of sensors includes resistive-inductive-capacitive sensors;

the one or more physical quantities comprise phase information associated with the resistive-inductive-capacitive sensor; and

the measurement circuit is further configured to, based on the phase information, determine a displacement of a mechanical member relative to at least one of the resistive-inductive-capacitive sensors, wherein the displacement of the mechanical member causes a change in an impedance of one or more of the resistive-inductive-capacitive sensors.

9. A method comprising, in a system having a plurality of sensors and a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors:

detecting an event associated with a first sensor of the plurality of sensors; and

responsive to the event, executing a predictive action with respect to one or more of the other sensors of the plurality of sensors;

wherein:

the event comprises an indication of human interaction with a human-machine interface associated with the first sensor; and

the predictive action comprises increasing a sensor scan rate associated with the one or more of the other sensors.

10. The method of claim 9 , wherein:

the plurality of sensors includes resistive-inductive-capacitive sensors;

the one or more physical quantities comprise phase information associated with the resistive-inductive-capacitive sensor; and

the measurement circuit is further configured to, based on the phase information, determine a displacement of a mechanical member relative to at least one of the resistive-inductive-capacitive sensors, wherein the displacement of the mechanical member causes a change in an impedance of one or more of the resistive-inductive-capacitive sensors.

11. A method, comprising, in a system having a plurality of sensors and a measurement circuit communicatively coupled to the plurality of sensors and configured to measure one or more physical quantities associated with the plurality of sensors:

detecting an event associated with a first sensor of the plurality of sensors; and

responsive to the event, executing a predictive action with respect to one or more of the other sensors of the plurality of sensors;

wherein:

the event comprises an indication of a temperature drift associated with the first sensor; and

the predictive action comprises one or more of:

updating a baseline tracking rate associated with the one or more of the other sensors; and/or

increasing a sensor scan rate associated with the one or more of the other sensors.

12. The method of claim 11 , wherein:

the plurality of sensors includes resistive-inductive-capacitive sensors;

the one or more physical quantities comprise phase information associated with the resistive-inductive-capacitive sensor; and

the measurement circuit is further configured to, based on the phase information, determine a displacement of a mechanical member relative to at least one of the resistive-inductive-capacitive sensors, wherein the displacement of the mechanical member causes a change in an impedance of one or more of the resistive-inductive-capacitive sensors.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2022
From: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
To: CIRRUS LOGIC, INC.
Reel/Frame 062225/0931 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 12, 2022
From: LAPOINTE, LUKE; MARU, SIDDHARTH; DAS, TEJASVI
To: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
Reel/Frame 058626/0975 →
Continuity (1)
Related Publication 20220252428A1 · Aug 11, 2022
Cited By (3)
US 12,650,737 US 12,650,738 US 12,669,878