Method and device for the optical inspection of containers

1. A method for an optical inspection of containers, comprising:

transporting the containers with a conveyor as a container mass flow,

capturing each of said containers as first image data, and evaluating said first image data for contamination and/or defects on a respective container, and

overlaying said first image data of several containers with image data of different containers to form an overlay image, and evaluating said overlay image for a presence of points of contamination in a beam path used for capturing the first image data.

2. The method according to claim 1 , where faulty containers are discharged from the container mass flow after an evaluation of said contamination and/or said defects.

3. The method according to claim 1 , where test image data without a container is captured before said containers are captured, and where said test image data is overlaid to form a test overlay image which is then evaluated for already existing points of contamination in the beam path.

4. The method according to claim 1 , where said containers are illuminated with a plurality of light sources of an illumination device when being captured, where at least one of said light sources is activated on a basis of said overlay image for indicating said points of contamination to an operator for subsequent cleaning, and where the remaining light sources of said illumination device are deactivated.

5. The method according to claim 1 , where the overlay image is evaluated for presence of points of the contamination in the beam path but not located on the containers.

6. A device for the optical inspection of containers, for carrying out the method according to claim 1 , comprising:

the conveyor for transporting said containers as the container mass flow,

a camera and illumination device for capturing said containers as first image data, and

a processor and memory for evaluating said first image data for contamination and/or defects on said containers,

where said processor is configured to overlay said first image data of several containers to form an overlay image and to evaluate said overlay image for the presence of points of contamination in the beam path used for capturing the first image data.

7. A method for an optical inspection of containers, comprising:

transporting the containers with a conveyor as a container mass flow,

capturing each of said containers as first image data, and evaluating said first image data for contamination and/or defects on a said respective container, and

overlaying said first image data of several containers with image data of different containers to form an overlay image, and evaluating said overlay image for a presence of points of contamination in a beam path used for capturing the first image data,

where a further container is captured as second image data, where said overlay image is multiplied by a first weighting factor and said second image data is multiplied by a second weighting factor and then overlaid to form a further overlay image, and where said further overlay image is evaluated for the presence of points of contamination in the beam path used for capturing the first image data.

8. The method according to claim 7 , where a magnitude of the first weighting factor is greater than the magnitude of the second weighting factor.

9. The method according to claim 7 , where the first weighting factor and the second weighting factor are in a range between 0 and 1, and where the first weighting factor and the second weighting factor add up to 1.

10. The method according to claim 7 , where the first weighting factor is calculated from a number of said several containers divided by the number of said several containers increased by 1, where the second weighting factor is calculated from 1 divided by the number of said several containers increased by 1.

11. The method according to claim 10 , where said first image data, said overlay image, said second image data and/or said further overlay image are each normalized image by image to a same value range, in particular to a value range from 0 to 255 or from 0 to 65535.

12. The method according to claim 11 , where a further container is captured as second image data, and where said overlay image and/or said further overlay image is multiplied by a third weighting factor and subtracted from said second image data in order to computationally eliminate said points of contamination in the beam path used for capturing the second image data.

13. The method according to claim 7 , where, if points of contamination are present in the beam path in said overlay image or in said further overlay image, a threshold value sensitivity for evaluating the contamination and/or defects on said containers is adjusted, in particular lowered.

14. A device for the optical inspection of containers, for carrying out the method according to claim 7 , comprising:

a conveyor for transporting said containers as a container mass flow,

a camera and illumination device for capturing said containers as first image data, and

a processor and memory for evaluating said first image data for contamination and/or defects on said containers,

where said processor is configured to overlay said first image data of several containers to form an overlay image and to evaluate said overlay image for the presence of points of contamination in a beam path used for capturing the first image data.

15. The device according to claim 14 , where said illumination device illuminates said containers and the camera captures said containers as image data.

16. The device according to claim 14 , where said device comprises a discharge device for discharging faulty containers from the container mass flow after the contamination and/or defects have been evaluated.