IP Library › Granted Patent US 11,631,516
Granted Patent B2
US 11,631,516 · App. 16/754,798 · Granted Apr 18, 2023

Inductor stack structure

Inventors: Wei Cheng (Ningguo, CN); Chengjie Zuo (Ningguo, CN); Jun He (Ningguo, CN)
Assignee: ANHUI YUNTA ELECTRONIC TECHNOLOGIES CO., LTD.
H01F17/0013H01F27/28H01F27/34H01L23/5227H01F2017/002
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Quick Facts
Patent No.
US 11,631,516
App. No.
16/754,798
Granted
Apr 18, 2023
Kind
B2
Abstract

Provided is an inductor stack structure. The inductor stack structure include a substrate; at least two metal layers sequentially stacked on one side of the substrate, each metal layer at least comprises a first plane inductor; a through hole, which is located between any two neighboring metal layers, first plane inductors in different metal layers are electrically connected through the through hole; and a thickness of the through hole is greater than that of the metal layer.

Claims (15)

1. An inductor stack structure, comprising:

a substrate;

at least two metal layers sequentially stacked on one side of the substrate, a first plane inductor is disposed in each of the at least two metal layers;

a through hole, which is located between any two neighboring ones of the at least two metal layers, first plane inductors in different ones of the at least two metal layers are electrically connected through the through hole;

wherein a thickness of the through hole is greater than a thickness of each of the at least two metal layers;

wherein the through hole comprises a metal column;

wherein vertical projections of the first plane inductors in the any two neighboring ones of the at least two metal layers on the substrate are overlapped; and

wherein corresponding overlapped portions of the first plane inductors in the any two neighboring ones of the at least two metal layers have a same current direction.

2. The inductor stack structure of claim 1 , wherein the first plane inductors in the different ones of the at least two metal layers are connected in series or in parallel.

3. The inductor stack structure of claim 1 , wherein at least one of the at least two metal layers is further disposed with a second plane inductor, the second plane inductor is insulated from the first plane inductor, and vertical projection of the second plane inductor and vertical projection of any one of first plane inductors on the substrate are not overlapped.

4. The inductor stack structure of claim 1 , wherein the first plane inductor is a plane spiral structure.

5. The inductor stack structure of claim 1 , further comprising a functional element, the functional element is located between the substrate and a metal layer closest to the substrate;

the functional element comprises at least one of a transistor, a diode, a resistor, an inductor, a capacitor, or an acoustic wave device.

6. The inductor stack structure of claim 1 , wherein the metal layer is manufactured by an electroplating process.

7. The inductor stack structure of claim 1 , wherein a material of the substrate is one of silicon, quartz, sapphire or glass.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2020
From: CHENG, WEI; ZUO, CHENGJIE; HE, JUN
To: ANHUI YUNTA ELECTRONIC TECHNOLOGIES CO., LTD.
Reel/Frame 052352/0823 →
Priority Claims (2)
CN 201810331302.5 · Apr 13, 2018 · national
CN 201820525282.0 · Apr 13, 2018 · national
Continuity (1)
Related Publication 20200303109A1 · Sep 24, 2020