Image sensor including CMOS image sensor pixel and dynamic vision sensor pixel
An image sensor includes a CIS (CMOS image sensor) pixel, a DVS (dynamic vision sensor) pixel, and an image signal processor. The CIS pixel includes a photoelectric conversion device generating charges corresponding to an incident light and a readout circuit generating an output voltage corresponding to the generated charges. The DVS pixel detects a change in an intensity of the incident light based on the generated charges to output an event signal and does not include a separate photoelectric conversion device. The image signal processor allows the photoelectric conversion device to be connected to the readout circuit or the DVS pixel.
1. An image sensor comprising:
a CMOS image sensor (CIS) pixel, the CIS pixel comprising:
a photoelectric conversion device configured to generate charges corresponding to an incident light that is incident on the CIS pixel; and
a readout circuit configured to generate an output voltage corresponding to the charges; and
a dynamic vision sensor (DVS) pixel configured to detect a change in intensity of the incident light based on the charges generated by the photoelectric conversion device, and output an event signal based on the change in intensity,
wherein the CIS pixel further comprises:
a transfer transistor configured to transfer the charges generated by the photoelectric conversion device to a floating diffusion node, in a first mode to generate a first image data of the image sensor based on the output voltage generated by the CIS pixel;
a reset transistor configured to reset a voltage of the floating diffusion node, in the first mode; and
a switch transistor configured to transfer the charges to the DVS pixel, in a second mode to generate a second image data based on the event signal generated by the DVS pixel, and
wherein the readout circuit comprises:
a drive transistor configured to output the voltage of the floating diffusion node as the output voltage in the first mode; and
a select transistor configured to select the CIS pixel in the first mode.
2. The image sensor of claim 1 , further comprises:
an image signal processor configured to selectively control the image sensor to generate the first image data of the image sensor based on the output voltage generated by the CIS pixel and generate second image data based on the event signal generated by the DVS pixel.
3. The image sensor of claim 1 , wherein the DVS pixel comprising:
a photoreceptor configured to output a log voltage based on a photocurrent corresponding to the charges generated by the photoelectric conversion device; and
a DVS pixel back-end circuit configured to amplify the log voltage, compare the amplified log voltage to a comparison voltage, determine the change in intensity based on a result of comparing the amplified log voltage to the comparison voltage, and output the event signal based on the change in intensity.
4. The image sensor of claim 1 , further comprises:
a first substrate on which a CIS pixel array including the CIS pixel is formed; and
a second substrate on which a DVS pixel array including the DVS pixel is formed,
wherein the first substrate and the second substrate are connected in a Cu-to-Cu bonding manner.
5. The image sensor of claim 1 , wherein the DVS pixel does not include any photoelectric conversion device.
6. An image sensor comprising:
a CMOS image sensor (CIS) pixel, the CIS pixel comprising:
a photoelectric conversion device configured to generate charges corresponding to an incident light that is incident on the CIS pixel; and
a readout circuit configured to generate an output voltage corresponding to the charges; and
a dynamic vision sensor (DVS) pixel configured to detect a change in intensity of the incident light based on the charges generated by the photoelectric conversion device, and output an event signal based on the change in intensity,
wherein the CIS pixel further comprises:
a transfer transistor configured to transfer the charges generated by the photoelectric conversion device to a floating diffusion node;
a reset transistor configured to reset a voltage of the floating diffusion node, in a first mode to generate a first image data of the image sensor based on the output voltage generated by the CIS pixel; and
a switch transistor configured to transfer the charges transferred to the floating diffusion node to the DVS pixel in a second mode to generate a second image data based on the event signal generated by the DVS pixel, and
wherein the readout circuit comprises:
a drive transistor configured to output the voltage of the floating diffusion node as the output voltage in the first mode; and
a select transistor configured to select the CIS pixel in the first mode.
7. The image sensor of claim 6 , further comprises:
an image signal processor configured to selectively control the image sensor to generate the first image data of the image sensor based on the output voltage generated by the CIS pixel and generate second image data based on the event signal generated by the DVS pixel.
8. The image sensor of claim 6 , wherein the DVS pixel comprises:
a photoreceptor configured to output a log voltage based on a photocurrent corresponding to the charges generated by the photoelectric conversion device; and
a DVS pixel back-end circuit configured to amplify the log voltage, compare the amplified log voltage to a comparison voltage, determine the change in intensity based on a result of comparing the amplified log voltage to the comparison voltage, and output the event signal based on the change in intensity.
9. The image sensor of claim 6 , further comprises:
a first substrate on which a CIS pixel array including the CIS pixel is formed; and
a second substrate on which a DVS pixel array including the DVS pixel is formed,
wherein the first substrate and the second substrate are connected in a Cu-to-Cu bonding manner.
10. The image sensor of claim 6 , wherein the DVS pixel does not include any photoelectric conversion device.
11. An image sensor comprising:
a CMOS image sensor (CIS) pixel, the CIS pixel comprising:
a photoelectric conversion device configured to generate charges corresponding to an incident light that is incident on the CIS pixel;
a drive transistor configured to generate an output voltage corresponding to the charges stored in a floating diffusion node;
a reset transistor configured to reset a voltage of the floating diffusion node in a first mode to generate a first image data of the image sensor based on the output voltage generated by the CIS pixel; and
a first select transistor configured to select the CIS pixel in the first mode; and
a dynamic vision sensor (DVS) pixel configured to detect a change in intensity of the incident light based on the charges generated by the photoelectric conversion device, and output an event signal based on the change in intensity,
wherein the reset transistor further configured to connect the floating diffusion node to the DVS pixel in a second mode to generate a second image data based on the event signal generated by the DVS pixel.
12. The image sensor of claim 11 , further comprises:
a transfer transistor configured to transfer the charges generated by the photoelectric conversion device to the floating diffusion node; and
a second select transistor configured to control activation of the transfer transistor, in the first mode and the second mode.
13. The image sensor of claim 11 , wherein the first and the second selection transistors are activated in response to a selection voltage.
14. The image sensor of claim 11 , further comprises:
an image signal processor configured to selectively control the image sensor to generate first image data of the image sensor based on the output voltage generated by the CIS pixel and generate second image data based on the event signal generated by the DVS pixel.
15. The image sensor of claim 11 , wherein the DVS pixel comprises:
a photoreceptor configured to output a log voltage based on a photocurrent corresponding to the charges generated by the photoelectric conversion device; and
a DVS pixel back-end circuit configured to amplify the log voltage, compare the amplified log voltage to a comparison voltage, determine the change in intensity based on a result of comparing the amplified log voltage to the comparison voltage, and output the event signal based on the change in intensity.
16. The image sensor of claim 11 , further comprises:
a first substrate on which a CIS pixel array including the CIS pixel is formed; and
a second substrate on which a DVS pixel array including the DVS pixel is formed,
wherein the first substrate and the second substrate are connected in a Cu-to-Cu bonding manner.
17. The image sensor of claim 11 , wherein the DVS pixel does not include any photoelectric conversion device.
18. An image sensor comprising:
a complementary metal-oxide semiconductor image sensor (CIS) pixel, the CIS pixel comprising:
a first photoelectric conversion device configured to generate charges corresponding to an incident light that is incident on the CIS pixel;
a second photoelectric conversion device configured to generate charges corresponding to the incident light that is incident on the CIS pixel;
a first transfer transistor configured to transfer the charges generated by the first photoelectric conversion device to a floating diffusion node;
a second transfer transistor configured to transfer the charges generated by the second photoelectric conversion device to the floating diffusion node;
a drive transistor configured to generate an output voltage corresponding to charges of the floating diffusion node;
a reset transistor configured to reset a voltage of the floating diffusion node in a first mode to generate first image data of the image sensor based on the output voltage generated by the CIS pixel; and
a select transistor configured to select the CIS pixel in the first mode; and
a dynamic vision sensor (DVS) pixel configured to detect a change in intensity of the incident light based on the charges generated by the first and the second photoelectric conversion devices, and output an event signal based on the change in intensity,
wherein the reset transistor further configured to connect the floating diffusion node to the DVS pixel in a second mode to generate second image data based on the event signal generated by the DVS pixel.
19. The image sensor of claim 18 , further comprises:
an image signal processor configured to selectively control the image sensor to generate first image data of the image sensor based on the output voltage generated by the CIS pixel and generate second image data based on the event signal generated by the DVS pixel.
20. The image sensor of claim 18 , wherein the DVS pixel comprising:
a photoreceptor configured to output a log voltage based on a photocurrent corresponding to the charges generated by at least one of the first and second photoelectric conversion devices; and
a DVS pixel back-end circuit configured to amplify the log voltage, compare the amplified log voltage to a comparison voltage, determine the change in intensity based on a result of comparing the amplified log voltage to the comparison voltage, and output the event signal based on the change in intensity.
21. The image sensor of claim 18 , further comprises:
a first substrate on which a CIS pixel array including the CIS pixel is formed; and
a second substrate on which a DVS pixel array including the DVS pixel is formed,
wherein the first substrate and the second substrate are connected in a Cu-to-Cu bonding manner.
22. The image sensor of claim 18 , wherein the DVS pixel does not include any photoelectric conversion device.