Inspection device and inspection method

1. An inspection device comprising:

a memory storing a parameter representing a feature of image data of an object having no defect by performing dimensionality reduction for reducing a dimensionality of data on the image data of the object having no defect; and

processing circuitry configured to

perform dimensionality reduction on image data of an object to be inspected using the parameter stored in memory;

generate restored data obtained by restoring a vector resulting from the dimensionality reduction of the image data of the object to be inspected;

filter the restored data by using a filter for correcting an error between the restored data and the image data of the object to be inspected, thereby generating corrected restored data;

output a determination result indicating whether the object to be inspected is defective, on a basis of a magnitude of a difference of each pixel between the image data of the object to be inspected and the corrected restored data; and

an interface to output the determination result.

2. The inspection device of claim 1 , wherein the filter is a Wiener filter.

3. The inspection device of claim 1 , wherein when at least one of the differences is not less than a threshold value, the processing circuitry outputs a determination result indicating that the object to be inspected is defective.

4. The inspection device of claim 1 , wherein the dimensionality reduction uses principal component analysis.

5. The inspection device of claim 1 , wherein the dimensionality reduction uses an autoencoder using a neural network.

6. The inspection device of claim 5 , wherein the processing circuitry generates the restored data by using the parameter.

7. The inspection device of claim 3 , wherein

the processing circuitry calculates a bounding box that is a rectangle circumscribing a region where the difference is not less than the threshold value and a determination result indicating that the object to be inspected is defective is output; and

the interface outputs, as the determination result, the bounding box.

8. The inspection device of claim 7 , wherein the interface performs the output so that a defective portion of the image data of the object to be inspected determined on a basis of the bounding box is indicated by a dotted line superimposed on the image data of the object to be inspected.

9. The inspection device of claim 7 , wherein the interface outputs difference composite image data obtained by combining image data of the difference with the image data of the object to be inspected.

10. The inspection device of claim 1 , wherein when the processing circuitry outputs a determination result indicating that the object to be inspected is defective, the interface performs the output so that a message for informing that a defect has been detected is displayed.

11. The inspection device of claim 1 , further comprising a display to display the determination result output by the interface.

12. An inspection method comprising:

calculating a parameter representing a feature of image data of an object having no defect by performing dimensionality reduction for reducing a dimensionality of data on the image data of the object having no defect, and performing dimensionality reduction on image data of an object to be inspected by using the parameter stored in a storage medium;

generating restored data obtained by restoring a vector resulting from the dimensionality reduction of the image data of the object to be inspected;

filtering the restored data by using a filter for correcting an error between the restored data and the image data of the object to be inspected, thereby generating corrected restored data;

outputting a determination result indicating whether the object to be inspected is defective, on a basis of a magnitude of a difference of each pixel between the image data of the object to be inspected and the corrected restored data; and

outputting the determination result.