Method of fabricating broad-band lattice-matched omnidirectional distributed Bragg reflectors using random nanoporous structures
A method of forming and a random Distributed Bragg Reflector (DBR) is disclosed. The random DBR includes a substrate and a plurality of alternating layers of lattice-matched nanoporous GaN (NP-GaN) and GaN formed on a top surface of the substrate, wherein at least one of the alternating layers has a thickness of λ/4n and an adjacent one of the alternating layers does not have a thickness of λ/4n, wherein λ is a wavelength of incident radiation and n is the refractive index of a particular layer of the plurality of alternating layers.
1. A random Distributed Bragg Reflector (DBR) comprising:
a substrate; and
a plurality of alternating layers of lattice-matched nanoporous GaN (NP-GaN) and GaN with random thickness disposed on a top surface of the substrate forming the random DBR, wherein at least one of the alternating layers has a thickness of λ/4n and an adjacent one of the alternating layers does not have a thickness of λ/4n, wherein λ is a wavelength of incident radiation and n is the refractive index of a particular layer of the plurality of alternating layers.
2. The random DBR of claim 1 , wherein the NP-GaN is formed by electrochemical-based porosification of a highly Si-doped GaN layers grown by metal-organic chemical vapor deposition (MOCVD), molecular-beam epitaxy (MBE), or atomic layer deposition (ALD) in an electrolyte solution.
3. The random DBR of claim 2 , wherein the alternating layers of lattice-matched NP-GaN and GaN are formed by selectively-doped GaN using MOCVD followed by electrochemical process.
4. The random DBR of claim 1 , wherein the NP-GaN can be tuned to have a refractive index of around 1 to around 2.5 depending on a porosity of the NP-GaN.
5. The random DBR of claim 1 , wherein the random DBR has a reflectivity range for incident radiation of about 200 nm to about 900 nm depending on the index of refraction of the nanoporous GaN, the layer thicknesses, and the number of layer periods.
6. The random DBR of claim 1 , wherein the substrate comprises sapphire, Si, SiC, or freestanding GaN.
7. The random DBR of claim 1 , wherein a thickness of each NP-GaN layer is the same.
8. The random DBR of claim 1 , wherein a thickness of each GaN is not the same.
9. A method of forming a random Distributed Bragg Reflector (DBR) comprising:
forming a plurality of alternating layers of lattice-matched nanoporous GaN (NP-GaN) and GaN with random thickness disposed on a top surface of the substrate forming the random DBR, wherein at least one of the alternating layers has a thickness of λ/4n and an adjacent one of the alternating layers does not have a thickness of λ/4n, wherein λ is a wavelength of incident radiation and n is the refractive index of a particular layer of the plurality of alternating layers.
10. The method claim 9 , wherein the NP-GaN is formed by electrochemical-based porosification of a highly Si-doped GaN layers grown by metal-organic chemical vapor deposition (MOCVD), molecular-beam epitaxy (MBE), or atomic layer deposition (ALD) in an electrolyte solution.
11. The method of claim 10 , wherein the alternating layers of lattice-matched NP-GaN and GaN are formed by selectively-doped GaN using MOCVD followed by electrochemical process.
12. The method of claim 9 , wherein the NP-GaN can be tuned to have a refractive index of around 1 to around 2.5 depending on a porosity of the NP-GaN.
13. The method of claim 9 , wherein the random DBR has a reflectivity range for incident radiation of about 200 nm to about 900 nm depending on the index of refraction of the nanoporous GaN, the layer thicknesses, and the number of layer periods.
14. The method of claim 9 , wherein the substrate comprises sapphire, Si, SiC, or freestanding GaN.
15. The method of claim 9 , wherein a thickness of each NP-GaN layer is the same.
16. The method of claim 9 , wherein a thickness of each GaN is not the same.
17. The method of claim 9 , wherein layers of GaN are arranged in descending order or ascending order based on thickness or grouped with other layers of a common thickness.
18. The method of claim 9 , wherein the nanoporous GaN comprises a ternary arrangement comprising AlGaN or InGaN.
19. A waveguide comprising:
a first random Distributed Bragg Reflector (DBR) comprising: a first substrate; and a first set of a plurality of alternating layers of lattice-matched nanoporous GaN (NP-GaN) and GaN formed on a top surface of the substrate, wherein at least one of the first set of alternating layers has a thickness of λ/4n and an adjacent one of the first set of alternating layers does not have a thickness of λ/4n, wherein λ is a wavelength of incident radiation and n is the refractive index of a particular layer of the plurality of alternating layers;
a second random Distributed Bragg Reflector (DBR) comprising: a second substrate; and a second set of a plurality of alternating layers of lattice-matched nanoporous GaN (NP-GaN) and GaN formed on a top surface of the first random DBR, wherein at least one of the second set of alternating layers has a thickness of λ/4n and an adjacent one of the second set of alternating layers does not have a thickness of λ/4n,
wherein spectra light propagating through a separation of the first DBR and the second DBR via total internal reflection.
20. A light emitting diode (LED) device comprising:
a LED; and
a back reflector configured to reflect light from the LED, wherein the back reflector comprises a random Distributed Bragg Reflector (DBR) comprising: a substrate; and a plurality of alternating layers of lattice-matched nanoporous GaN (NP-GaN) and GaN with random thickness formed on a top surface of the substrate, wherein at least one of the alternating layers has a thickness of λ/4n and an adjacent one of the alternating layers does not have a thickness of λ/4n, wherein λ is a wavelength of incident radiation and n is the refractive index of a particular layer of the plurality of alternating layers.