IP Library Granted Patent US 11,654,526
Granted Patent B2
US 11,654,526 · App. 16/650,597 · Granted May 23, 2023

Polishing pad and method for manufacturing same

Inventors: Hirohito Miyasaka (Saijo, JP); Teppei Tateno (Saijo, JP); Ryuma Matsuoka (Saijo, JP); Hiroshi Kurihara (Saijo, JP); Takumi Mikuni (Saijo, JP)
Assignee: Fujibo Holdings, Inc.
B24B37/24B24B37/00B24B37/26B24D3/28H01L21/304
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Quick Facts
Patent No.
US 11,654,526
App. No.
16/650,597
Granted
May 23, 2023
Kind
B2
Abstract

A polishing pad includes: a polishing layer having a polyurethane sheet containing substantially spherical cells, wherein E′(90%)/E′(30%) falls within a range of 0.4 to 0.7, where E′(90%) represents a storage modulus of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 90%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz, and E′(30%) represents a storage modulus of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 30%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz. Also provided is a method for manufacturing the polishing pad.

Claims (24)

1. A polishing pad comprising:

a polishing layer having a polyurethane sheet containing substantially spherical cells, wherein

E′(90%)/E′(30%) falls within a range of 0.5 to 0.62,

where

E′(90%) represents a storage modulus of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 90%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz, and

E′(30%) represents a storage modulus of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 30%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz.

2. The polishing pad according to claim 1 , wherein

KEL(90%)/KEL(30%) falls within a range of 2 to 4,

Where

KEL means energy loss factor defined by the following equation:

KEL =tan δ×10 12 /( E ′×(1+tan δ 2 ),

wherein tan δ is E″/E′, E″ is a loss modulus and E′ is a storage modulus,

KEL(90%) represents KEL of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 90%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz, and

KEL(30%) represents KEL of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 30%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz.

3. The polishing pad according to claim 1 , wherein

E′(30%) of the polyurethane sheet is 280 to 600 MPa.

4. The polishing pad according to claim 1 , wherein

KEL(90%) of the polyurethane sheet is 450 to 1500 1/Pa,

KEL means energy loss factor defined by the following equation:

KEL =tan δ×10 12 /( E ′×(1+tan δ 2 ),

wherein tan δ is E″/E′, E″ is a loss modulus and E′ is a storage modulus,

KEL(90%) represents KEL of the polyurethane sheet that has been exposed to an environment with a temperature of 23° C. and a relative humidity of 90%, as measured in a tension mode at 40° C. with an initial load of 148 g, a strain range of 0.1%, and a measurement frequency of 1.6 Hz.

5. The polishing pad according to claim 1 , wherein

the polyurethane sheet contains hollow bodies having an average particle size 10 to 150 μm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2020
From: MIYASAKA, HIROHITO; TATENO, TEPPEI; MATSUOKA, RYUMA; KURIHARA, HIROSHI
To: FUJIBO HOLDINGS, INC.
Reel/Frame 052223/0896 →
Priority Claims (1)
JP JP2017-198435 · Oct 12, 2017 · national
Continuity (1)
Related Publication 20200230780A1 · Jul 23, 2020
Cited By (1)
US 12,515,295