IP Library Granted Patent US 11,656,099
Granted Patent B2
US 11,656,099 · App. 17/330,899 · Granted May 23, 2023

Rotation angle detector

Inventor: Takumi Yoshiya (Yokohama, JP)
Assignee: MELEXIS TECHNOLOGIES SA
G01D5/145
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Quick Facts
Patent No.
US 11,656,099
App. No.
17/330,899
Granted
May 23, 2023
Kind
B2
Abstract

A rotation angle detector includes a magnet arranged to rotate, and a magnetic detection circuit provided with a first pair of magnetic detection elements arranged to be in combination sensitive to a first magnetic field in circumferential direction to the first surface and to a second magnetic field in normal direction to the first surface and arranged away from the rotation axis, and configured to detect magnetic flux of the magnet. A second pair of magnetic detection elements are arranged to be in combination sensitive to the first magnetic field in circumferential direction to the first surface and to the second magnetic field in normal direction to the first surface. A signal processing unit is configured to output a signal representative of a rotation angle of the magnet based on outputs of the first and second pair of magnetic detection elements.

Claims (8)

1. An integrated circuit comprising a substrate having a surface and comprising a magnetic detection circuit provided with

at least two first magnetic detection elements arranged to detect a first magnetic field in a direction parallel to said surface of said substrate at a first detection point and to detect a second magnetic field in normal direction to said surface of said substrate at said first detection point,

at least two second magnetic detection elements arranged to detect said first magnetic field in said direction parallel to said surface of said substrate at a second detection point and to detect said second magnetic field in said normal direction to said surface of said substrate at said second detection point, wherein said second detection point is arranged with a predetermined interval from said first detection point in said parallel direction to said surface of said substrate, and

a signal processing unit configured to output a signal based on outputs of said at least two first and said at least two second magnetic detection elements.

2. The integrated circuit as in claim 1 , wherein the at least two first magnetic detection elements and the at least two second magnetic field sensing elements comprise Hall plates.

3. The integrated circuit as in claim 1 , wherein said signal processing unit is arranged to determine a first magnetic flux density difference in said normal direction to said surface and a second magnetic flux density difference in said direction parallel to said surface, from outputs of said first magnetic detection elements and said second magnetic detection elements, and to output a signal based on said first and said second magnetic flux density difference.

4. The integrated circuit as in claim 3 , wherein said signal processing unit is arranged to receive a maximum value of an amplitude of said first magnetic flux density difference and a maximum value of an amplitude of said second magnetic flux density difference, and arranged to normalize said amplitudes of said first and said second magnetic flux density difference in accordance with the maximum values of said amplitudes of said first and said second magnetic flux density difference.

5. The integrated circuit as in claim 4 , wherein said signal processing unit is operable in a calibration mode to determine the maximum value of an amplitude of said first magnetic flux density difference and the maximum value of an amplitude of said second magnetic flux density difference.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 26, 2021
From: YOSHIYA, TAKUMI
To: MELEXIS TECHNOLOGIES SA
Reel/Frame 056359/0219 →
Priority Claims (1)
JP JP2017-123981 · Jun 26, 2017 · national
Continuity (3)
Continuation 16901776 · Jun 15, 2020
Continuation 16017327 · Jun 25, 2018
Related Publication 20210278247A1 · Sep 9, 2021