Sample analysis apparatus and method

1. A sample analysis apparatus, comprising:

a creation unit which creates a plurality of one-dimensional maps based on a plurality of spectrums generated in order of time sequence by detecting electromagnetic waves from a sample, and which further creates a contour map in two-dimensional map form by arranging the plurality of one-dimensional maps in order of time sequence; and

a display device which displays the contour map.

2. The sample analysis apparatus according to claim 1 , wherein

the creation unit converts, for each of the spectrums, respective intensities constituting the spectrum into colors in accordance with a color conversion condition, and thereby creates the one-dimensional maps, and

the contour map is a color map.

3. The sample analysis apparatus according to claim 1 , wherein

the electromagnetic waves are characteristic X-rays, and

during a measurement process in which an electron beam is continuously irradiated on the sample, the plurality of spectrums are generated at uniform time intervals.

4. The sample analysis apparatus according to claim 3 , wherein

during the measurement process, thermal energy, electric energy, or kinetic energy, which is energy other than the electron beam, is continuously applied to the sample.

5. The sample analysis apparatus according to claim 1 , further comprising

a determination unit that determines a timepoint at which a state change of the sample occurred based on an inconsistency included in the contour map.

6. The sample analysis apparatus according to claim 5 , wherein

the contour map has a time axis, and

the determination unit determines the timepoint at which the state change of the sample occurred based on a position of the inconsistency on the time axis.

7. The sample analysis apparatus according to claim 6 , further comprising

a means for setting a sample analysis period as a period before the timepoint at which the state change of the sample occurred.

8. The sample analysis apparatus according to claim 1 , further comprising

a difference contour map creation unit that creates a plurality of one-dimensional difference maps based on the plurality of spectrums, and further creates a difference contour map in a form of a two-dimensional difference map by arranging the plurality of one-dimensional difference maps in order of time sequence.

9. The sample analysis apparatus according to claim 1 , further comprising

a waveform array creation unit that creates a waveform array by arranging, in order of time sequence, a plurality of waveforms indicative of the plurality of spectrums.

10. The sample analysis apparatus according to claim 1 , further comprising

a spectroscope that detects characteristic X-rays, which are the electromagnetic waves, and generates the plurality of spectrums.

11. A sample analysis method, comprising:

a step of generating a plurality of spectrums in order of time sequence by detecting electromagnetic waves from a sample;

a step of creating a plurality of one-dimensional maps based on the plurality of spectrums; and

a step of creating a contour map in two-dimensional map form by arranging the plurality of one-dimensional maps in order of time sequence.

12. The sample analysis method according to claim 11 , further comprising:

a step of determining a timepoint at which a state change of the sample occurred based on a position of an inconsistency included in the contour map; and

a step of setting a sample analysis period as a period before the timepoint at which the state change of the sample occurred.