IP Library › Granted Patent US 11,672,183
Granted Patent B2
US 11,672,183 · App. 16/803,051 · Granted Jun 6, 2023

Magnetic memory device having a ferromagnetic element

Inventors: Sang Hwan Park (Hwaseong-si, KR); Jae Hoon Kim (Seoul, KR); Younghyun Kim (Seoul, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L43/02H01F10/329H01F10/3254H01F10/3268H01F10/3286H01L27/228G11C11/161G11C11/1659H01L43/10H01L43/12
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Quick Facts
Patent No.
US 11,672,183
App. No.
16/803,051
Granted
Jun 6, 2023
Kind
B2
Abstract

A magnetic memory device includes a reference magnetic structure, a free magnetic structure, and a tunnel barrier pattern therebetween. The reference magnetic structure includes a first pinned pattern, a second pinned pattern between the first pinned pattern and the tunnel barrier pattern, and an exchange coupling pattern between the first pinned pattern and the second pinned pattern. The second pinned pattern includes magnetic patterns and non-magnetic patterns, which are alternately stacked. The first pinned pattern is a ferromagnetic pattern consisted of a ferromagnetic element.

Claims (56)

1. A magnetic memory device comprising:

a reference magnetic structure including a first pinned pattern, a second pinned pattern including magnetic patterns and non-magnetic patterns, which are alternately stacked, and an exchange coupling pattern between the first pinned pattern and the second pinned pattern, the first pinned pattern directly contacting a seed pattern and the exchange coupling pattern;

a free magnetic structure; and

a tunnel barrier pattern between the reference magnetic structure and the free magnetic structure,

wherein the second pinned pattern is between the first pinned pattern and the tunnel barrier pattern,

the first pinned pattern is a ferromagnetic pattern, the ferromagnetic pattern consisting of a single ferromagnetic element,

wherein the magnetic patterns include,

a first ferromagnetic pattern between the exchange coupling pattern and the tunnel barrier pattern, and

a second ferromagnetic pattern between the first ferromagnetic pattern and the tunnel barrier pattern, and

wherein the non-magnetic patterns include,

a first non-magnetic pattern between the first ferromagnetic pattern and the second ferromagnetic pattern,

wherein the exchange coupling pattern anti-ferromagnetically couples the first ferromagnetic pattern to the first pinned pattern,

wherein each of the first pinned pattern and the first ferromagnetic pattern have a thickness in a direction perpendicular to an interface between the tunnel barrier pattern and the free magnetic structure, and

wherein the thickness of the first pinned pattern is greater than or equal to the thickness of the first ferromagnetic pattern.

2. The magnetic memory device of claim 1 , wherein the first pinned pattern is a single layer including the ferromagnetic element.

3. The magnetic memory device of claim 1 , wherein the first pinned pattern does not include a non-magnetic element.

4. The magnetic memory device of claim 1 ,

wherein the second ferromagnetic pattern has a thickness in the direction perpendicular to the interface between the tunnel barrier pattern and the free magnetic structure, and

wherein the thickness of the first pinned pattern is greater than the thickness of the second ferromagnetic pattern.

5. The magnetic memory device of claim 4 , wherein the thickness of the first ferromagnetic pattern is greater than the thickness of the second ferromagnetic pattern.

6. The magnetic memory device of claim 1 , wherein the first non-magnetic pattern anti-ferromagnetically couples the second ferromagnetic pattern to the first ferromagnetic pattern.

7. The magnetic memory device of claim 1 , wherein a ferromagnetic material included in the first ferromagnetic pattern is the same as a ferromagnetic material included in the first pinned pattern.

8. The magnetic memory device of claim 1 , wherein a ferromagnetic material included in the second ferromagnetic pattern is the same as the ferromagnetic material included in the first pinned pattern.

9. The magnetic memory device of claim 1 , wherein the magnetic patterns further include,

a polarization enhancement magnetic pattern between the second ferromagnetic pattern and the tunnel barrier pattern,

wherein the non-magnetic patterns further include,

a second non-magnetic pattern between the second ferromagnetic pattern and the polarization enhancement magnetic pattern,

wherein the second non-magnetic pattern ferromagnetically couples the polarization enhancement magnetic pattern to the second ferromagnetic pattern.

10. The magnetic memory device of claim 9 , wherein the first non-magnetic pattern anti-ferromagnetically couples the second ferromagnetic pattern to the first ferromagnetic pattern.

11. The magnetic memory device of claim 9 , wherein the first non-magnetic pattern includes a non-magnetic element that is not included from among the non-magnetic elements included in the second non-magnetic pattern.

12. The magnetic memory device of claim 1 ,

wherein the first pinned pattern is between the seed pattern and the exchange coupling pattern, and

wherein the seed pattern includes a portion that contacts one surface of the first pinned pattern.

13. The magnetic memory device of claim 12 , wherein the seed pattern comprises:

a first sub-pattern; and

a second sub-pattern between the first sub-pattern and the first pinned pattern and having a portion in contact with the first pinned pattern,

wherein at least a portion of the first sub-pattern is amorphous.

14. A magnetic memory device comprising:

a reference magnetic structure including a first pinned pattern, a second pinned pattern including magnetic patterns and non-magnetic patterns, which are alternately stacked, and an exchange coupling pattern between the first pinned pattern and the second pinned pattern;

a free magnetic structure;

a tunnel barrier pattern between the reference magnetic structure and the free magnetic structure; and

a seed pattern spaced apart from the tunnel barrier pattern with the reference magnetic structure interposed therebetween,

wherein the second pinned pattern is between the first pinned pattern and the tunnel barrier pattern,

the first pinned pattern is a single layer consisting of a single ferromagnetic element,

a surface of the first pinned pattern directly contacts the seed pattern and an opposite surface of the first pinned pattern directly contacts the exchange coupling pattern, and

wherein the magnetic patterns comprise:

a first ferromagnetic pattern between the exchange coupling pattern and the tunnel barrier pattern, and

wherein the exchange coupling pattern anti-ferromagnetically couples the first ferromagnetic pattern to the first pinned pattern.

15. The magnetic memory device of claim 14 , wherein each of the first pinned pattern and the first ferromagnetic pattern have a thickness in a direction perpendicular to an interface between the tunnel barrier pattern and the free magnetic structure, and

wherein the thickness of the first pinned pattern is greater than or equal to the thickness of the first ferromagnetic pattern.

16. The magnetic memory device of claim 15 , wherein a ferromagnetic material included in the first ferromagnetic pattern is the same as a ferromagnetic material included in the first pinned pattern.

17. The magnetic memory device of claim 14 , wherein the magnetic patterns further include,

a second ferromagnetic pattern between the first ferromagnetic pattern and the tunnel barrier pattern,

wherein the non-magnetic patterns include,

a first non-magnetic pattern between the first ferromagnetic pattern and the second ferromagnetic pattern, and

wherein the first non-magnetic pattern anti-ferromagnetically couples the second ferromagnetic pattern is to the first ferromagnetic pattern.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2020
From: PARK, SANG HWAN; KIM, JAE HOON; KIM, YOUNGHYUN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 051997/0746 →
Priority Claims (1)
KR 10-2019-0087335 · Jul 19, 2019 · national
Continuity (1)
Related Publication 20210020829A1 · Jan 21, 2021