IP Library Granted Patent US 11,675,511
Granted Patent B2
US 11,675,511 · App. 17/846,378 · Granted Jun 13, 2023

Associating multiple cursors with block family of memory device

Inventors: Michael Sheperek (Longmont, CO); Bruce A. Liikanen (Berthoud, CO); Peter Feeley (Boise, ID); Larry J. Koudele (Erie, CO); Shane Nowell (Boise, ID); Steven Michael Kientz (Westminster, CO)
Assignee: Micron Technology, Inc.
G06F3/064G06F3/0604G06F3/0679
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Quick Facts
Patent No.
US 11,675,511
App. No.
17/846,378
Granted
Jun 13, 2023
Kind
B2
Abstract

An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to perform operations comprising assigning a plurality of data streams to a block family comprising a plurality of blocks of a memory device; responsive to programming a first block associated with a first data stream of the plurality of data streams, associating the first block with the block family; and responsive to programming a second block associated with a second data stream of the plurality of data streams, associating the second block with the block family.

Claims (58)

1. A system comprising:

a memory device; and

a processing device, operatively coupled to the memory device, to perform operations comprising:

assigning a plurality of data streams to a block family comprising a plurality of blocks of a memory device;

responsive to programming a first block associated with a first data stream of the plurality of data streams, associating the first block with the block family;

responsive to programming a second block associated with a second data stream of the plurality of data streams, associating the second block with the block family; and

associating the block family with a threshold voltage offset bin which defines a set of threshold voltage offsets to be applied to a base voltage read level during read operations.

2. The system of claim 1 , wherein the processing device is further to perform operations comprising:

determining a threshold voltage offset associated with the block family;

computing a modified threshold voltage by applying the threshold voltage offset to a base read level voltage associated with the memory device; and

reading, using the modified threshold voltage, data from the first block.

3. The system of claim 1 , wherein the processing device is further to perform operations comprising:

opening the block family; and

closing the block family in response to failing to detect an active data programming thread.

4. The system of claim 1 , wherein the first block resides on a first die of the memory device and the second block resides on a second die of the memory device.

5. The system of claim 1 , wherein associating the first block with the block family further comprises:

appending, to block family metadata, a record associating the first block with the block family.

6. The system of claim 1 , wherein the processing device is further to perform operations comprising:

responsive to creating the block family, associating the block family with the threshold voltage offset bin.

7. The system of claim 6 , wherein the processing device is further to perform operations comprising:

responsive to detecting a triggering event, associating the block family with another threshold voltage offset bin.

8. A method comprising:

assigning, by a processor, a plurality of data streams to a block family comprising a plurality of blocks of a memory device;

responsive to programming a first block associated with a first data stream of the plurality of data streams, associating the first block with the block family;

responsive to programming a second block associated with a second data stream of the plurality of data streams, associating the second block with the block family; and

associating the block family with a threshold voltage offset bin which defines a set of threshold voltage offsets to be applied to a base voltage read level during read operations.

9. The method of claim 8 , further comprising:

determining a threshold voltage offset associated with the block family;

computing a modified threshold voltage by applying the threshold voltage offset to a base read level voltage associated with the memory device; and

reading, using the modified threshold voltage, data from the first block.

10. The method of claim 8 , further comprising:

opening the block family; and

closing the block family in response to failing to detect an active data programming thread.

11. The method of claim 8 , wherein the first block resides on a first die of the memory device and the second block resides on a second die of the memory device.

12. The method of claim 8 , wherein associating the first block with the block family further comprises:

appending, to block family metadata, a record associating the first block with the block family.

13. The method of claim 8 , further comprising:

responsive to creating the block family, associating the block family with the threshold voltage offset bin.

14. The method of claim 13 , further comprising:

responsive to detecting a triggering event, associating the block family with another threshold voltage offset bin.

15. A non-transitory computer-readable storage medium comprising instructions that,

when executed by a processing device operatively coupled to a memory device, perform operations comprising:

assigning, by a processor, a plurality of data streams to a block family comprising a plurality of blocks of a memory device;

responsive to programming a first block associated with a first data stream of the plurality of data streams, associating the first block with the block family;

responsive to programming a second block associated with a second data stream of the plurality of data streams, associating the second block with the block family; and

associating the block family with a threshold voltage offset bin which defines a set of threshold voltage offsets to be applied to a base voltage read level during read operations.

16. The non-transitory computer-readable storage medium of claim 15 , wherein the processing device is further to perform operations comprising:

determining a threshold voltage offset associated with the block family;

computing a modified threshold voltage by applying the threshold voltage offset to a base read level voltage associated with the memory device; and

reading, using the modified threshold voltage, data from the first block.

17. The non-transitory computer-readable storage medium of claim 15 , wherein the processing device is further to perform operations comprising:

opening the block family; and

closing the block family in response to failing to detect an active data programming thread.

18. The non-transitory computer-readable storage medium of claim 15 , wherein the first block resides on a first die of the memory device and the second block resides on a second die of the memory device.

19. The non-transitory computer-readable storage medium of claim 15 , wherein associating the first block with the block family further comprises:

appending, to block family metadata, a record associating the first block with the block family.

20. The non-transitory computer-readable storage medium of claim 15 , wherein the processing device is further to perform operations comprising:

responsive to creating the block family, associating the block family with the threshold voltage offset bin.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2023
From: SHEPEREK, MICHAEL; LIIKANEN, BRUCE A.; FEELEY, PETER; KOUDELE, LARRY J.; NOWELL, SHANE; KIENTZ, STEVEN MICHAEL
To: MICRON TECHNOLOGY, INC.
Reel/Frame 063978/0168 →
Continuity (3)
Continuation 17090171 · Nov 5, 2020
Provisional Application 63070003 · Aug 25, 2020
Related Publication 20220334721A1 · Oct 20, 2022