Chip package and manufacturing method thereof

1. A chip package, comprising:

a redistribution layer;

at least one first semiconductor chip and an integrated fan-out package, located on a surface of the redistribution layer and electrically communicated to each other therethrough, the at least one first semiconductor chip being in direct contact with the redistribution layer, wherein the integrated fan-out package comprises second semiconductor chips, an encapsulant encapsulating the second semiconductor chips and a redistribution circuit structure located between and electrically connected to the second semiconductor chips and the redistribution layer; and

an insulating encapsulation, encapsulating the at least one first semiconductor chip and the integrated fan-out package and covering a sidewall of the redistribution circuit structure.

2. The chip package of claim 1 , wherein the redistribution layer is overlapped with the at least one first semiconductor chip and the integrated fan-out package.

3. The chip package of claim 1 , wherein the integrated fan-out package comprises:

the redistribution circuit structure;

the second semiconductor chips, located on and electrically connected to the redistribution circuit structure;

the encapsulant, wherein a sidewall of the redistribution circuit structure is substantially aligned with a sidewall of the encapsulant; and

conductive features, located on and electrically connected to the redistribution circuit structure, wherein the redistribution circuit structure is located between the encapsulant and the conductive features.

4. The chip package of claim 3 , wherein the redistribution circuit structure is a redistribution circuit layer, and the integrated fan-out package further comprises:

connecting wirings, encapsulated in the encapsulant, wherein the second semiconductor chips are electrically connected to the redistribution circuit layer through the connecting wirings.

5. The chip package of claim 3 , wherein the redistribution circuit structure is a redistribution circuit layer, and the integrated fan-out package further comprises:

conductive pillars, disposed on the second semiconductor chips, wherein the second semiconductor chips are electrically connected to the redistribution circuit layer through the conductive pillars.

6. The chip package of claim 3 , wherein the redistribution circuit structure is a semiconductor circuit substrate, and the integrated fan-out package further comprises:

connecting wirings, encapsulated in the encapsulant, wherein the second semiconductor chips are electrically connected to the semiconductor circuit substrate through the connecting wirings.

7. The chip package of claim 3 , wherein the conductive features are exposed by the encapsulant, and sidewalls of the conductive features are physically contacted to the insulating encapsulation.

8. The chip package of claim 3 , wherein the conductive features are free of the encapsulant and the insulating encapsulation.

9. A chip package, comprising:

a redistribution layer;

at least one first semiconductor chip and an integrated fan-out package, located on a surface of the redistribution layer and electrically communicated to each other therethrough, and wherein the integrated fan-out package comprises:

a redistribution circuit structure; and

at least one second semiconductor chip and at least third semiconductor chip, located at a side of and electrically connected to the redistribution circuit structure; and

an insulating encapsulation, encapsulating the at least one first semiconductor chip and the integrated fan-out package.

10. The chip package of claim 9 , further comprising:

conductive elements, connecting to the redistribution layer, wherein the redistribution layer is located between the insulating encapsulation and the conductive elements, and

wherein the integrated fan-out package further comprises:

an encapsulant, encapsulating the at least one second semiconductor chip and the at least third semiconductor chip; and

conductive features, located on and electrically connected to the redistribution circuit structure, wherein the redistribution circuit structure is located between the encapsulant and the conductive features.

11. The chip package of claim 10 , wherein a pitch of two adjacent conductive elements of the conductive elements is greater than a pitch of two adjacent conductive features of the conductive features.

12. The chip package of claim 10 , wherein the redistribution circuit structure is a redistribution circuit layer, and the integrated fan-out package further comprises:

connecting wirings, encapsulated in the encapsulant,

wherein the at least one second semiconductor chip and the at least third semiconductor chip are electrically connected to the redistribution circuit layer through the connecting wirings, respectively.

13. The chip package of claim 10 , wherein the redistribution circuit structure is a redistribution circuit layer, and the integrated fan-out package further comprises:

at least one first conductive pillar, disposed on the at least one second semiconductor chip, wherein the at least one second semiconductor chip is electrically connected to the redistribution circuit layer through the at least one first conductive pillar; and

at least one second conductive pillar, disposed on the at least one third semiconductor chip, wherein the at least one third semiconductor chip is electrically connected to the redistribution circuit layer through the at least one second conductive pillar,

wherein the at least one first conductive pillar and the at least one second conductive pillar are encapsulated in the encapsulant.

14. The chip package of claim 10 , wherein the redistribution circuit structure is a semiconductor circuit substrate, and the integrated fan-out package further comprises:

connecting wirings, encapsulated in the encapsulant,

wherein the at least one second semiconductor chip and the at least third semiconductor chip are electrically connected to the semiconductor circuit substrate through the connecting wirings.

15. The chip package of claim 9 , wherein the at least one first semiconductor chip comprises:

a semiconductor substrate, having an active surface;

contact pads, distributed on the active surface;

contact pillars, connecting to the contact pads, respectively; and

a protection layer, located on the active surface and covering portions of the contact pads, wherein the contact pillars are embedded in and penetrate the protection layer,

wherein top surfaces of the contact pillars, a top surface of the protection layer, top surfaces of the conductive features, and a top surface of the insulating encapsulation are substantially leveled and coplanar to one another.

16. A manufacturing method of a chip package, comprising:

providing a first carrier;

disposing at least one first semiconductor chip and an integrated fan-out package on the first carrier, the integrated fan-out package comprising second semiconductor chips, an encapsulant encapsulating the second semiconductor chips and a redistribution circuit structure located between and electrically connected to the second semiconductor chips and the redistribution layer;

encapsulating the at least one first semiconductor chip and the integrated fan-out package in an insulating encapsulation, a sidewall of the redistribution circuit structure being covering by the insulating encapsulation;

forming a redistribution layer on the insulating encapsulation, the redistribution layer being electrically connected to the at least one first semiconductor chip and the integrated fan-out packager, the at least one first semiconductor chip being in direct contact with the redistribution layer, wherein the at least one first semiconductor chip and the integrated fan-out package are arranged side-by-side and on a surface of the redistribution layer, and the at least one first semiconductor chip and the integrated fan-out package are electrically communicated to each other through the redistribution layer;

disposing conductive elements on the redistribution layer, wherein the redistribution layer is located between the insulating encapsulation and the conductive elements; and

debonding the first carrier.

17. The manufacturing method of claim 16 , further comprising:

planarizing the insulating encapsulation to substantially level a top surface of the at least one first semiconductor chip, a top surface of the integrated fan-out package on the first carrier, and a top surface of the insulating encapsulation.

18. The manufacturing method of claim 16 , before disposing the at least one first semiconductor chip and the integrated fan-out package on the first carrier, further comprising forming the integrated fan-out package,

wherein forming the integrated fan-out package comprises:

providing a second carrier;

forming the redistribution circuit structure on the second carrier, the redistribution circuit structure comprising a redistribution circuit layer;

disposing the second semiconductor chips on a first side of the redistribution circuit structure;

disposing connecting wirings to electrically connect the second semiconductor chips to the redistribution circuit structure;

encapsulating the second semiconductor chips and the connecting wirings in the encapsulant;

debonding the second carrier to expose a second side of the redistribution circuit structure, the second side being opposite to the first side; and

forming conductive features on the second side of the redistribution circuit structure, the conductive features being electrically connected to the redistribution circuit structure and exposed by the encapsulant, so that the redistribution circuit structure being located between the encapsulant and the conductive features, and sidewalls of the conductive features being physically contacted to the insulating encapsulation.

19. The manufacturing method of claim 16 , before disposing the at least one first semiconductor chip and the integrated fan-out package on the first carrier, further comprising forming the integrated fan-out package,

wherein forming the integrated fan-out package comprises:

providing a second carrier;

forming conductive pillars on the second semiconductor chips;

disposing the second semiconductor chips on the second carrier;

encapsulating the second semiconductor chips in the encapsulant;

forming the redistribution circuit structure on the encapsulant, the redistribution circuit structure being electrically connected to the second semiconductor chips through the conductive pillars, the redistribution circuit structure comprising a redistribution circuit layer;

forming conductive features on the redistribution circuit structure, the conductive features being electrically connected to the redistribution circuit structure, and the redistribution circuit structure being located between the encapsulant and the conductive features, so that the conductive features being exposed by the encapsulant, and sidewalls of the conductive features being physically contacted to the insulating encapsulation; and

debonding the second carrier.

20. The manufacturing method of claim 16 , before disposing the at least one first semiconductor chip and the integrated fan-out package on the first carrier, further comprising forming the integrated fan-out package,

wherein forming the integrated fan-out package comprises:

providing the redistribution circuit structure comprising a semiconductor circuit substrate;

disposing the second semiconductor chips on the redistribution circuit structure;

disposing connecting wirings to electrically connect the second semiconductor chips to the redistribution circuit structure;

encapsulating the second semiconductor chips and the connecting wirings in the encapsulant; and

forming conductive features on the redistribution circuit structure, the conductive features being electrically connected to the redistribution circuit structure, and the redistribution circuit structure being located between the encapsulant and the conductive features, so that the conductive features being exposed by the encapsulant, and sidewalls of the conductive features being physically contacted to the insulating encapsulation.