Semiconductor burn-in oven chamber sealing

1. A semiconductor burn-in oven comprising:

a housing including a burn-in chamber and an opening to the burn-in chamber surrounded by a front face;

a heating device configured to heat the burn-in chamber;

testing circuitry configured to power semiconductor devices received within the burn-in chamber;

a door having open position, in which the burn-in chamber is accessible through the opening, and a closed position, in which the door covers the opening; and

a sealing mechanism configured to form a seal around the opening between an interior side of the door and the front face of the housing when the door is in the closed position, the sealing mechanism comprising at least one sealing member having a recessed position, in which a gap extends between the front face of the housing and the interior side of the door, and a sealing position, in which that at least one sealing member closes the gap and forms the seal.

2. The semiconductor burn-in oven of claim 1 , wherein:

the sealing mechanism includes a compressed air supply;

the sealing mechanism is configured to direct a flow of compressed air from the compressed air supply into an interior chamber of each sealing member to inflate each sealing member and transition each sealing member from the recessed position to the sealing position; and

the sealing mechanism is configured to direct a flow of air out of the interior chamber of each sealing member to transition each sealing member from the sealing position to the recessed position.

3. The semiconductor burn-in oven of claim 2 , wherein the sealing mechanism comprises:

an input valve configured to control the flow of compressed air from the compressed air supply to the interior chamber of each sealing member; and

an output valve configured to control the flow of air out of the interior chamber of each sealing member.

4. The semiconductor burn-in oven of claim 3 , wherein the sealing mechanism comprises a controller configured to control the input valve and the output valve.

5. The semiconductor burn-in oven of claim 1 , wherein:

each sealing member is attached to the housing; and

the burn-in oven includes a thermal break between the burn-in chamber and each of the sealing mechanisms.

6. The semiconductor burn-in oven of claim 5 , wherein:

the burn-in oven includes a plurality of brackets attached to the housing that support the at least one sealing member; and

the thermal break comprises a thermal insulator between each bracket and the housing.

7. The semiconductor burn-in oven of claim 6 , wherein the thermal insulator comprises a silicone seal.

8. The semiconductor burn-in oven of claim 1 , further comprising a motorized carriage configured to drive the door along an axis that extends along the front face of the housing between the open and closed positions.

9. The semiconductor burn-in oven of claim 1 , further comprising a hinge connecting the door to the housing, wherein the door is configured to swing on the hinge between the open and closed positions.

10. A semiconductor burn-in oven comprising:

a housing including a burn-in chamber and an opening to the burn-in chamber surrounded by a front face;

a heating device configured to heat the burn-in chamber;

testing circuitry configured to power semiconductor devices received within the burn-in chamber;

a door having open position, in which the burn-in chamber is accessible through the opening, and a closed position, in which the door covers the opening;

a motorized carriage configured to drive the door along an axis that extends along the front face of the housing between the open and closed positions; and

a sealing mechanism configured to form a seal around the opening between an interior side of the door and the front face of the housing when the door is in the closed position, the sealing mechanism comprising:

at least one sealing member each having a recessed position, in which a gap extends between the front face of the housing and the interior side of the door, and a sealing position, in which the at least one sealing member closes the gap and forms the seal; and

a supply of compressed air,

wherein:

the sealing mechanism is configured to direct a flow of compressed air from the compressed air supply into an interior chamber of each sealing member to inflate each sealing member and transition each sealing member from the recessed position to the sealing position; and

the sealing mechanism is configured to direct a flow of air out of the interior chamber of each sealing member to transition each sealing member from the sealing position to the recessed position.

11. The semiconductor burn-in oven of claim 10 , wherein the sealing mechanism comprises:

an input valve configured to control the flow of compressed air from the compressed air supply to the interior chamber of each sealing member; and

an output valve configured to control the flow of air out of the interior chamber of each sealing member.

12. The semiconductor burn-in oven of claim 11 , wherein the sealing mechanism comprises a controller configured to control the input valve and the output valve.

13. The semiconductor burn-in oven of claim 12 , wherein:

each sealing member is attached to the housing; and

the burn-in oven includes a thermal break between the burn-in chamber and each of the sealing mechanisms.

14. The semiconductor burn-in oven of claim 13 , wherein:

the burn-in oven includes a plurality of brackets attached to the housing that support the at least one sealing member; and

the thermal break comprises a thermal insulator between each bracket and the housing.

15. The semiconductor burn-in oven of claim 14 , wherein the thermal insulator comprises a silicone seal.

16. A method of operating a semiconductor burn-in oven, wherein the semiconductor burn-in oven comprises:

a housing defining a burn-in chamber and including an opening to the burn-in chamber surrounded by a front face of the housing;

a heating device configured to heat the burn-in chamber;

testing circuitry configured to power semiconductor devices received within the burn-in chamber;

a door having an open position, in which the burn-in chamber is accessible through the opening, and a closed position, in which the door covers the opening; and

a sealing mechanism comprising at least one sealing member,

wherein the method comprises:

moving the door from the open position to the closed position;

transitioning each sealing member from a recessed position, in which a gap extends between the front face of the housing and an interior side of the door, to a sealing position, in which each sealing member closes the gap and forms a seal between the front face of the housing and the interior side of the door.

17. The method of claim 16 , wherein transitioning each sealing member from the recessed position to the sealing position comprises directing a flow of air from a compressed air supply into an interior chamber of each sealing member.

18. The method of claim 17 , further comprising transitioning each sealing member from the sealing position to the recessed position comprising discharging air from within the interior chamber of each sealing member.

19. The method of claim 18 , further comprising controlling the transitioning of the at least sealing member from the recessed position to the sealing position using a controller and an input valve, and controlling the transitioning of the at least one sealing member from the sealing position to the recessed position using the controller and an output valve.

20. The method of claim 19 , wherein moving the door from the open position to the closed position comprises driving the door along an axis that extends along the front face of the housing using a motorized carriage.