IP Library › Granted Patent US 11,696,398
Granted Patent B2
US 11,696,398 · App. 17/209,203 · Granted Jul 4, 2023

Anodic aluminum oxide structure, probe head having same, and probe card having same

Inventors: Bum Mo Ahn (Suwon-si, KR); Seung Ho Park (Hwaseong-si, KR); Dong Eun Lee (Pyeongtaek-si, KR)
H05K1/0306G01R1/07378H05K1/115H05K2201/09618
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Quick Facts
Patent No.
US 11,696,398
App. No.
17/209,203
Granted
Jul 4, 2023
Kind
B2
Abstract

Proposed are an anodic aluminum oxide structure made of anodic aluminum oxide, a probe head having the same, and a probe card having the same. More particularly, proposed are an anodic aluminum oxide structure that has a fine size and pitch guide hole and facilitates insertion of a probe, a probe head having the same, and a probe card having the same.

Claims (32)

1. A probe head, comprising:

an upper guide plate having an upper guide hole; and

a lower guide plate having a lower guide hole,

wherein at least one of the upper guide plate and the lower guide plate is composed of an anodic aluminum oxide sheet,

wherein the anodic aluminum oxide sheet comprises:

a porous layer having pores,

a barrier layer provided on at least one surface of the porous layer and having no pores, and

a plurality of through-holes provided through the porous layer and the barrier layer,

wherein a thickness of the barrier layer is larger than that of a partition wall between adjacent pores of the porous layer, and

wherein each of a plurality of probes passes through each of the plurality of through-holes as at least one of the upper guide hole and the lower guide hole.

2. The probe head of claim 1 , wherein the at least one of the upper guide plate and the lower guide plate is formed by stacking a plurality of anodic aluminum oxide sheets.

3. The probe head of claim 2 , wherein the anodic aluminum oxide sheets are joined to each other by a junction part.

4. The probe head of claim 3 , wherein the junction part is a photosensitive film capable of lithography.

5. A probe card, comprising:

a space transformer having a probe connection pad electrically connected to each of a plurality of probes; and

a probe head provided below the space transformer,

wherein the probe head comprises:

an upper guide plate having an upper guide hole; and

a lower guide plate having a lower guide hole,

wherein at least one of the upper guide plate and the lower guide plate is composed of an anodic aluminum oxide sheet, and

wherein the anodic aluminum oxide sheet comprises:

a porous layer having pores,

a barrier layer provided on at least one surface of the porous layer and having no pores, and

a plurality of through-holes provided through the porous layer and the barrier layer,

wherein a thickness of the barrier layer is larger than that of a partition wall between adjacent pores of the porous layer, and

wherein each of a plurality of probes passes through each of the plurality of through-holes as at least one of the upper guide hole and the lower guide hole.

6. An anodic aluminum oxide structure, comprising:

an anodic aluminum oxide sheet including:

a porous layer having pores,

a barrier layer provided on at least one surface of the porous layer and having no pores, and

a plurality of through-holes provided through the porous layer and the barrier layer,

wherein a thickness of the barrier layer is larger than that of a partition wall between adjacent pores of the porous layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 22, 2021
From: AHN, BUM MO; PARK, SEUNG HO; LEE, DONG EUN
To: POINT ENGINEERING CO., LTD.
Reel/Frame 055677/0445 →
Priority Claims (1)
KR 10-2020-0037824 · Mar 27, 2020 · national
Continuity (1)
Related Publication 20210307160A1 · Sep 30, 2021