IP Library › Granted Patent US 11,703,739
Granted Patent B2
US 11,703,739 · App. 17/150,797 · Granted Jul 18, 2023

System and method for calibrating PIC-based optical phased array transmitter and receiver

Inventors: Richard L. Kendrick (San Mateo, CA); Joseph Marron (Manhattan Beach, CA)
Assignee: Raytheon Company
G02F1/2955G02F2203/69
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Quick Facts
Patent No.
US 11,703,739
App. No.
17/150,797
Granted
Jul 18, 2023
Kind
B2
Abstract

A method includes illuminating a photonic integrated circuit (PIC) of a transmit aperture of a laser communication terminal and a PIC of a receive aperture of the laser communication terminal with multi-wavelength light, where each PIC includes multiple antenna elements forming an optical phased array (OPA). The method also includes determining light intensities of different wavelengths of the multi-wavelength light after the multi-wavelength light has passed through each PIC. The method further includes estimating phases of light associated with the antenna elements based on variations in the light intensities. In addition, the method includes adjusting one or more phase shifters of at least one of the PICs based on the estimated phases of light.

Claims (38)

1. A method comprising:

illuminating a photonic integrated circuit (PIC) of a transmit aperture of a laser communication terminal and a PIC of a receive aperture of the laser communication terminal with multi-wavelength light, each PIC comprising multiple antenna elements forming an optical phased array (OPA);

determining light intensities of different wavelengths of the multi-wavelength light after the multi-wavelength light has passed through each PIC starting from the multiple antenna elements;

estimating phases of light associated with the antenna elements based on variations in the light intensities; and

adjusting one or more phase shifters of at least one of the PICs based on the estimated phases of light.

2. The method of claim 1 , wherein:

the multi-wavelength light is from a single calibration source; and

the PICs are illuminated concurrently.

3. The method of claim 1 , wherein the multi-wavelength light is formed of multiple laser beams at different wavelengths that are combined using an arrayed waveguide grating (AWG).

4. The method of claim 1 , wherein the multi-wavelength light is incident on each PIC at an off-axis angle that is outside a field of regard of the PIC.

5. The method of claim 1 , further comprising:

after adjusting the one or more phase shifters of the at least one PIC, taking a measurement of emitted light to verify phasing of at least one of the OPA of the transmit aperture and the OPA of the receive aperture.

6. The method of claim 1 , wherein each of the one or more phase shifters comprises a thermo-optic or electro-optic phase modulator.

7. The method of claim 1 , wherein determining the light intensities comprises executing a stochastic parallel gradient descent algorithm.

8. The method of claim 1 , wherein a wavelength range between a shortest wavelength of the multi-wavelength light and a longest wavelength of the multi-wavelength light is approximately 10 picometers.

9. A system comprising:

a calibration source configured to illuminate a photonic integrated circuit (PIC) of a transmit aperture of a laser communication terminal and a PIC of a receive aperture of the laser communication terminal with multi-wavelength light, each PIC comprising multiple antenna elements forming an optical phased array (OPA);

one or more calibration detectors configured to:

determine light intensities of different wavelengths of the multi-wavelength light after the multi-wavelength light has propagated through each PIC starting from the multiple antenna elements; and

estimate phases of light associated with the antenna elements based on variations in the light intensities; and

a controller configured to adjust one or more phase shifters of at least one of the PICs based on the estimated phases of light.

10. The system of claim 9 , wherein the calibration source is configured to concurrently illuminate the PIC of the transmit aperture and the PIC of the receive aperture.

11. The system of claim 9 , wherein the calibration source is configured to form the multi-wavelength light from multiple laser beams at different wavelengths that are combined using an arrayed waveguide grating (AWG).

12. The system of claim 9 , wherein the calibration source is configured to illuminate the PICs such that the multi-wavelength light is incident on each PIC at an off-axis angle that is outside a field of regard of the PIC.

13. The system of claim 9 , wherein each of the one or more phase shifters comprises a thermo-optic or electro-optic phase modulator.

14. The system of claim 9 , wherein the one or more calibration detectors is configured to determine the light intensities using a stochastic parallel gradient descent algorithm.

15. The system of claim 9 , wherein a wavelength range between a shortest wavelength of the multi-wavelength light and a longest wavelength of the multi-wavelength light is approximately 10 picometers.

16. A system comprising:

a laser communication terminal comprising a transmit aperture and a receive aperture, each aperture comprising a photonic integrated circuit (PIC), each PIC comprising multiple antenna elements forming an optical phased array (OPA);

a calibration source configured to illuminate the PIC of the transmit aperture and the PIC of the receive aperture with multi-wavelength light;

one or more calibration detectors configured to:

determine light intensities of different wavelengths of the multi-wavelength light after the multi-wavelength light has passed through each PIC starting from the multiple antenna elements; and

estimate phases of light associated with the antenna elements based on variations in the light intensities; and

a controller configured to adjust one or more phase shifters of at least one of the PICs based on the estimated phases of light.

17. The system of claim 16 , wherein the calibration source is configured to concurrently illuminate the PIC of the transmit aperture and the PIC of the receive aperture.

18. The system of claim 16 , wherein the calibration source is configured to form the multi-wavelength light from multiple laser beams at different wavelengths that are combined using an arrayed waveguide grating (AWG).

19. The system of claim 16 , wherein the calibration source is configured to illuminate the PICs such that the multi-wavelength light is incident on each PIC at an off-axis angle that is outside a field of regard of the PIC.

20. The system of claim 16 , wherein each of the one or more phase shifters comprises a thermo-optic or electro-optic phase modulator.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2021
From: KENDRICK, RICHARD L.; MARRON, JOSEPH
To: RAYTHEON COMPANY
Reel/Frame 054937/0609 →
Continuity (1)
Related Publication 20220229343A1 · Jul 21, 2022