IP Library Granted Patent US 11,744,154
Granted Patent B2
US 11,744,154 · App. 16/322,777 · Granted Aug 29, 2023

Use of an electric field for detaching a piezoelectric layer from a donor substrate

Inventor: Cédric Charles-Alfred (Grenoble, FR)
Assignee: Soitec
H10N30/085H10N30/072H10N30/853H10N30/8542H10N30/8554H01L2221/68363H10N30/04Y10T29/42
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Quick Facts
Patent No.
US 11,744,154
App. No.
16/322,777
Granted
Aug 29, 2023
Kind
B2
Abstract

A method for transferring a piezoelectric layer from a donor substrate onto a support substrate comprises the steps of: a) providing a predetermined splitting area in a piezoelectric donor substrate, b) attaching the piezoelectric donor substrate to a support substrate to form an assembly, and c) detaching the piezoelectric layer from the piezoelectric donor substrate comprising applying an electric field. By using the electric field, the detachment step can be carried out at low temperatures. A detachment chamber for carrying out at least a portion of such a method includes one or two chucks comprising first and/or second electrodes for applying an electric field to a piezoelectric layer.

Claims (29)

1. A method of transferring a piezoelectric layer onto a support substrate, comprising the steps of:

a) providing a predetermined splitting area in a piezoelectric donor substrate, the predetermined splitting area delimiting a piezoelectric layer to be transferred;

b) attaching the piezoelectric donor substrate to the support substrate to form an assembly, the piezoelectric layer adjacent to the support substrate; and

c) detaching the piezoelectric layer from the piezoelectric donor substrate, wherein detaching the piezoelectric layer comprises applying an electric field at a temperature of less than 100° C.

2. The method of claim 1 , wherein the piezoelectric donor substrate comprises a bulk piezoelectric substrate.

3. The method of claim 1 , wherein the piezoelectric donor substrate comprises a layer of piezoelectric material on a handle substrate.

4. The method of claim 1 , wherein step b) comprises a heat treatment with a temperature of at most 100° C.

5. The method of claim 4 , wherein step b) is carried out between 15° C. and 25° C.

6. The method of claim 1 , wherein step b) is carried out at a pressure below 10 −2 mbar.

7. The method of claim 1 , wherein step c) is carried out at a temperature of less than 50° C.

8. The method of claim 1 , wherein applying the electric field comprises using a chuck comprising at least one electrode.

9. The method of claim 8 , further comprising placing a surface of the piezoelectric donor substrate of the assembly in direct contact with the chuck.

10. The method of claim 9 , wherein the chuck comprises interdigitated electrodes separated by an electrically insulating material.

11. The method of claim 10 , wherein a voltage applied to the chuck is up to 10 kV.

12. The method of claim 8 , wherein the assembly is sandwiched between the chuck and a second electrode.

13. The method of claim 12 , wherein a voltage applied to the chuck is up to 5 kV.

14. The method of claim 1 , wherein electric field lines are essentially parallel to a polarization direction of the piezoelectric donor substrate.

15. The method of claim 1 , wherein the piezoelectric donor substrate comprises a material chosen from among LiTaO 3 (LTO), AlN, ZnO, Pb[Zr x Ti 1-x ]O 3 (0≤x≤1) (PZT) and LiNbO 3 (LNO).

16. The method of claim 1 , wherein the support substrate comprises a semiconductor substrate.

17. A method of transferring a piezoelectric layer onto a support substrate, comprising the steps of:

a) providing a predetermined splitting area in a piezoelectric donor substrate, the predetermined splitting area delimiting a piezoelectric layer to be transferred;

b) attaching the piezoelectric donor substrate to the support substrate to form an assembly, the piezoelectric layer adjacent to the support substrate; and

c) detaching the piezoelectric layer from the piezoelectric donor substrate, wherein detaching the piezoelectric layer comprises placing a surface of the piezoelectric donor substrate of the assembly in direct contact with a chuck, the chuck comprising interdigitated electrodes separated by an electrically insulating material, and applying an electric field using the chuck.

18. The method of claim 17 , wherein a voltage applied to the chuck is up to 10 kV.

19. A method of transferring a piezoelectric layer onto a support substrate, comprising the steps of:

a) providing a predetermined splitting area in a piezoelectric donor substrate, the predetermined splitting area delimiting a piezoelectric layer to be transferred;

b) attaching the piezoelectric donor substrate to the support substrate to form an assembly, the piezoelectric layer adjacent to the support substrate; and

c) detaching the piezoelectric layer from the piezoelectric donor substrate, wherein detaching the piezoelectric layer comprises applying an electric field using a chuck comprising at least one electrode, wherein the assembly is sandwiched between the chuck and a second electrode.

20. The method of claim 19 , wherein a voltage applied to the chuck is up to 5 kV.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2019
From: CHARLES-ALFRED, CÉDRIC
To: SOITEC
Reel/Frame 048356/0198 →
Priority Claims (1)
FR 1657494 · Aug 2, 2016 · national
Continuity (1)
Related Publication 20210376225A1 · Dec 2, 2021