IP Library › Granted Patent US 11,747,561
Granted Patent B2
US 11,747,561 · App. 16/861,399 · Granted Sep 5, 2023

Sliced grating coupler with increased beam alignment sensitivity

Inventors: Gerard Schmid (Guilford, CT); Kyle Preston (Guilford, CT); Shannon Stewman (Guilford, CT)
Assignee: Quantum-Si Incorporated
G02B6/124G01N21/6428G02B6/12004G01N2021/6439G02B2006/12107
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Quick Facts
Patent No.
US 11,747,561
App. No.
16/861,399
Granted
Sep 5, 2023
Kind
B2
Abstract

Apparatus and methods relating to coupling radiation from an incident beam into a plurality of waveguides with a grating coupler are described. A grating coupler can have offset receiving regions and grating portions with offset periodicity to improve sensitivity of the grating coupler to misalignment of the incident beam.

Claims (46)

1. An integrated device comprising:

a grating disposed on a substrate and arranged to couple radiation incident on the grating into a plurality of optical waveguides disposed on the substrate;

a first inlet to a first receiving region of the plurality of optical waveguides;

a second inlet to a second receiving region of the plurality of optical waveguides, wherein the second inlet is offset a first amount with respect to the first inlet in a first direction approximately perpendicular to lines of the grating;

a plurality of pixels formed on the substrate, each including a reaction chamber configured to receive a sample for genetic or protein sequencing, detection and/or measurement;

wherein the waveguides are configured to provide excitation radiation to the reaction chambers; and

wherein each waveguide of the plurality of optical waveguides comprises a first dielectric material embedded within a second dielectric material having a lower index of refraction than the first dielectric material.

2. The integrated device of claim 1 , further comprising a third inlet to a third receiving region of the plurality of optical waveguides, wherein the third inlet is offset a second amount with respect to the first inlet in a second direction approximately perpendicular to lines of the grating, the second direction opposite the first direction.

3. The integrated device of claim 2 , wherein a first portion of the grating located adjacent to the first inlet has a first periodicity that is different than a second periodicity of a second portion of the grating located adjacent to a fourth inlet to a fourth receiving region of the plurality of optical waveguides.

4. The integrated device of claim 1 , further comprising:

a first optical sensor arranged to receive radiation coupled into the first waveguide; and

a second optical sensor arranged to receive radiation coupled into the second waveguide.

5. The integrated device of claim 1 wherein the first inlet is at a first position angle to the first receiving region and the second inlet is at a second position angle to the second receiving region.

6. The integrated device of claim 1 , wherein the first inlet has a different width than the second inlet.

7. The integrated device of claim 1 , wherein the first amount of the offset is any value between 1 micron and 20 microns.

8. The integrated device of claim 1 , wherein the grating comprises a plurality of separated grating portions.

9. The integrated device of claim 1 , wherein lines of the grating comprise a first dielectric material embedded within a second dielectric material having a lower index of refraction than the first dielectric material.

10. The integrated device of claim 1 , wherein lines of the grating comprise a metal.

11. The integrated device of claim 9 , wherein the first dielectric material is a same material and layer that is used to form the plurality of optical waveguides.

12. The integrated device of claim 1 , wherein the first dielectric material is silicon nitride.

13. The integrated device of claim 1 , wherein the second receiving region has a tapered width.

14. The integrated device of claim 13 , wherein a width of the first inlet is different from a width of the second inlet.

15. An integrated device comprising:

a grating disposed on a substrate and arranged to couple radiation incident on the grating into a plurality of optical waveguides disposed on the substrate;

a first inlet to a first receiving region of the plurality of optical waveguides; and

a second inlet to a second receiving region of the plurality of optical waveguides, wherein the second inlet is offset a first amount with respect to the first inlet in a first direction approximately perpendicular to lines of the grating; and

a plurality of pixels formed on the substrate, each including a reaction chamber and an optical sensor, wherein at least one waveguide is configured to provide excitation radiation to a plurality of the reaction chambers;

wherein each reaction chamber is configured to receive a sample for genetic sequencing or protein sequencing, detection and/or measurement.

16. An integrated device comprising:

a grating disposed on a substrate and arranged to couple radiation incident on the grating into a plurality of optical waveguides disposed on the substrate;

a first inlet to a first waveguide of the plurality of optical waveguides;

a second inlet to a second waveguide of the plurality of optical waveguides, wherein a first portion of the grating located adjacent to the first inlet has a different periodicity than a second portion of the grating located adjacent to the second inlet; and

a plurality of pixels formed on the substrate, each including a reaction chamber configured to receive a sample for genetic or protein sequencing, detection and/or measurement;

wherein the waveguides are configured to provide excitation radiation to the reaction chambers; and

wherein each waveguide of the plurality of optical waveguides comprises a first dielectric material embedded within a second dielectric material having a lower index of refraction than the first dielectric material.

17. The integrated device of claim 16 , further comprising:

a first optical sensor arranged to receive radiation coupled into the first waveguide; and

a second optical sensor arranged to receive radiation coupled into the second waveguide.

18. An integrated device comprising:

a grating disposed on a substrate and arranged to couple radiation incident on the grating into a plurality of optical waveguides disposed on the substrate;

a first inlet to a first receiving region of the plurality of optical waveguides;

a second inlet to a second receiving region of the plurality of optical waveguides, wherein the second inlet is offset a first amount with respect to the first inlet in a first direction approximately perpendicular to lines of the grating;

a third inlet to a third receiving region of the plurality of optical waveguides, wherein a first portion of the grating located adjacent to the first inlet has a different periodicity than a second portion of the grating located adjacent to the third inlet; and

a plurality of pixels formed on the substrate, each including a reaction chamber configured to receive a sample for genetic or protein sequencing, detection and/or measurement;

wherein the waveguides are configured to provide excitation radiation to the reaction chambers; and

wherein each waveguide of the plurality of optical waveguides comprises a first dielectric material embedded within a second dielectric material having a lower index of refraction than the first dielectric material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2020
From: SCHMID, GERARD; PRESTON, KYLE; STEWMAN, SHANNON
To: QUANTUM-SI INCORPORATED
Reel/Frame 052782/0442 →
Continuity (2)
Provisional Application 62861832 · Jun 14, 2019
Related Publication 20200393616A1 · Dec 17, 2020
Cited By (1)
US 12,235,463