IP Library › Granted Patent US 11,750,951
Granted Patent B2
US 11,750,951 · App. 17/735,347 · Granted Sep 5, 2023

Solid-state imaging element, imaging apparatus, and control method of solid-state imaging element with improved reading speed of pixel signals

Inventors: Shinichirou Etou (Kanagawa, JP); Yosuke Ueno (Kanagawa, JP); Yasufumi Hino (Kanagawa, JP); Kazutoshi Tomita (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H04N25/772H01L27/14612H01L27/14636H01L27/14643H04N25/745
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Quick Facts
Patent No.
US 11,750,951
App. No.
17/735,347
Granted
Sep 5, 2023
Kind
B2
Abstract

It is intended to improve reading speed of pixel signals in a solid-state imaging element provided with an ADC. A plurality of pixels are arrayed in a pixel block. A drive circuit drives the pixel block to output a plurality of pixel signals at the same time. A comparator successively selects the plurality of pixel signals and compares the selected pixel signals and a predetermined reference signal. A control section generates a control signal for updating the predetermined reference signal on the basis of comparison results of the comparator. A reference signal update section updates the predetermined reference signal according to the control signal.

Claims (42)

1. A device comprising:

a plurality of pixels arranged in rows and columns;

a plurality of column lines, each of the plurality of column lines being coupled to a respective column of pixels of the plurality of pixels; and

circuitry comprising a plurality of analog-to-digital converters, at least one of the plurality of analog-to-digital converters being coupled to at least two column lines of the plurality of column lines,

wherein the at least one of the plurality of analog-to-digital converters comprises a comparator configured to compare a reference signal with a pixel signal provided to the comparator through one of the at least two column lines, and

wherein the comparator comprises:

a first transistor configured to receive, at a gate terminal thereof, a first pixel signal provided through a first column line of the at least two column lines;

a second transistor configured to receive, at a gate terminal thereof, a second pixel signal provided through a second column line of the at least two column lines; and

a third transistor configured to receive, at a gate terminal thereof, the reference signal,

wherein the at least one of the plurality of analog-to-digital converters comprises successive approximation register logic circuitry coupled to the comparator.

2. The device of claim 1 , wherein each of the plurality of analog-to-digital converters is coupled to at least two respective column lines of the plurality of column lines.

3. The device of claim 1 , wherein the circuitry is configured to drive at least two rows of pixels of the plurality of pixels simultaneously.

4. The device of claim 1 , wherein the circuitry is configured to vary the reference signal over time.

5. The device of claim 4 , wherein the circuitry is configured to vary, during a predefined time slot, the reference signal until a least significant bit (LSB) is generated based on the pixel signal.

6. The device of claim 1 , wherein the comparator further comprises:

a first switch coupled to a source and a drain of the first transistor;

a second switch coupled to a source and a drain of the second transistor;

a third switch coupled to the first switch; and

a fourth switch coupled to the second switch.

7. The device of claim 6 , wherein the first switch is configured to receive a first control signal and the third switch is configured to receive an inversion signal of the first control signal; and wherein the second switch is configured to receive a second control signal and the fourth switch is configured to receive an inversion signal of the second control signal.

8. The device of claim 1 , wherein the plurality of analog-to-digital converters comprises a first analog-to-digital converter and a second analog-to-digital converter, and wherein the circuitry is configured to provide a first reference signal to the first analog-to-digital converter and a second reference signal to the second analog-to-digital converter, the second reference signal being different from the first reference signal.

9. The device of claim 1 , wherein the device is mounted on a vehicle.

10. A device comprising:

a pixel area comprising a plurality of pixel lines comprising:

a first pixel line coupled to a first plurality of pixels and a second pixel line coupled to a second plurality of pixels; and

circuitry comprising an analog-to-digital converter coupled to the first pixel line and to the second pixel line,

wherein the analog-to-digital converter comprises a comparator configured to compare a reference signal with a pixel signal provided to the comparator through one of the first pixel line and the second pixel line, and

wherein the comparator comprises:

a first transistor configured to receive, at a gate terminal thereof, a first pixel signal provided through the first pixel line;

a second transistor configured to receive, at a gate terminal thereof, a second pixel signal provided through the second pixel line; and

a third transistor configured to receive, at a gate terminal thereof, the reference signal wherein the analog-to-digital converter comprises successive approximation register logic circuitry coupled to the comparator.

11. The device of claim 10 , wherein the circuitry is configured to drive at least two rows of pixels of the pixel area simultaneously.

12. The device of claim 10 , wherein the circuitry is configured to vary the reference signal over time.

13. The device of claim 12 , wherein the circuitry is configured to vary, during a predefined time slot, the reference signal until a least significant bit (LSB) is generated based on the pixel signal.

14. The device of claim 10 , wherein the comparator further comprises:

a first switch coupled to a source and a drain of the first transistor;

a second switch coupled to a source and a drain of the second transistor;

a third switch coupled to the first switch; and

a fourth switch coupled to the second switch.

15. The device of claim 14 , wherein the first switch is configured to receive a first control signal and the third switch is configured to receive an inversion signal of the first control signal; and wherein the second switch is configured to receive a second control signal and the fourth switch is configured to receive an inversion signal of the second control signal.

16. The device of claim 10 , wherein the analog-to-digital converter comprises a first analog-to-digital converter and a second analog-to-digital converter, and wherein the circuitry is configured to provide a first reference signal to the first analog-to-digital converter and a second reference signal to the second analog-to-digital converter, the second reference signal being different from the first reference signal.

17. The device of claim 10 , wherein the device is mounted on a vehicle.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2022
From: ETOU, SHINICHIROU; UENO, YOSUKE; HINO, YASUFUMI; TOMITA, KAZUTOSHI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 060792/0644 →
Priority Claims (2)
JP 2017-216980 · Nov 10, 2017 · national
JP 2018-025772 · Feb 16, 2018 · national
Continuity (2)
Continuation 16761224
Related Publication 20220264051A1 · Aug 18, 2022